tional Bureau of Standards, UC San Diego, andSRI International. She received theACM/ IEEE20th DAC Best Presentation award for the talkon which her February 1984 D&T article wasbased. Frome serves as the IEEE ComputerSociety's representative to the 1985 ACM/SIGCHI conference. Inquiries should be ad-dressed to Dr. Frome at AT&T BellLaboratories, Rm. 3A-417, 600 MountainAve., Murray Hill, NJ 07974.

References1. F. S. Frome, "Improving Color CAD

Systems for Users: Some Suggestions fromHuman Factors Studies," IEEE Design &Test ofComputers, Vol. 1, No. 1, 1984, pp.18-27.

2. G. H. van der Heiden and E. Grandjean,"Ergonomic Studies in Computer-AidedDesign," Proc. ACM/IEEE 21st DesignAutomation Conference, 1984, pp.220-227.

3. L. A. Price, "Studying the Mouse for CADSystems." Proc. ACM/IEEE 21st DesignAutomation Conference, 1984, pp.288-293.

4. S. K. Card, T. P. Moran, and A. Newell,The Psychology of Human-Computer In-teraction, Lawrence Erlbaum Associates,Hillsdale, N.J., 1983.

5. J. D. Foley, V. L. Wallace, and P. Chan,"The Human Factors of ComputerGraphics Interaction Techniques," IEEEComputer Graphics and Applications, Vol.4, No. 11, Nov. 1984, pp. 13-48.

6. F. S. Frome, "It Takes User Studies toMake CAD Systems 'User-Friendly,'"Proc. IEEE Int'l Conf. Computer Design:VLSI in Computers, 1984, pp. 5-7.

7. W. J. Ridley quoted in, J. Adam,"Technology Said to Be Answer for Cur-rent Education Malaise," The Institute,Vol. 9, No. 1, 1985, pp. 11.

8. R. E. Clark, "Computers Can't Teach,"The Institute, Vol. 9, No. 1, 1985, pp. 5.

9. F. S. Frome, "Incorporating the HumanFactor in Color CAD Systems," Proc.ACM IEEE 20th Design AutomationConf., 1983, pp. 189-195.

10. G. M. Murch, "Physiological Principlesfor the Effective Use of Color," IEEEComputer Graphics and Applications, Vol.4, No. 11, Nov. 1984, pp. 49-54.

11. M. Mantei, "The SIGCHI EducationSurvey," SIGCHI Bulletin, Vol. 16., No. 2,1984, pp. 7-8.

12. J. L. Burch, ed., Computer: The Non-Technological (Human) Factors, TheReport Store, Lawrence, Kan., 1984.

13. Proc. Conf. Human Factors in ComputerSystems, Gaithersburg, Md., Mar. 15-17,1982.

14. Proc. CHI 83 Human Factors in Com-puting Systems, Boston, Dec. 12-15, 1983.

15. Proc. 28th Ann. Human Factors SocietyMeeting, Human Factors Society, PO Box1369, Santa Monica, Calif., Oct., 1984.

16. M. E. Atwood, "A Report on the VailWorkshop on Human Factors in Com-puter Systems," IEEE Computer Graphicsand Applications, Vol. 4, No. 12, Dec.1984, pp. 48-66.

GenRad, LTX, Sentry, Teradyne seek larger Japan marketUS test system manufacturers are in-

creasing their market share in Japan byintroducing new products, starting localmanufacture, and improving productsupport. In a joint venture with TokyoElectron, GenRad has started manufac-turing VLSI test systems in Japan. LTX,Sentry, and Teradyne have announcedthat they will start assembling testsystems in Japan this year.US manufacturers, expecting a 40-50

percent increase in the Japanese marketfor test systems in 1985, are attemptingto challenge the overwhelming Japanesemarket share held by Ando Denki andTakena Riken. Previously, Americanmanufacturers have concentrated on thelinear test market, an area not stronglyaddressed by Japanese companies.Two factors are said to be behind US

companies' renewed endeavors in Japan.Japanese ATE companies are beginningto introduce linear test products. TheJapanese market for memory and logictesters represents a huge potentialmarket that American ATE companiescannot afford to ignore.LTX has contracted for factory space

in Tamachi, Tokyo, and will begin pro-duction of its linear IC test systems earlythis year. In addition to assembly inJapan, LTX plans to start software de-velopment. As well as trying to increaseits current installed base of about 100linear test systems, LTX plans to sell thenew CMOS digital test system soon tobe introduced by its subsidiary, Trillium.GenRad recently announced the GR-14

VLSI test system, a Japanese-designedand Japanese-manufactured version of

the American GR-16 VLSI test system.Selling for about half the price of mostVLSI test systems, GenRad hopes thatthe new system will provide a foothold inthe Japanese market for digital testsystems. The first shipment of the GR-14is planned for March.

Sentry, with an installed base of some300 VLSI test systems in Japan, expectsto have US volume production of thenew Sentry 50 system by the middle ofthe year. The company has already an-nounced a low-cost version of the sys-tem. In addition, some Sentry systemswill be manufactured in Japan.

Teradyne, a long-time successful sellerof linear test systems in Japan, is puttingincreased efforts into selling VLSI andmemory test systems. The company hasalready started assembly of MSI/SSI testsystems in Tokyo. One mark of thecompany's stepped-up efforts in Japanis the publication of Japanese-languageversions of the J941 VLSI test systemand J386A-8 eight-in-parallel memorytest system brochures.

