PANDUIT CORP Written By: Date: Subject SS- PLR-35 �cc �-12-2013 Short Circuit Force Test on Current MLT/MS75 Product f\pproved "By: .Rev: Page 2 of 2 �GRO bO

1. Scope

This report covers the short circuit testing of current Panduit Metal Locking Tie (MLT) and

3/4" wide Metal Strapping (MS75) per IEC 61914. Ties are subjected to electromagnetic

forces during a short circuit event.

2. Test Samples

Panduit Part Numbers MLT4DH-L ML TFC4EH-LP316 ML T4EH15-LP316 MLT8DEH15-LP316 MLTFC4SH-LP316 MLT4DSH-Q316 MSW75T30-CR6 MSBW75-C6 PBTMT BT75SDT

3. Test Method

Description 4" Double Loop Heavy Tie - 30455 4" Fully Coated Extra Heavy Tie - 316 SS 4" Single Loop Extra Heavy 15 Tie - 316 SS 8

11 Double Loop Extra Heavy 15 Tie - 316 SS 4" Fully Coated Super Heavy Tie - 316 SS

. .

4" Double Loop Super Heavy Tie - 316 SS 100' Roll of%" X .030" 31655 Strap %" Loose Piece Buckle - 316 SS MLT Installation Power Tool MS75 Installation Tool

QC# 13536645 13290362 12967845 12876930 13399467 13536645 13268488 13214707 13588923 B30AD093302196/E10

Various ties were applied with Panduit Installation tools and subjected to short circuit at a

prescribed peak current per IEC 61914. Each test had a minimum of five test pieces.

Samples were examined after the test to show whether the tie held and if any damage

occurred to the cable.

4. Results

See KEMA test report S12299-B

KEMA:f(

SUMMARY REPORT OF PERFORMANCE NUMBER: 512299-B

CLIENT: PANDUIT CORP. - ROMEOVILLE, IL

EQUIPMENT TESTED: METAL LOCKING TIES

MANUFACTURER'S RATINGS:

Short-Circuit Peak Current: 20 ... 110

Current Duration :

Frequency :

Number of Phases:

DATES OF TEST: December 10-12, 2012

100

6

60

3

TESTED FOR: Short-Circuit Current Withstand

kA

ms

cycles

Hz

The tests have been carried out in accordance with the client's instructions.

This report consists of 25 pages, and contains the results of tests performed at the KEMA-Powertest

Laboratory on the above noted equipment. Publication or reproduction of the contents of this report

in any form other than a complete copy is not permitted without written approval of KEMA-Powertest.

Measurement uncertainty can be verified by reviewing the instrument calibration records. The

instruments used are calibrated on a regular basis and are traceable to the National Institute of

Standards and Technology.

The results apply only to the specific devices tested and are recorded on the enclosed tables,

oscillograms, photographs, etc. A table of contents is included on Page 2.

KEMA-Powertest, LLC 4379 County Line Road Chalfont PA 18914 T +1215822 4231 F +1 215 822 4267 www.kema.com

Richard J. Cubbage

Manager, Test Operations

March 6 2013

Date

Revision #0 03/05/2013

KEMA� TABLE OF CONTENTS

PAGE

COVER SHEET .................................................................................................................. 1

TABLE OF CONTENTS ...................................................................................................... 2

TEST SUMMARY ................................................................................................................ 3

TEST REQUEST ................................................................................................................. 4

TABULATION OF DATA- PERFORMANCE RECORD .................................................. 5-6

CIRCUIT SCHEMATIC (LAB2098) ..................................................................................... 7

TEST CIRCUIT & INSTRUMENTATION DATA SHEET ...................................................... 8

INSTRUMENT INFORMATION SHEET .............................................................................. 9

ATTACHMENTS:

PHOTOGRAPHS (9) [3 PAGES]

DATA ACQUISITION SYSTEM PLOTS (TRIALS 10-13,15,20,25,26,29-33) [13 PAGES]

TESTS WITNESSED BY:

REPORT # 512299-B

Page 2 Rev. #0 03/05/2013

KEMA�

'--'6"""'1..:::

REQUEST FOR LABORATORY TESTS

Requested By: Test No.: -'1=2=2-"-99=--=B ____ _ Company: __ _,_P=an=d=u=it'""'C=o=r=po=r=at=io=n.,__

____________ Quote No. :--=Q,....,_1=24 2=2=-----

""'"'

Required Test Date: ---=D=ec=em=b=er -'-'10 - ..:..:12 2=0-'-'12

=--_____ Request Date: ---'-1=2/

-=3=/2=0

-'-'12

=------::..:: .:..:. '- :c......_ =-=

Equipment To Be Tested: Panduit Metal Locking Ties (ML T)

