RRJoESAJan -April 2014

Research & Reviews Journal of

Embedded System & Applications

STM JOURNALSScientific Technical Medical

ISSN: 2321–8533

conducted

STM Publication, a strong initiative by Consortium E-Learning Network Private ltd.(Estd. 2006) was launched in the

year 2010 under the support and guidance by our esteemed Editorial and Advisory board members from renowned

institutes.

Objectives of STM Publication(s):

?Scientific, Technical and Medical research promotions.

?Publication of genuine Research/Review, Short Articles and Case Studies through proper review

process.

?Publishing Special Issues on Conferences.

?Preparing online platform for other print Journals.

?Empowering the libraries with online and print Journals in Scientific, Technical and Medical

domains.

?Publishing and distribution of books on various subjects which mainly falls in the category of

Nanotechnology, Scientific and technical writing & Environment, Health and Safety.

Salient Features:

?A bouquet of 100+ Journals that fall under Science, Technical & Medical domains.

?Employs Open Journals System (OJS) A Journal Management & Publishing System.

?The first and one of the fastest growing publication website in India as well as in abroad for its quality

and coverage.

?Rapid online submission and publication of papers, soon after their formal acceptance/ finalization.

?Facilitates linking with the other authors or professionals.

?Worldwide circulation and visibility.

Focus and Scope Covers

is published (frequency: three times a year) in

India by STM Journals (division of Consortium e-Learning Network Private Ltd. Pvt.) The views expressed in the

articles do not necessarily reflect of the Publisher. The publisher does not endorse the quality or value of the

advertised/sponsored products described therein. Please consult full prescribing information before issuing a

prescription for any products mentioned in this publication.

No part of this publication may be reproduced, stored in retrieval system or transmitted in any from without written

permission of the publisher.

To cite any of the material contained in this Journal, in English or translation, please use the full English reference at the

beginning of each article. To reuse any of the material, please contact STM Journals (info@stmjournals.com)

Research & Reviews: Journal of Embedded System & Applications

(ISSN: 2321–8533)

Research & Reviews: Journal of Embedded System & Applications

?Micro-controller Based Embedded Systems Design

?Embedded Operating Systems

?Embedded Instrumentation & control

?Embedded Automotive Systems

?Embedded Access Technologies

? Embedded Design Cycle

?Advance Embedded Signal and Image Processing

STM Publication(s)

STM Journals (division of Consortium e-Learning Network Private Ltd. ) having its Marketing office located at Office

No. 4, First Floor, CSC pocket E Market, Mayur Vihar Phase II, New Delhi-110091, India is the Publisher of Journal.

Statements and opinions expressed in the Journal reflect the views of the author(s) and are not the opinion of STM

Journals unless so stated.

Subscription Information and Order:

Cost of Journal:

? National Subscription: Rs. 3750/- per Journal (includes 3 print issues), Single Issue copy purchase Rs.1500/copy

? International Subscription:

? Online Only- $99, Print Only-$149 (includes 3 print issues)

? Online + Print-$199 (includes 3 print issues + online access of published back volumes )

To purchase print compilation of back issues please send your query at info@stmjournals.com

Subscription must be prepaid. Rates outside the India includes speed delivery charges. Prices subject to change

without notice.

Mode of Payment: At par cheque, Demand draft, and RTGS (payment to be made in favor of

Consortium E-Learning Network. Pvt. ltd., payable at Delhi/New Delhi.

Online Access Policy

A). For Authors:

In order to provide maximum citation and wide publicity to the authors work, STM Journals also have Open Access

Policy, authors who would like to get their work open access can opt for Optional Open Access publication at

nominal cost as follows

India, SARC and African Countries: INR 2500 or 100 USD including single hard copy of Author's Journal.

Other Countries: USD 200 including single hard copy of Author's Journal.

B). For Subscribers:

? Online access will be activated within 72 hours of receipt of the payment (working days), subject to receipt of

correct information on user details/Static IP address of the subscriber.

? The access will be blocked:

? If the user requests for the same and furnishes valid reasons for blocking.

? Due to technical issue.

? Misuse of the access rights as per the access policy.

Advertising and Commercial Reprint Inquiries: STM Journals with wide circulation and visibility offer an excellent

media for showcasing/promotion of your products/services and the events-namely, Conferences, Symposia/Seminars

etc. These journals have very high potential to deliver the message across the targeted audience regularly with each

published issue. The advertisements on bulk subscriptions, gift subscriptions or reprint purchases for distribution etc. are

also very welcome.

Lost Issue Claims: Please note the following when applying for lost or missing issues:

? Claims for print copies lost will be honored only after 45 days of the dispatch date and before publication of the

next issue as per the frequency.

? Tracking id for the speed post will be provided to all our subscribers and the claims for the missing Journals will

be entertained only with the proofs which will be verified at both the ends.

? Claims filed due to insufficient (or no notice) of change of address will not be honored.

