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Www.intertek.com1 UN 38.3 Shock Test Data Collection Rich Byczek, Intertek Oct 2013 1
SOME OF THE MOST COMMON TESTING MISTAKES MADE BY TECHNICIANS PERFORMING VERIFICATIONS TO CAN/ULC 537-04 The reason I know some of them is because I have.
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Test Conditions Plastic encapsulated devices are tested at a maximum bake temperature of 150C, 2,000 hours for Data Retention Bake testing. Moisture.
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