Data Mining and Optimization Using Optimal+

Scs14 optimal presentation leveraging test data - apr 2014

AMD at ITC 2014

OptimalEnterprise at Qualcommit

Adaptive Testing Techniques at Qualcomm, a Fabless Experience

Broadcom and Optimal+

Escape Prevention & RMA Management

Breakthrough in Quality Management

Optimal Testing: Data Management for Enhanced Quality, Reliability and Yield Improvement

Optimal+ GSA 2014

Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA Improvements

"Escape Prevention and RMA Management"

Big Data Breakthroughs in Data Management

ITC 2016, Roberto Lissoni, ST Corporate Quality - Customer case study

IoT Solution Conference 2016

Securing your supply chain from counterfeit parts through real time electronic chip traceability - published v2

ITC 2015 - Marvell Present : "Improving Quality and Yield Through Optimal+ Big Data Analytics".

NIWeek 2016 - "Breaking Data Silos"