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Title: Fault Characterization, Testability Issue and ... · 3 Index Terms: CMOS, CPL circuits, Design for testability, Fault model, Fault detection, Full-adder, IDDQ testing, Testability
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Robust Low Power VLSI ECE 7502 S2015 Effective IDDQ Testing method to identify the fault in Low-Voltage CMOS Circuits ECE 7502 Project Final Presentation.
