Introduction: Basics of Transmission Electron Microscopy (TEM ...
Electron Microscopy - Wikis09-10]_DOWNLOAD/4 tem i.… · Electron Microscopy 4. TEM Basics:...
Transcript of Electron Microscopy - Wikis09-10]_DOWNLOAD/4 tem i.… · Electron Microscopy 4. TEM Basics:...
Autumn 2009 Experimental Methods in Physics Marco Cantoni
Electron Microscopy
4. TEM
Basics: interactions, basic modes,sample preparation,
Diffraction: elastic scattering theory, reciprocal space, diffraction pattern,
Laue zonesDiffraction phenomena
Image formation: contrasts,
Autumn 2009 Experimental Methods in Physics Marco Cantoni
Types of electron microscopes
TransmissionElectron Microscope
ScanningElectron Microscope
Slide Projector
TV
What you see is what the
detector sees !!!
Scanning beamScanning beam
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Typical TEM
EPFL: Philips CM300EPFL: Philips CM300
300300’’000V000V
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Signals from a thin sample
Specimen
Inc
ide
nt b
ea
m
Auger electrons
Backscattered electronsBSE
secondary electronsSE Characteristic
X-rays
visible light
“absorbed” electrons electron-hole pairs
elastically scatteredelectrons
inelasticallyscattered electrons
BremsstrahlungX-rays
11--100 nm100 nm
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Interaction of high energetic electrons with matter
biological samples,polymers
crystalline structure,defect analysis,high-resolution TEM
chemical analysis,spectroscopy
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Interaction -> contrastE
DS
, e
lem
ent
map
sE
DS
, e
lem
ent
map
s
STEMSTEM--DFDF
Thin section of mouse brain: mass contrast of stained membrane structures(G.Knott)
Dark field image of differently ordered domains:Diffraction contrast
High-resolution image:Image contrast due to interference between transmitted and diffracted beam
Element distribution mapsOf Nb3Sn superconductor
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Two basic operation modesDiffraction <-> Image
Diffraction Mode Image Mode
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Projector lens system, TEM
mode DIFFRACTION mode IMAGE
• TEM:• Intermediate and
projector lenses– Projection of the
back focal plane to the screen“diffraction”mode
– Projection of the image plane to the screen“image” mode(haute resolution)
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Not to forgetNot to forget…….!.!the specimen preparationthe specimen preparation
electron transparency: sample thickness < 100nmelectron transparency: sample thickness < 100nmstandard sample holders: disc shaped samples with 3mm diameterstandard sample holders: disc shaped samples with 3mm diameter
3mm3mm
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CrossCross--section section --preparationpreparation• Mechanical polishing down to a thickness of 30 mm
• Ion milling (4kV Ar ions) until perforation
Si-wafer
Si-wafer
thin film
thin film
glue line
-gluing face-to-face-cutting a slice-polishing down to 30mm-copper washer for mechanical stability
1 – 1.5days
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PlanePlane--view preparation (also bulk)view preparation (also bulk)
• cutting a disk of 3mm(ultrasonic cutter)
• polishing down to 30mm(copper washer for mechanical stability)
• Ion milling until perforation
1 day
Thick film of PZT (Pt bottom electrode)
PZTPt
SiO2 Si
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Lucky if you have powders !
preparation time: 15-30Min.
Cupper grid coveredwith carbon film
Optical microscopereflected light
Optical microscopetransmitted light
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preparation time: 15-30Min.
SEM
TEM
holey Carbon film(K,Nb)TaO3Nano-rods
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Shape, lattice parameters, defects, lattice planes
(K,Nb)O3Nano-rods
Bright field image
dark field image
Diffraction pattern
High-resolution image
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Diffraction theory
•Introduction to electron diffraction•Elastic scattering theory•Basic crystallography & symmetry•Electron diffraction theory•Intensity in the electron diffraction pattern
Thanks to Dr. Duncan Alexander for slides
Autumn 2009 Experimental Methods in Physics Marco Cantoni
Diffraction: constructive and destructive interference of waves
• electrons interact very strongly with matter => strong diffraction intensity (can take patterns in seconds, unlike X-ray diffraction)
• diffraction from only selected set of planes in one pattern - e.g. only 2D information
• wavelength of fast moving electrons much smaller than spacing of atomic planes => diffraction from atomic planes (e.g. 200 kV e-, λ = 0.0025 nm)
• spatially-localized information(≳ 200 nm for selected-area diffraction;
2 nm possible with convergent-beam electron diffraction)
• orientation information
• close relationship to diffraction contrast in imaging
• immediate in the TEM!
