Simple model of an electrolytic capacitor taking into ...

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HAL Id: hal-00140547 https://hal.archives-ouvertes.fr/hal-00140547 Submitted on 12 Feb 2008 HAL is a multi-disciplinary open access archive for the deposit and dissemination of sci- entific research documents, whether they are pub- lished or not. The documents may come from teaching and research institutions in France or abroad, or from public or private research centers. L’archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la diffusion de documents scientifiques de niveau recherche, publiés ou non, émanant des établissements d’enseignement et de recherche français ou étrangers, des laboratoires publics ou privés. Simple model of an electrolytic capacitor taking into account the temperature and aging time Frédéric Perisse, Pascal Venet, Gérard Rojat, Jean-Marie Rétif To cite this version: Frédéric Perisse, Pascal Venet, Gérard Rojat, Jean-Marie Rétif. Simple model of an electrolytic capacitor taking into account the temperature and aging time. Electrical Engineering, 2006, 88 (2), pp.89-95. 10.1007/s00202-004-0265-z. hal-00140547

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HAL Id: hal-00140547https://hal.archives-ouvertes.fr/hal-00140547

Submitted on 12 Feb 2008

HAL is a multi-disciplinary open accessarchive for the deposit and dissemination of sci-entific research documents, whether they are pub-lished or not. The documents may come fromteaching and research institutions in France orabroad, or from public or private research centers.

L’archive ouverte pluridisciplinaire HAL, estdestinée au dépôt et à la diffusion de documentsscientifiques de niveau recherche, publiés ou non,émanant des établissements d’enseignement et derecherche français ou étrangers, des laboratoirespublics ou privés.

Simple model of an electrolytic capacitor taking intoaccount the temperature and aging time

Frédéric Perisse, Pascal Venet, Gérard Rojat, Jean-Marie Rétif

To cite this version:Frédéric Perisse, Pascal Venet, Gérard Rojat, Jean-Marie Rétif. Simple model of an electrolyticcapacitor taking into account the temperature and aging time. Electrical Engineering, 2006, 88 (2),pp.89-95. �10.1007/s00202-004-0265-z�. �hal-00140547�

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