? Change of Address of Dispatch should be intimated to STM Journals at least 2 months prior to the dispatch

schedule as per the frequency by mentioning subscriber id and the subscription id.

? Refund requests will not be entertained.

Legal Disputes

All the legal disputes are subjected to Delhi Jurisdiction only.

If you have any questions, please contact the Publication Management Team:

info@stmjournals.com; Tel : +91 0120-4781211.

Chairman

Mr. Puneet Mehrotra

Managing Director STM Journals, Consortium eLearning Network Pvt. Ltd.(CELNET)

Noida ,India

Group Managing Editor Dr. Archana Mehrotra

DirectorCELNET, Delhi, India

Puneet Pandeya

ManagerMonika Malhotra

Assistant Manager

Assistant Editors

Aditya Sanyal

Himani Garg

Himani Pandey

Publication Management Team

Internal Members

External Members

Dr. Bimlesh Lochab

Industrial Tribology Machine Dynamics & Maintenance

Engineering Centre (ITMMEC)

Indian Institute of Technology Delhi, India

Prof. S. Ramaprabhu

Alternative Energy Technology Laboratory,

Department of Physics,

Indian Institute of Technology, Chennai, India

Dr. Rajiv Prakash

School of Materials Science and Technology,

Institute of Technology, Banaras Hindu University,

Varanasi, India

Dr. Rakesh Kumar

Assistant Professor, Department of

Applied Chemistry, BIT Mesra,

Patna, India

Associate Editors

Gargi Asha Jha

Nupur Anand

Priyanka Aswal

Sona Chahal

STM Journal (s) Advisory Board & Editorial Board

Dr. Ashish RunthalaLecturer, Biological Sciences Group,

Birla Institute of Technology & Science, Pilani Rajasthan, India.

Dr. Baldev RajDistinguished Scientist & Director,

Indira Gandhi Centre for Atomic Research

(ICGAR)Kalpakkam, India.

Dr. Baskar KaliyamoorthyAssociate Professor, Department

of Civil Engineering National Institute of Technology Trichy, India.

Prof. Bankim Chandra RayProfessor and Head, Department of

Metallurgical and Materials Engineering National Institute of Technology,

Rourkela, India.

Prof. D. N. Rao Professor, Department of Biochemistry,

AIIMS, New Delhi, India.

Prof. Jugal KishoreProfessor, Department of Community

Medicine, Maulana Azad Medical College, New Delhi, India.

Dr. Pankaj PoddarScientist, Physical & Materials ChemistryDivision, National Chemical Laboratory,

Pune, India.

Dr. Hardev Singh VirkProfessor Emeritus, Eternal

University, Baru Sahib, India.

Dr. Nandini Chatterjee SinghAssociate Professor,

National Brain Research Centre, Manesar, India.

Dr. Shankargouda PatilAsst. Prof., Department of Oral

Pathology, KLE Society's Institute of Dental Sciences, Bangalore, India.

Prof. Subash Chandra MishraProfessor, Metallurgical & Materials

Engineering Department, NIT, Rourkela, India.

Prof. Yuwaraj Marotrao GhugalProfessor and Head Department, Govt.College of Engineering Station Road,

Osmanpura, Aurangabad, India.

Prof. Sundara RamaprabhuProfessor, Department of Physics

Indian Institute of Technology Madras, India.

Dr. Shrikant Balkisan DhootHead Research & Development,

Nurture Earth R&D Pvt LtdMIT Campus, Beed bypass road,

Aurangabad, India.

Dr. Rakesh KumarAssistant Professor,

Department of Applied Chemistry, BIT Mesra, Patna, India

Dr. Priyavrat TharejaHead, Materials and Metallurgical

Engineering department, PEC University of Technology,

Chandigarh, India.

STM Journal (s) Advisory Board & Editorial Board

I take the privilege to present the hard copy compilation for the Volume 2 Issue (1) of Research &

Reviews: Journal of Embedded System & Applications (RRJoESA). The intension of

RRJoESA is to create an atmosphere that stimulates creativeness, research and growth in the area of

Embedded System & Applications.

The development and growth of the mankind is the consequence of brilliant Research done by

eminent Scientists and Engineers in every field. RRJoESA provides an outlet for Research findings

and reviews in areas of Embedded System & Applications. found to be relevant for National and

International recent developments & research initiative.

The aim and scope of the Journal is to provide an academic medium and an important reference for

the advancement and dissemination of Research results that support high level learning, teaching and

research in the domain of Embedded System & Applications.

Finally, I express my sincere gratitude and thanks to our Editorial/ Reviewer board and Authors for

their continued support and invaluable contributions and suggestions in the form of authoring write-

ups/ reviewing and providing constructive comments for the advancement of the journals. With

regards to their due continuous support and co-operation, we have been able to publish quality

Research/Reviesw findings for our customers base.

I hope you will enjoy reading this issue and we welcome your feedback on any aspect of the Journal.

