Testing beyond the Tester capability - NMI · 2017. 12. 1. · Fits in the V93K, Teradyne Catalyst...

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Bridging the gaps….

Testing beyond the Tester capability


Outline

Introduction to Salland

Today’s Test(er) Challenges

Test solution needs

Bridging the gap….Example’s

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We create and deliver Innovative and effective Test Solutions for the Microelectronics market, partnering with our customers to enhance

their success

Test Application Solutions

Salland Engineering Vision and Mission

Instruments Solutions

Supply Chain Services

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Salland Engineering Company Overview

Established in 1992, 40 employees

Headquartered in Zwolle, The Netherlands

Worldwide Sales & Support throughout Europe, USA and Asia

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Company Confidential

Test Experts Test methodology

Design for Test Test setup Characterization Yield Ramp up

Test skills differentiation RF – High Speed Mixed signal VIs, DPS, PMU High parallel testing COT reduction

Test Technology provider Test Program Load board and probe card Test Cell Interfacing Advanced Test configuration

Salland technology Customer IP 3rd party integration

Test setup certification Manufactory Validation Support


Today's Test Challenges

Device Technology develops faster then ATE High Speed interfacing require Extremely fast signal handling

‐ …. keeping signal integrity up to the device is getting challenging and expensive Smart Power

‐ … handling low power with higher currents, voltages frontend RF/mmWave

‐ .... Far beyond exsisting standard tester capabilities Etc...

Never ending battle’s; QCD

‐ …. Balance between Test Coverage, Cost of Test & Throughput Time to Market, Time to Yield, Time to Volume => There is a need to enhance the standard Tester functionality

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Bridging the gap

Possible ways add (niche) functionality; ‐ On application board ‐ New ATE Instrument ‐ External equipment

Conditions solution:

‐ Like to get it fast (max. 6-9 months) ‐ Will use it a couple of years (< 3-5 years) ‐ Don’t want to spent too much money ( Modular design/solution ‐ Easy to reproduce & Service => ‘’Catalogue product & Support ‐ Production friendly => Run at Subcon

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Possible solutions to deliver new Technology

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Universal

Investment

Application Specific

Loadboard

Universal ATE Instrument

Flexible Fast Costs

Poor Integration Debug tooling Calibration &

diagnostic Supply chain

Universal/Flexible Supply chain Cal & diagnostics Tooling

High Capex costs TTM: x years

$$$$

$

Technology

Rack Instruments


Possible solution

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Universal

Investment

Application Specific

Loadboard

“SMART Platform solution’’ Device Family based

Universal ATE Instrument

Enhanced Integration Debug tooling Calibration & diagnostic Supply chain Supports families Robustness

Less Universal Less Tooling

$$$$

$

Technology


Some Use Cases/Concepts

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Use Case: High Speed SERDES Solution

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Objective ‐ Improve Testability by enabling test at-speed on SERDES

Constraints/Requirements ‐ No ATE Instrument Configuration and TOS changes (Teradyne Catalyst) ‐ Portable Solution and ATE independent

Proposal ‐ ATE Independent High Speed SERDES modules inside stiffener with

DSO capability up to 32Gbps & BERT capability up to 30Gbps

Result ‐ Enable High Speed Testing at


Use Case: High Speed SERDES Solution – DSO

SMPS 40GHz Coaxial connector Ethernet and/or Direct ATE control interface Windows based Signal Debug GUI

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Description: State of the art, 4-channel, 32Gbps Digital

Sampling Oscilloscope for production testing Measures SerDes PHY TX signals on various

ATE platforms with all the logging and analyzing capabilities

Typical applications like High-Speed SerDes Testing & Characterization on various ATE platforms (Catalyst, V93k, ultraFLEX, etc.)