• limited accuracy of measurement - e.g. 2-3%
• intensity of reflections difficult to interpret because of dynamical effects
Why use electron diffraction?
( diffraction from only selected set of planes in one pattern - e.g. only 2D information)
( limited accuracy of measurement - e.g. 2-3%)
( intensity of reflections difficult to interpret because of dynamical effects)
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Insert selected area aperture to choose region of interest
BaTiO3 nanocrystals (Psaltis lab)
Image formation
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Press “D” for diffraction on microscope console - alter strength of intermediate lens and focus diffraction pattern on to screen
Find cubic BaTiO3 aligned on [0 0 1] zone axis
Take selected-area diffraction pattern
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Consider coherent elastic scattering of electrons from atom
Differential elastic scatteringcross section:
Atomic scattering factor
Scattering theory - Atomic scattering factor
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Atoms closer together => scattering angles greater
=> Reciprocity!
Periodic array of scattering centres (atoms)
Plane electron wave generates secondary wavelets
Secondary wavelets interfere => strong direct beam and multiple orders of diffracted beams from constructive interference
Scattering theory - Huygen’s principle
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Repetition of translated structure to infinity
Basic crystallographyCrystals: translational periodicity & symmetry
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Unit cell is the smallest repeating unit of the crystal latticeHas a lattice point on each corner (and perhaps more elsewhere)
Defined by lattice parameters a, b, c along axes x, y, zand angles between crystallographic axes: α = b^c; β = a^c; γ = a^b
Crystallography: the unit cell
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Use example of CuZn brassChoose the unit cell - for CuZn: primitive cubic (lattice point on each corner)
Choose the motif - Cu: 0, 0, 0; Zn: ½,½,½Structure = lattice +motif => Start applying motif to each lattice point
Building a crystal structure
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Use example of CuZn brassChoose the unit cell - for CuZn: primitive cubic (lattice point on each corner)
Choose the motif - Cu: 0, 0, 0; Zn: ½,½,½Structure = lattice +motif => Start applying motif to each lattice point
Extend lattice further in to space
Building a crystal structure
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7 possible unit cell shapes with different symmetries that can be repeated by translation in 3 dimensions
=> 7 crystal systems each defined by symmetry
Triclinic Monoclinic Orthorhombic Tetragonal Rhombohedral
Hexagonal Cubic
Diagrams from www.Wikipedia.org
The seven crystal systems
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P: Primitive - lattice points on cell corners
I: Body-centred - additional lattice point at cell centre
F: Face-centred - one additional lattice point at centre of each face
A/B/C: Centred on a single face - one additional latticepoint centred on A, B or C face
Diagrams from www.Wikipedia.org
Four possible lattice centerings
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Combinations of crystal systems and lattice point centring that describe all possible crystals- Equivalent system/centring combinations eliminated => 14 (not 7 x 4 = 28) possibilities
Diagrams from www.Wikipedia.org
14 Bravais lattices
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14 Bravais lattices
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A lattice vector is a vector joining any two lattice points
Written as linear combination of unit cell vectors a, b, c:t = Ua + Vb + Wc
Also written as: t = [U V W]
Examples:
[1 0 0] [0 3 2] [1 2 1]
Important in diffraction because we “look” down the lattice vectors (“zone axes”)
Crystallography - lattice vectors
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Lattice plane is a plane which passes through any 3 lattice points which are not in a straight line
Lattice planes are described using Miller indices (h k l) where the first plane away from the origin intersects the x, y, z axes at distances:
a/h on the x axisb/k on the y axisc/l on the z axis
Crystallography - lattice planes
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Sets of planes intersecting the unit cell - examples:
(1 0 0)
(0 2 2)
(1 1 1)
Crystallography - lattice planes
a/h on the x axisb/k on the y axisc/l on the z axis
