SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements.

8
SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements

Transcript of SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements.

Page 1: SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements.

SUMMER INTERSHIP

ElectronicsCERN

BE-BI-BL

Topic: photo-multiplier’s dynamic range improovements

Page 2: SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements.

contextualization

- 1 ms - 1 – 10 mA

Page 3: SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements.

Problematic

Linear mode Saturation mode

avalanche effect

Page 4: SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements.

Why saturation?

Page 5: SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements.

Test Box

Page 6: SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements.

First results SIMULATIONS• Actual system :

- loading time ≈ 30 ms- Needed Capa on the

last stage ≈ 10 mF (Huge and not possible)

EXPERMIMENTS• Actual system

- Saturations- ≠dynamic ranges btw

PM

First qualitative experiment with the box

V config 1 linear tension devideurV config 2 curved tension devider

Page 7: SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements.

Next Weeks

• Define more precisely when does the saturation mode begins • Run mesurements with several

types of electronics • Write the users notice of the

testing box in english

Page 8: SUMMER INTERSHIP Electronics CERN BE-BI-BL Topic: photo-multiplier’s dynamic range improovements.

Main Objectiv

Design and suggest a new electronic socket to improove the dynamic range on photo-

multiplayers and avoid saturation and unlinear signals in beam profiling