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RESEARCH PUBLICATIONS FROM THIS THESIS

[1] P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P.

Singh,“Wavelet Transform approach for Detection and Location of

Faults in HVDC System”, IEEE Region 10 colloquium and the third

ICIIS, Kharagpur, India, December 8-10, 2008, pp. 1-6

[2] P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P. Singh,

“HVDC transmission System fault Diagnosis and location using

Artificial Neural Networks” International Conference on Energy and

Environment, EnviroEnergy 2009, March 19-21, 2009, pp. 847-

851.

[3] P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P. Singh,

“Internal Fault Diagnosis of HVDC Converter Transformer using

wavelet Transform Technique”, 16th International Symposium on

High Voltage(ISH-2009), Capetown, South Africa, 24th – 28th Aug

2009. pp. 1611-1614.

[4] P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P. Singh,

“Classification of internal faults of a converter transformer using

Wavelet Transforms”, Third International Conference on Power

Systems (ICPS-2009), Kharagpur, India, 27-29 December, 2009.

(Accepted for oral presentation)

[5] P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P. Singh,

“Location of faults in HVDC converter transformer using wavelet

techniques”, TRAFOTECH-2010. Accepted for presentation

[6] Pannala Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.

Murali Krishna, “Recognition of faults in HVDC system by wavelet

analysis” J. Curr.Sci. 12(1), (2008), Pp. 33-42.

410

[7] P Krishna Murthy, J. Amarnath and B.P. Singh, “Reconstruction of

HVDC Converter Transformer Neutral Current using Gabor

Wavelet”, Indian Electrical and Electronics Manufacturers

Association (IEEMA JOURNAL), JUNE 2009, pp.118-121.

[8] P Krishna Murthy, J. Amarnath, S. Kamakshaiah and B.P. Singh,

“ANN Based Internal Fault Diagnosis of HVDC converter

Transformer” International Journal of Applied Engineering

Research (IJAER)" Vol.4 No.6, 2009, pp 867-876.

[9] P Krishna Murthy, J. Amarnath, and S. Kamakshaiah, “HVDC

transmission line fault location using FFT analysis”, International

Journal of Applied Engineering Research (IJAER) Communicated.