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Lattice planes in a crystal related by the crystal symmetry
For example, in cubic lattices the 3-fold rotation axis on the [1 1 1] body diagonalrelates the planes (1 0 0), (0 1 0), (0 0 1):
Set of planes {1 0 0} = (1 0 0), (0 1 0), (0 0 1), (-1 0 0), (0 -1 0), (0 0 -1)
Lattice planes and symmetry
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Path difference between reflection from planes distance dhkl apart = 2dhklsinθ
Electron diffraction: λ ~ 0.001 nmtherefore: λ << dhkl
=> small angle approximation: nλ ≈ 2dhklθReciprocity: scattering angle θ ~ dhkl
-1
2dhklsinθ = λ/2 - destructive interference2dhklsinθ = λ - constructive interference=> Bragg law:nλ = 2dhklsinθ
Diffraction theory - Bragg law
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Loi de Bragg
• 2 sinθ dhkl = n λ distance
entre
plan atomiquesd
ondeentrante
onde
sorta
nte
θλ
θdifférence dechemin parcouru
“1”
“2”
“1”
“2”
dhkl = n λ/2 sinθ
kk’
g = k-k’
Diffraction élastique
|k| = |k’|
arrangement périodique d’atomes dans l’espace (réelle):g : vecteur dans l’espace réciproque
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2-beam condition: strong scattering from single set of planes
Diffraction theory - 2-beam condition
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Electron beam parallel to low-index crystal orientation [U V W] = zone axis
Crystal “viewed down” zone axis is like diffraction grating with planes parallel to e-beam
In diffraction pattern obtain spots perpendicular to plane orientation
Example: primitive cubic with e-beam parallel to [0 0 1] zone axis
Note reciprocal relationship: smaller plane spacing => larger indices (h k l)& greater scattering angle on diffraction pattern from (0 0 0) direct beam
2 x 2 unit cells
Multi-beam scattering condition
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For scattering from plane (h k l) the diffraction vector:ghkl = ha* + kb* + lc*
rn = n1a + n2b + n3cReal lattice
vector:
In diffraction we are working in “reciprocal space”; useful to transform the crystal lattice in toa “reciprocal lattice” that represents the crystal in reciprocal space:
r* = m1a* + m2b* + m3c*Reciprocal lattice
vector:
a*.b = a*.c = b*.c = b*.a = c*.a = c*.b = 0
a*.a = b*.b = c*.c = 1
a* = (b ^ c)/VC
where:
i.e. VC: volume of unit cell
Plane spacing:
The reciprocal lattice
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Ewald Sphere
• A vector in reciprocal space:• ghkl = h a* + k b* + l c*
• diffraction if : k0 – k’ = g and |k| =|k’|Bragg and elastic scattering
Bragg: dhkl = λ/2 sinθ = 1/ |g|
Construction of EWALD sphere:Intersection of two geometric locations:Reciprocal space AND Ewald sphere
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Reciprocal space: sphere radius 1/λ represents possible scattering wave vectors intersecting reciprocal space
kI: incident beam wave vector
kD: diffracted wave vector
Electron diffraction: radius of sphere very large compared to reciprocal lattice=> sphere circumference almost flat
Ewald sphereElastic scattering:
|k| = |k’|
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2-beam condition with one strong Bragg reflection corresponds to Ewald sphereintersecting one reciprocal lattice point
Ewald sphere in 2-beam condition
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With crystal oriented on zone axis, Ewald sphere may not
intersect reciprocal lattice points
However, we see strong diffractionfrom many planes in this condition
Assume reciprocal lattice pointsare infinitely small
Because reciprocal lattice pointshave size and shape!
Ewald sphere and multi-beam scattering scattering
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Laue Zones
O H
E
k k'
g
Zonesde Laued'ordre
32
10
Ewald
θ θ
plan
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flec
teu
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• Laue zones
J.-P. Morniroli
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Ewald Sphere : Laue Zones (ZOLZ+FOLZ)
α=2.0mrads=0.2
ZOLZ6-fold
FOLZ3-fold
Source: P.A. Buffat
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Ewald Sphere: Laue Zones (ZOLZ+FOLZ) tilted sample
α=2.0mrads=0.2
ZOLZ6-fold
FOLZ3-fold
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For interpretation of intensities in diffraction pattern, single scattering would be ideal
- i.e. “kinematical” scattering
However, in electron diffraction there is often multiple elastic scattering:
i.e. “dynamical” behaviour
This dynamical scattering has a high probability because a Bragg-scattered beam
is at the perfect angle to be Bragg-scattered again (and again...)
