Collaborative Research: Wavelet Analysis of Periodic Error for

Improved Displacement Metrology (NSF#: 1265824)

PI: Jonathan D. Ellis, PhD (University of Rochester)

Collaborative Research: Wavelet Analysis of Periodic Error for

Improved Displacement Metrology (NSF#: 1265824)

PI: Jonathan D. Ellis, PhD (University of Rochester)

Precision Engineering Internship ProgramEight students from three different academic institutions took part in the

inaugural Precision Engineering Internship Program at the University of

Rochester. This program is intended to provide a two-week, applied learning

experience for students who have little-to-none prior experience with

instrumentation, calibration, and metrology. The goal of the program is to: 1)

provide the participants with practical concepts and skills that are typically only

taught from a theoretical standpoint in courses, 2) entice them to pursue

careers in the world of precision engineering and displacement interferometry,

and 3) have the PI available has a future point-of-contact for other internship

opportunities. This year’s participants included students from Finger Lakes

Community College (www.flcc.edu) and Monroe Community College

(www.monroecc.edu) as well as the University of Rochester from 6/2/2014 –

6/13/2014. For next year, the program will seek to expand to include more

students as well as have the University of Rochester provide additional housing

support. Details on the program can be found here:

http://www.me.rochester.edu/projects/jdellis-lab/outreach.php

Precision Engineering Internship ProgramEight students from three different academic institutions took part in the

inaugural Precision Engineering Internship Program at the University of

Rochester. This program is intended to provide a two-week, applied learning

experience for students who have little-to-none prior experience with

instrumentation, calibration, and metrology. The goal of the program is to: 1)

provide the participants with practical concepts and skills that are typically only

taught from a theoretical standpoint in courses, 2) entice them to pursue

careers in the world of precision engineering and displacement interferometry,

and 3) have the PI available has a future point-of-contact for other internship

opportunities. This year’s participants included students from Finger Lakes

Community College (www.flcc.edu) and Monroe Community College

(www.monroecc.edu) as well as the University of Rochester from 6/2/2014 –

6/13/2014. For next year, the program will seek to expand to include more

students as well as have the University of Rochester provide additional housing

support. Details on the program can be found here:

http://www.me.rochester.edu/projects/jdellis-lab/outreach.php

Program TopicsProgram Topics

� Day 1: Flexure Stages using MOTUS prototyping stages

� Day 2: Instrumentation basics, Fourier Domain analysis,

Matlab introduction

� Day 3: Data Acquisition with Labview

� Day 4: LVDT sensors, noise, sensitivity, hysteresis

� Day 5: Capacitance sensors

� Day 6: MOTUS stage calibration

� Day 7: Parasitic motion

� Day 8: Data analysis, linearity, Data fitting

� Day 9: Fizeau interferometry demo, White Light

interferometry demo

� Day 10: Piezo stage calibration

� Day 1: Flexure Stages using MOTUS prototyping stages

� Day 2: Instrumentation basics, Fourier Domain analysis,

Matlab introduction

� Day 3: Data Acquisition with Labview

� Day 4: LVDT sensors, noise, sensitivity, hysteresis

� Day 5: Capacitance sensors

� Day 6: MOTUS stage calibration

� Day 7: Parasitic motion

� Day 8: Data analysis, linearity, Data fitting

� Day 9: Fizeau interferometry demo, White Light

interferometry demo

� Day 10: Piezo stage calibration

Students learning the basics

with function generators and

oscilloscopes.

The PI discussing the concepts of

parasitic motion and hysteresis.

John and Kris aligning capacitance

sensors for calibrating the MOTUS

stages.

Students on a tour of the PI’s lab to

give demonstrations of ongoing

projects and other systems.

Jacob and Jessica testing the

sensitivity of the capacitance sensor

mounts to external forces.

ParticipantsParticipants

� Kris Moore, FLCC (kdmny8167@gmail.com)

� Jacob Blacksberg, UR (jblacksb@u.rochester.edu)

� Dan Poehlein, FLCC (dan.poehlein@gmail.com)

� Dr. Jonathan D. Ellis, UR (j.d.ellis@rochester.edu), PI

� Jessica Bernstein, UR (jberns17@u.rochester.edu)

� Bobby Datta, FLCC (data4datta@yahoo.com)

� Karen Martino, MCC (kmartino1@student.monroecc.edu)

� John Ndukwe, UR (jndukwe@u.Rochester.edu)

� Kathleen Dupre, UR (jndukwe@u.Rochester.edu)

� Sam Samanta, FLCC POC (Sam.Samanta@flcc.edu) (not shown)

� Kris Moore, FLCC (kdmny8167@gmail.com)

� Jacob Blacksberg, UR (jblacksb@u.rochester.edu)

� Dan Poehlein, FLCC (dan.poehlein@gmail.com)

� Dr. Jonathan D. Ellis, UR (j.d.ellis@rochester.edu), PI

� Jessica Bernstein, UR (jberns17@u.rochester.edu)

� Bobby Datta, FLCC (data4datta@yahoo.com)

� Karen Martino, MCC (kmartino1@student.monroecc.edu)

� John Ndukwe, UR (jndukwe@u.Rochester.edu)

� Kathleen Dupre, UR (jndukwe@u.Rochester.edu)

� Sam Samanta, FLCC POC (Sam.Samanta@flcc.edu) (not shown)

Left to Right: