Transverse beam size measurement High energy micron electron beam non-invasive diagnostics based on...
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Transverse beam size measurement
High energy micron electron beam non-invasive diagnostics based on
diffraction radiation
G.Naumenko, A.Potylitsyn, L.Sukhikh
Tomsk Polytechnic University
Transverse beam size measurement
=1
20
Ee=130 GeV
Existing advanced methodsSR - interferometer
Laser wire scanner
SakaiaY. Yamamoto, et.al., Review of Scientific instruments, 71,3 (2000)
H. Sakai, et.al., Phys.Rev.ST Accel.Beams
4:022801,2001.
Transition Radiation Monitor
Laser interferometer
M. Ross, et.al., 2001 IEEE Particle Accelerator Conference, Chicago, IL, 2001.
H. Sakai, et.al., Phys.Rev.ST Accel.Beams 4:022801,2001.
What about a non-invasive single bunch diagnostics?
Non invasive
Single bunch measurement
SR - interferometer yes no
Laser wire scanner yes no
Transition Radiation Monitor
no yes
Laser interferometer yes no
? yes yes
Non-invasive diagnostics based on the
Optical Diffraction Radiation
Short prehistoryStart: KEK ATF 2000
y
-15 -10 -5 0 5 10 15
PM
T /
curr
ent
0.0
0.2
0.4
0.6
0.8
1.0
2003
min
maxe
Wf
W
P. Karataev, S. Araki et.al., PRL 93, 244802 (2004)
Flat slit target
Measured ODR angular distribution
At 2004 the 10 beam size has been measured
P. Karataev S. Araki et.al, NIM B 227 (2005)
Optical diffraction radiation
For Ee1 GeV method sensitivity limit was reached for beam size 10 .
For Ee30 GeV the sensitivity decrease catastrophically.
Method limitation
S1S2
ODR method modificationBeam size measurement technique using ODR from crossing target was developed (G. Naumenko, KEK report, Nov. 2003)
Phase shift:
=it=
=i4z/
Calculated:
Interference pattern
S1
S2
min
maxe
Wf
W
Example for =2500, =5.6mradInterference pattern after the integration over a
Gaussian electron beam profile:
e= 2 e= 6
e= 10
For =0.5mcm =10mcm
=5.6 mrad
Single bunch measurement
Example:max
a
W e
max, OTRif a W W
For =0.5mcm and =60000 =3cm. is possible
is the Lorenz-factor
Beam size effect is of the order of OTR intensity, which was measured using CCD from a single bunch.
No dependence on the Lorenz-factor in far field zone
a
Problem of beams together bringing
2 212 2
2 21,
iss e sy D D s s p p
s e s
yeK x x y eE x y dx dy dx dy
R x x y
, , , , ,1
,s p D s p Dx x x y y y
a b
2 2 2 22
2 2p s p s D p D p
s p
x x y y x x y y
a b
2 pp px
2, ,y y yD D D DW E Ex y x y
2 ex 2 ex
o
Pseudo-photon reflection approach
2s sx
Bessel function
,s e sx x x
+_
Not any dependence on an electron position and beam size
Bi-prism Lens Mirrors
The same results may be shown for:
Moreover
Is a beam size measurement possible?
Frenel prismBased on Frenel lens technology
yD/R -80 -60 -40 -20 0 20 40 60 80
Wy
(arb
.un
)
0.0
0.2
0.4
0.6
0.8
1.0
2 2 2 22
2 2p s p s D p D p
s p
x x y y x x y y
a b
step < e
p pp p
p
step x xfrac
stepx
mrad,
xe=0 xe=5
Beam size measurement is possible
Phase
2, ,y y yD D D DW E Ex y x y
p
min
max
y e
y
Wf
W
Angular distribution
Beam size + beam position
e=7xe=0
yD/R -60 -40 -20 0 20 40 60
Wy
(arb
.un
)
0.0
0.2
0.4
0.6
0.8
e=7xe=5
min
max
y e
y
Wf
W
beam position
Beam size
Angular distribution
Single bunch measurement using CCD camera is possible
Near field zone effect
21
R
For E0=30 GeV, 0.5
2 1800m
011.02
R2
R
Deformation of OTR angular distribution
Effect is peculiar to radiation angular distribution. It shows itself for ODR as well as for OTR.
target
detectorV.A. Verzilov, Phys. Let. A 273 (2000) 135-140
Near field zone effect resolution
20.01
R
Example for OTR
Near field zoneFar field zone without lens
Angular distribution image
'1
0
2 ' ,b
E E r r J R r r dr
f
rr
''
here
Focus length
R
Bessel function
E'E
2' 'W E
W’
W’
Pis’ma w JETPh, 84 3 (2006) 136
Conclusion
• Beam size ODR effect of this method is of the first order in contrast to the effect of the second order for the method based on a flat slit target. A radiation intensity beam size effect comprises 2060% of OTR intensity. Single bunch measurement using CCD is possible near well as OTR measurement.
•The problem of radiation beams together bringing may be resolved using a special Frenel bi-prism.
•The near field effect problem may be resolved using optical system.
Test of ODR interference from the crossed target
Interference measured
KEK ATF extraction line
Target parameters: = 6.2mrad, a = 420m
Scheme
Only for interference test.
Not usable for beam size measurement