As a result, scattering of different beams is not independent from each other
Dynamical scattering
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Amplitude of a diffracted beam:
ri: position of each atom => ri: = xi a + yi b + zi c
K = g: K = h a* + k b* + l c*
Define structure factor:
Intensity of reflection:
Intensity in the electron diffraction patternStructure factor
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Consider FCC lattice with lattice point coordinates:0,0,0; ½,½,0; ½,0,½; 0,½,½
Calculate structure factor for (0 1 0) plane (assume single atom motif):
=>
Forbidden reflections
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Cu3Au - like FCC Au but with Cu atoms on face-centred sites. What happens to SADP if we gradually increase Z of Cu sites until that of Au (to obtain FCC Au)?
Patterns simulated using JEMS
Diffraction pattern on [0 0 1] zone axis:
Forbidden reflections
Autumn 2009 Experimental Methods in Physics Marco Cantoni
Cu3Au - like FCC Au but with Cu atoms on face-centred sites. What happens to SADP if we gradually increase Z of Cu sites until that of Au (to obtain
FCC Au)?
Patterns simulated using JEMS
Diffraction pattern on [0 0 1] zone axis:
Forbidden reflections
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Reciprocal lattice of FCC is BCC and vice-versa
Extinction rulesFace-centred cubic: reflections with mixed odd, even h, k, l absent:
Body-centred cubic: reflections with mixed odd, even h, k, l absent:
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Selected-area diffraction phenomena
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Symmetry informationZone axis SADPs have symmetry closely related to symmetry of crystal lattice
Example: FCC aluminium[0 0 1]
[1 1 0]
[1 1 1]
4-fold rotation axis
2-fold rotation axis
6-fold rotation axis - but [1 1 1] actually 3-fold axisNeed third dimension for true symmetry!
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Twinning in diffractionExample: Co-Ni-Al shape memory FCC twins observed on [1 1 0] zone axis
Images provided by Barbora Bartová, CIME
(1 1 1) close-packed twin planes overlap in SADP
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Epitaxy and orientation relationshipsSADP excellent tool for studying
orientation relationships across interfaces
Example: Mn-doped ZnO on sapphire
Sapphire substrate Sapphire + film
Zone axes:[1 -1 0]ZnO // [0 -1 0]sapphire
Planes:c-planeZnO // c-planesapphire
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Ring diffraction patternsIf selected area aperture selects numerous, randomly-oriented nanocrystals,
SADP consists of rings sampling all possible diffracting planes- like powder X-ray diffraction
Example: “needles” of contaminant cubic MnZnO3 - which XRD failed to observe!
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Ring diffraction patternsLarger crystals => more “spotty” patterns
Example: ZnO nanocrystals ~20 nm in diameter
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Inelastic scattering event scatters electrons in all directions inside crystal
Cones have very large diameters => intersect diffraction plane as ~straight lines
Kikuchi linesSome scattered electrons in correct orientation for Bragg scattering => cone of scattering
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Kikuchi lines
Position of the Kikuchi line pairs of (excess and deficient) verysensitive to specimen orientation
Lower-index lattice planes => narrower pairs of lines
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Convergent beam electron diffraction
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Instead of parallel illumination with selected-area aperture, CBED useshighly converged illumination to select a much smaller specimen region
Convergent beam electron diffraction
Small illuminated area => no thickness and orientation variations
There is dynamical scattering, but it is useful!
Can obtain disc and line patterns“packed” with information:
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“Transmission Electron Microscopy”, Williams & Carter, Plenum Press
http://www.doitpoms.ac.uk
“Transmission Electron Microscopy: Physics of Image Formation andMicroanalysis (Springer Series in Optical Sciences)”, Reimer, Springer
Publishing
“Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects”, Morniroli, Taylor & Francis Publishing
References
http://crystals.ethz.ch/icsd - access to crystal structure file databaseCan download CIF file and import to JEMS
Web-based Electron Microscopy APplication Software (WebEMAPS)http://emaps.mrl.uiuc.edu/
JEMS Electron Microscopy Software Java versionhttp://cimewww.epfl.ch/people/stadelmann/jemsWebSite/jems.html
“Electron diffraction in the electron microscope”, J. W. Edington, Macmillan Publishers Ltd
http://escher.epfl.ch/eCrystallography