Solution: Full Eye and Mask Measurements Rise Time / Fall Time measurements 200fS intrinsic Jitter 32 GHz Bandwidth Reference Optical Receiver

Company Confidential


Use Case: High Speed SERDES Solution – BERT

Key features: ‐ Supports PRBS patterns and user pattern ‐ Amplitude & Skew settings ‐ Eye Scan & Bathtub measurement

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Description: State of the art, 4-channel, 8.5 to 15Gbps

and 20 to 30Gbps Bit Error Rate Tester for production testing

Stimulates SerDes PHY RX with a controllable signal (level, noise, jitter)

Fits in the V93K, Teradyne Catalyst / FLEX / UltraFLEX

Direct ATE and Fast Ethernet control

Solution: 19/16ps Rise/Fall Times 400fs RMS jitter, 6ps Deterministic Jitter Output Level max. 1600mVpp differential 25mVpp sensitivity


Use case: Radar Test solution

Objective ‐ Test RF/mmWave parts

Constraints/Requirements ‐ ATE independent ‐ Easy configurable/tunable specifications ‐ Small form factors for ease of use

Proposal ‐ Create set of building blocks to be able to bring RF signals in range of

existing ATE instruments

Result ‐ Enable RF testing of 20 – 30 GHz signals at Teradyne Flex (max 6GHz) ‐ Universal solution that can be used on ATE, Bench, final products

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Use Case: RF (Radar) testing

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RF Amplifier – Low Power

RF switches – T with 2 to 6 Multiplexer

Bandpass Filter

Future Target Applications: - Near future: 77GHz/120GHz automotive radars - MMW Imaging and Sensing - Fast measurement equipment - 60GHz wireless networking - 400Gbit/s optical data communications - 4G photonic mobile communication - Two-way satellite communication


Use Case: SE-RF Lego®

Crystal Oscillator LO-Generator Frequency Divider Mixer Bandpass Filter RF Amplifiers

‐ Low Power ‐ Medium Power ‐ Low Phase Noise

RF to DC RF Switches

‐ Multiplexer ‐ T-switch

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Use case: RDSon measurement H-Bridge

Objective ‐ Test RDSon of H-bridge at low power tester

Constraints/Requirements ‐ ATE independent ‐ Easy tunable specifications; @ Voltage, Current

Proposal ‐ Creation of Controlled Current Pulse and measure voltage with ATE

instrument

Result ‐ Solution to test H-Bridge on Lower power tester to measure RDSon

(@0.5% Acc) ‐ Universal solution that can be used on ATE, Bench

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Principle

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Current

limiter

MV


ATE/PC

HCP DUT connection

Instrument

controller

High Current Pulser

High Current

Pulser logic

All 16 switches will

be controlled by the

HCP


Results RDSon Measurement with HCP

The blue line is the output of the HCP current source connected to 100mOhm (DUT) – At 2V = 20A – After 1.8 usec we have a stable

20A available to do the Voltage measurements

Special design for overshoot reduction as shown on bottom picture with 1uF

19 Company confidential

Current sense

Voltage


HCP Specification

Item Specification

Max current Programmable pulse of 25A for max 20 usec with a recharge time of

500 usec

Isolation voltage Floating from digital HSD trigger inputs

Isolation voltage 1000V RMS

Pulse programming 0 to 20 usec in steps of 1 usec

Measure current accuracy 0.5% resolution 0.5mA

Measure voltage accuracy 0.5% Range 0 to 2.5V

Current forcing resolution programmable in 256 steps

Simultaneous current/voltage

measurements

Yes

Calibration By means of DC90 connected to Charge inputs

FET switches control The HCP can block up to 150V

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Future developments in investigation

High Voltage add-ons for Automotive Applications ‐ Can, Lin Capability

High Parallel test MEMS testing on ATE without physical stimulation

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Conclusions/Lessons learned

Existing testers can be upgraded to do test beyond tester capabilities

Solution can work for older but as well latest generation testers

Can achieve significant COT reduction and faster TTM

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Your Challenge, Our Strength Salland Engineering Instrument Solutions

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Thanks for your attention

Testing beyond the Tester capability - NMI · 2017. 12. 1. · Fits in the V93K, Teradyne Catalyst...

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Transcript of Testing beyond the Tester capability - NMI · 2017. 12. 1. · Fits in the V93K, Teradyne Catalyst...