Status report of test procedures for the readout pixel chips in Catania F.Riggi ITS Meeting, June...
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![Page 1: Status report of test procedures for the readout pixel chips in Catania F.Riggi ITS Meeting, June 2002.](https://reader035.fdocuments.us/reader035/viewer/2022070418/5697bfdf1a28abf838cb2913/html5/thumbnails/1.jpg)
Status report of test procedures for the readout pixel chips in Catania
F.Riggi
ITS Meeting, June 2002
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Summary
•Status of equipment for wafer and single chip testing in Catania
• Recent progresses
• Outlook and future problems
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Test system for single chip
MB-card
Power Supply
VME-cratewith pilot and JTAG controller
M-card with chip
Bridge to PC
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Wafer probing system
MB-card
Power Supply VME-cratewith pilot and JTAG controller
Bridge to PC
Power Supply
Probe Station with Probe Card
CLEAN ROOM
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Equipment in Catania
Semiautomatic Probe Station (K. Suss PA200)
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Equipment in Catania
Bonding stations
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Equipment in Catania
Electronics
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Software for acquisition/analysis
LabView-based programs
Analysis with Root/C++
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Training
- 2 persons from Catania have already spent a first training period at CERN (end of 2001) in order to:
- test all the relevant cards to be used- carry out tests on single chips- carry out tests on wafer with probe station- establish a common protocol evaluation
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Porting of hardware, software and all that
Hardware: VME, power supplies, bridge, PC Pilot module JTAG controller MB card single chip cards probe-card
Software: LabVieW Specific software for chip testing Simple Analysis programs under ROOT
Everything in place and tested
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Recent progresses
Remote and “on-site” check-up of the Catania facilities from the CERN pixel group (special thanks to Petra and Peter for coming):
Identified and addressed several points to be improved in view of mass production Reliability of probe station (software check-up, other tests in progress) Improvement of organization of the clean room and overall procedures Upgrading of the probe station with joystick-controlled motion of the microscope(request to INFN under way) Possible additional training at CERN
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Small improvements
Electronics
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Small improvements
Rearrangement of items
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Typical test results 1
Threshold distribution(Chip #68)
Mean threshold of 18.4 mV
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Typical test results 2
Noise Distribution(Chip #68)
Mean noise of 1.8 mV
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Typical test results 3
Threshold Map(Chip#68)
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Outlook and future problems
• Start first tests on wafer and compare results with reference at CERN• Future: Moving out to the new Department building
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Moving out to the new Department building
A new Department building is almost ready in Catania and all services (teaching and research) are expected to move out to this new location.
Time scale for this operation is of the order of several months
Of course several problems can originate
How can this affect our specific task?
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Moving out to the new Department building
The present status of the building
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Moving out to the new Department building
What about the clean room and related equipment?
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Moving out to the new Department building
What about the clean room and related equipment?
• A new and larger (60 m2 ) clean room has been designed and approved
• Tender already started
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Moving out to the new Department building
The new clean room
Size of present clean room
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Moving out to the new Department building
Important:
Air cleaning and all basic material for the future clean room will be totally new
No need to dismount any equipment from the present clean room until the new one is ready
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Conclusions
All facilities necessary for wafer testing in Catania have been tested in place.
Possible new tests and training periods at CERN
A significant improvement of the operations could come from microscope motorization in the near future
First wafer tests could start soon
Problems related to the moving out to new Department are (hopefully) under control, with minimization of inoperative time