Type Of Tests: Short-Circuit Peak Current Withstand

Test Standards: __ --'l=E=C 9 ..... 14..,_-=S=e=ct=io,_,_n'"""'9,_,_.5=,...,p=a"-'rt'--'9'"'"'.5= . ..,_1 • .___

______________ _

Test Program:

O TEST PROCEDURE ATTACHED

O CERTIFICATE OF PERFORMANCE REQUIRED

TEST VOLTAGE PEAK

CURRENT Phase

DUTY (kV) CURRENT

DURATION NOTES

(kA)

3 With Low 20 - 110 0.1 Sec 1

NOTES: 1) See attached client instructions. Confirm current levels and durations with client before test.

MEASUREMENTS:

� TOT CURRENT AT HALF CYCLE � L-N VOLTAGE � 121

� RMS CURRENT AT HALF CYCLE D L-L VOLTAGE � HIGH SPEED VIDEO

� PEAK CURRENT � POWER FACTOR D

� RMS CURRENT AT END � OBSERVATIONS D

REPORT # 512299-B Page 4

Rev. #0 03/05/2013

TEST DEVICE:

TYPE OF TEST:

TEST OBSERVERS:

Trial Sample

10 MLTFCEH

11 MLTDH

12 MLTEH15

13 MLTDEH15

15 MLTFCSH

20 MLTDSH

25 MS 75316-SL

26 MS 75316-DL

TABULATION OF DATA - PERFORMANCE RECORD

_P_a _nd_u_it_c _o""'rp'-._-_M_e_ta_l _Lo_ c_k _in""'g_T_ie_s _______________ TEST NO.:

S hort-Circuit Current Withstand DATE: --------------------------

__________ TESTER:

W ire Size Test o.c .v. Total Sym Peak i2t (CSA/OD)

Spacing Duty (V) Phase

(kA) (kA) (kA) ( 106 A 2s)

750 kcmil 300 mm Wit h 101 A 12.7 8.9 22.3 10.5 28.5 mm 22 kA B 9.9 9.3 16.7 9.2

c 11.3 9.2 19.2 9.4 AVG 11.3 9.1

750 kcm il 300mm With 177 A 22.3 15.5 38.8 31.9 28.5 mm 38 kA B 17.2 16.1 29.3 27.8

c 19.4 16.0 32.8 28.5 AVG 19.6 15.9

750 kcmll 300 mm With 166 A 20.8 14.6 36.1 28.0 28.5 mm 36 kA B 16.0 15.2 27.2 24.4

c 18.3 15.0 31.1 25.3 AVG 18.4 14.9

750 kcm il 300 mm With 213 A 26.7 18.7 46.4 45.6 28.5 mm 46 kA B 20.4 19.3 34.6 39.5

c 23.5 19.1 39.8 41.0 AVG 23.5 19.0

750 kcmil 300mm With 128 A 16.3 11.3 28.3 16.7 28.5 mm 28 kA B 12.5 11.7 21.4 14.6

c 14.0 11.6 23.8 14.8 AVG 14.3 11.5

250 kcmil 300 mm With 432 A 48.8 37.4 87.0 169 Multi -cond . 85 kA B 39.8 38.4 65.9 155

c 45.6 38.5 76.4 161 AVG 44.7 38.1

800 kcmll 300 mm W ith 400 A 50.5 34.8 87.2 162 85 kA B 38.5 35.9 65.7 140

c 43.6 35.7 73.9 145 AVG 44.2 35.5

800 kcmll 300 mm With 510 A 63.8 45.2 111.9 261 110 kA B 49.5 46.7 83.8 223

c 56.3 46.3 95.5 234 AVG 56.5 46.1

Remarks: 1 l No D isplay. 2\ No damage to test device. All ties were OK. 3) All lies were OK.

KEMA:!(

Curr .

IDura . (ms)

103

103

103

103

103

103

103

103

12299-B

December 111

2012

LK,RP

Remarks

1,3

Ref. 12299·8 Tr ial #8 1,2

Ref. 12299-B Tr ial #8 1,2

Ref. 12299-B Trial #11 1. 2

Ref. 12299-B Trial #11 1, 2

Ref. 12299-B Trial #11 1

BS.RP

Ref. 12299-B Tr ial #19 1,3

December 12. 2012

Ref. 12299-B Trial #22 1, 3

Ref. 12299-B Tr ial #22

REPORT# 512299-8

Page 5

Rev. #0 03/05/2013

I

TABULATION OF DATA - PERFORMANCE RECORD

TEST DEVICE:

TYPE OF TEST:

TEST OBSERVERS: _

Wire Size Test o.c .v. Total Sym Pe ak i2t Trial Sa mple

(CSA/OD) Sp acing Duty (V) Phase(kA) (kA) (kA) ( 106 A 2s)

29 MLTFCEH 750 kcmil 600mm With 81 A 9.9 7.1 17.5 6.45 28.5 mm 17 kA B 7.7 7.4 12.9 5.63

c 9.1 7.3 15.4 5.98 AVG 8.9 7_3

30 MLTDH 750 kcmil 600 mm With 168 A 20.2 14,3 35.3 26.5 28.5 mm 35 kA B 15.6 14.9 26.0 23.1

c 18.3 14.9 31.1 24.5 AVG 18.0 14.7

31 MLTEH15 750 kcmif 600 mm With 144 A 17.6 12.4 30.7 19.8 28.5 mm 30 kA B 13.5 12.9 22.5 17.2

c 15.8 12.9 26.8 18.3 AVG 15.6 12.7

32 MLTDEH1o 750 kcmil 600 mm With 220 A 26.5 18.6 46.2 45.4 28.5 mm 46 kA B 20.6 19.5 34.7 40.2

c 23.6 19.4 40.0 42.1 AVG 23.6 19.2

33 MLTFCSH 800 kcmil 600 mm With 114 A 13.8 9.8 24.3 12.4 24 kA B 10.8 10.3 18.1 11.0

c 12.5 10.3 21.2 11.5 AVG 12.4 10.1

I I I I I I I I I I I

Remarks: 1 l No D ispl ay. 2) All ties were OK.

KEMA�

12299-B

Dece mber 12, 2012

LK,RP

Curr.

IDura . Re marks ( ms)

1, 2

103 Ref. 12299-B Tr i al #27 1, 2

103 Ref. 12299-B Trial #27 1, 2

103 Ref. 12299-B Trial #30 1, 2

103 Ref. 12299-B Trial #27 1, 2

103 Ref_ 12299-B Trial #28

I

REPORT# 512299-8

Page 6

Rev. #0 03/05/2013

I

I

KEMA-Powertest, Inc.

Instrumentation Information Sheet

TEST NO: 12299-B

TEST DEVICE: Panduit Corp - Metal Locking Ties

TESTED BY:

CODE# TYPE MANUFACTURER MODEL#

DAS13 DAS NATION. INST PC IS036 FO ISO AMP NICOLET ISOBE 3000 IS037 FO ISO AMP NICOLET ISOBE 3000 IS038 FO ISO AMP NICOLET ISOBE 3000

IS039 FO ISO AMP NICOLET ISOBE 3000 IS040 FO ISO AMP NICOLET ISOBE 3000 IS041 FO ISO AMP NICOLET ISOBE 3000 IS042 FO ISO AMP NICOLET ISOBE 3000

SHN193 COAX SHUNT CROMTON 3 SEC. SHN194 COAX SHUNT CROMTON 3 SEC. SHN195 COAX SHUNT CROMTON 3 SEC. VDR17 RES.VOL.DIV POWE RTE ST NON DIFF.

VDR18 RES.VOL.DIV POWERTEST NON DIFF. VDR19 RES.VOL.DIV POWERTEST NON DIFF. PTX06 P.T. GE JVM5 VDR63 DIVIDER KEMA 20/1

PAV26 PNL.VOL TMTR WESTON 1234

SERIAL#

cef222,231 IAV0002630 IAV0002614 IAV0002631

IAV0002606 IAV0002615 IAV0002629 IAV0002566

N/A N/A N/A 17

18 19 3737435 N/A

N/A

DATE: 01/23/2013

CALIBRATION

LAST DUE

11/15/2012 6/3/2013 11/15/2012 6/3/2013 11/15/2012 6/3/2013 11/15/2012 6/3/2013

11/15/2012 6/3/2013 11/15/2012 6/3/2013 11/15/2012 6/3/2013 11/15/2012 6/3/2013

1/3/2013 7/22/2013 1/3/2013 7/22/2013 1/3/2013 7/22/2013 8/1/2012 2/17/2013

8/1/2012 2/17/2013 8/1/2012 2/17/2013 10/8/2012 10/8/2014 8/9/2012 2/25/2013

12/6/2012 6/24/2013

REPORT# S12299-B

Page 9 Rev. #0 03/05/2013

jEXPH= 177. 2ms Cursor 2 - Cu or 1 =

[

63.46ms

ch 1 Curr

Curr

cm

ch 6 · -N Volt

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TRI l#33 KE, A-P werf sf, In •