Dr. Archana Mehrotra

Director

STM Journals

Director's Desk

STM JOURNALS

1. Automated Toll Collection using RFID Tarannum Sheikh, Naveen Hemrajani, Gaurav Bagaria, Nilam Choudhary 1

2. Measurements and Analysis of Electric Power Quality D. G. Patil, N. M. Patil 4

3. Reconstruction of Images using Image Inpainting and Super ResolutionManish Agate, M.P. Deshmukh, Gaurav Brahmbhatt, Anmol Nimbalkar, Sanket Sakhare, Akib Peerzade 12

ContentsResearch & Reviews: Journal of Embedded System & Applications

RRJoESA (2014)© STM Journals 2014. All Rights Reserved

Research & Reviews: Journal of Embedded System & Applications ISSN: 2321–8533

Volume 2 Issue 1

www.stmjournals.com

Automated Toll Collection using RFID

Tarannum Sheikh1*, Naveen Hemrajani

2, Gaurav Bagaria

3, Nilam Choudhary

4

1Department of Information Technology, Suresh Gyan Vihar University, Jaipur, India

2Department of Computer Science, JECRC University, Jaipur, India

3,4Department of Computer Science, Vivekananda Institute of Technology, Jaipur, India

Abstract

This paper discusses the Electronic Toll Collection and Radio Frequency Identification Technology (RFIT). This paper focuses on an electronic toll collection (ETC) system

using radio frequency identification (RFID) technology. The proposed system eliminates the need for motorists and toll authorities to manually perform ticket

payments and toll fee collections, respectively. Data information are also easily

exchanged between the motorists and toll authorities, thereby enabling a more efficient toll collection by reducing traffic and eliminating possible human errors.

Keywords: ETC, RFIT, RFID, motorists

RRJoESA (2014)© STM Journals 2014. All Rights Reserved

Research & Reviews: Journal of Embedded System & Applications ISSN: 2321–8533

Volume 2 Issue 1

www.stmjournals.com

Measurements and Analysis of Electric Power Quality

D. G. Patil*, N. M. Patil

Shri Sant Gadgebaba College of Engineering and Technology, Bhusawal, M.S., India

Abstract

The ideal supply voltage is pure sinusoidal voltage with nominal frequency and nominal amplitude.

Any variation from this is considered as a power quality event or a disturbance. One important

aspect in the field of power quality is monitoring and control of the qualitative parameters of the

electrical energy according to today’s standards. In that way, a big attention is paid to define the

disturbances and determination of procedures for their measurement. A large number of power

quality disturbances have been reported in the literature. Commercial power literally enables

today’s modern world to function at its busy pace. Sophisticated technology has reached deeply into

our homes and careers, and with the advent of e-commerce is continually changing the way we

interact with the rest of the world. Many power problems originate in the commercial power grid,

which, with its thousands of miles of transmission lines, is subject to weather conditions such as

hurricanes, lightning storms, snow, ice, and flooding along with equipment failure, traffic accidents

and major switching operations. Also, power problems affecting today’s technological equipment

are often generated locally within a facility from any number of situations, such as local

construction, heavy startup loads, faulty distribution components, and even typical background

electrical noise. In this paper we analyze the and measure electric power quality to study various

effects. The measurement results are obtained Pspice simulation. In the recent years adoption of

personal computers (PCs) in the field of the measurement technique offers great progress and

flexibility.

Keywords: Power quality disturbances, ripple factor, the firing angle, total harmonic distortion

RRJoESA (2014) © STM Journals 2014. All Rights Reserved

Research & Reviews: Journal of Embedded System & Applications ISSN: 2321–8533

Volume 2 Issue 1

www.stmjournals.com

Reconstruction of Images using Image Inpainting

and Super Resolution

Manish Agate*, M.P. Deshmukh, Gaurav Brahmbhatt, Anmol Nimbalkar, Sanket

Sakhare, Akib Peerzade Department of Information Technology, RSCOE, Tathawade, Pune, India

Abstract Image completion of large missing regions in a selected image is a challenging task. Old photographs have some part of the image distorted or some part of it is ruined by

folds and creases. Hiding these flaws or covering such missing regions is a necessity

sometimes and needs to be solved by using some advanced techniques. Inpainting is one such technique that helps to overcome these problems. Inpainting is a technique of

modifying an image in an undetectable form. Using inpainting requires the user to

select a part of the image to be removed and the algorithms used in it will restore the required part or patch. Image inpainting methods can be classified into two main

categories viz. Diffusion based and Examplar based approaches. Diffusion based approach has varying methods and mathematical evaluations involved. Examplar

based approach samples and copies best matching samples from the neighboring pixels

of the image surrounding the selected patch. A recent approach in image inpainting is a combination of two methods namely examplar based approach and single image

super resolution. The super resolving is done after the examplar based approach

finishes its operations so that the patching, which is coarse, gets the finishing touch by super resolving it. If the area to be restored is large then the diffusion based approach

introduces some blurring whereas examplar based approach can handle large areas

effectively.

Keywords: Examplar based, inpainting, super resolution