Teradyne's recently formed JapanEngineering Center has a mission to stayclose to Japanese customers while main-taining strong ties to US technology.The group's 20 employees have alreadydeveloped products related to laserrepair of DRAMs, hardware for testingimage sensors, and a low-cost digitalmodule for analog LSI testing. As a re-sult of local design, local manufacture,and improved support, Teradyne islooking for a 30-percent sales increasein 1985.

Robotics, CAD/CAM marketplace definedA new book, Robotics, CAD/CAM

Market Place 1985, published by Bow-ker in January, claims to be a com-prehensive guide to "a promising newworld." The book is said to include over6000 listings of reference materials,products, organizations, databases, edu-cational institutes, research laboratories,publishers, manufacturers, and scientificand technical specialists. Coverageranges from the purely technical aspects

of robotics and CAD/CAM to the so-cial, economic, and human factors.An introduction, written by Ken

Susnjara, provides an overview of therobotics and CAD/CAM fields as theyare today. Susnjara is president ofThermwood Corp., a company active inthe field of robotics.

Information is available from R.R.Bowker Company, PO Box 1807, AnnArbor, MI 48106; (800) 521-81 10.

IEEE DESIGN & TEST10

Design Editor: Steve Kang, AT&T Bell Labs, Rm. 2A423, 600 Mountain Ave., Murray Hill, NJ 07974.Test Editor: Gordon C. Padwick, Teradyne, Inc., 21255 Califa, St., Woodland Hills, CA 91367.

Computer-aided engineeringmarket study published

In the February issue of Design &Test, we briefly referenced Prime Data'sCAE Market Study. Since then, we havehad an opportunity to study the com-plete volume and can provide more in-formation.The thick, loose-leaf volume is divided

into five major sections: industry, mar-ket, competition, companies, and ap-pendices.The industry section begins with an

overview of what Prime Data calls thecomputer-integrated industry, dividing itinto computer-aided engineering, com-puter-aided design, and computer-aidedtest segments. Although the studyfocuses on computer-aided engineering,overlap between the three segments re-sults in some discussion of CAD andCAT. The remaining pages of the sec-tion provide an overview of CAE his-tory, applications, and markets.The markets section provides detailed

information about CAE markets for1981 through 1983, estimates for 1984,and forecasts for 1985 through 1988.Market information is broken down byapplication, CAE vendor, product(hardware and software), geography,and end user.

In the competition section, there is apage for each major CAE vendor inwhich sales dollars for each majorequipment category are listed for 1981through 1983.The companies section provides five-

year financial histories, product-areabreakdowns, and analyses of productsfor nine major suppliers of CAE hard-ware and software.The first three appendices contain de-

tailed tables of CAE vendor, geograph-ic, and end-user market shares. Thefourth appendix lists the worldwideeconomic factors that is part of PrimeData's database.The study is part of Prime Data's new

Computer-Integrated Service, which alsoincludes regular newsletters, an inquiryservice, and an annual conference. Forinformation, contact Prime Data, 4030Moorpark Ave., Suite 110, San Jose,CA 95117; (408) 249-7111.

Sami named D&TEuropean editor

Mariagiovanni Sami has been ap-pointed IEEE Design & Test's secondEuropean editor, Editor-in-Chief Roy L.Russo announced. Sami, who is based inMilan, Italy, joins H. Gordon Adshead,who is based in Manchester, England.D&T's third international editor isAkihiko Yamada of Tokyo, Japan.

Sami has been engaged in researchand teaching at the Department of Elec-tronics at the Polytechnic University ofMilan, where she has been a full pro-fessor of computers since 1981.Her research activities are in the area

of computer engineering; for severalyears she has been active in fault-tolerant architectures, with particularconcentration in distributed systems andVLSI architectures. Sami has publishedmore than 50 scientific papers andbooks, mostly at the international level.Her current research activities are par-

tially funded by the European EconomicCommunity under the Program for Sup-port to Research and Development inthe Area of Microelectronics. Sami isresponsible for the activities of thePolytechnic University in Project CADfor VLSI in Telecommunications, a pro-ject that involves about 25 Europeanresearch centers. She is also the leader ofProject CVT's Subtask 3.1, DesignTechniques for Fault-Tolerant VLSI.Sami is one of the founders of Euro-

micro-the European Association forMicroprocessing in Microprogram-

SIGDA funds the compilationThe ACM's Special Interest Group on

Design Automation will "compile abibliography of design automation lit-erature." SIGDA's objective in estab-lishing a grant for this project is to pro-vide added service to its membership inindustry, for whom library services areoften less available than for those inacademia.The proposal deadline was February

15, and awards will be made by May 15.Work must be completed by June 1,1986. A paper on the work will be re-

Mariagiovanni Sami of Milan, Italy,recently joined the Editorial Board.D&T now has three internationaleditors.

ming-and she is editor-in-chief ofMicroprocessing and Microprogram-ming, the Euromicro journal. She servedas organizing chairperson of the Euro-micro Symposium in 1976 and programchairperson of the Euromicro Sym-posium in 1980.Sami received her Dr. Ing. degree

from the Polytechnic University ofMilan in 1966. She is a member of boththe IEEE and the IEEE ComputerSociety. She was chairperson in 1983 ofthe Steering Committee for FTCS 13.

of DA bibliographyquired for presentation at the 1986 De-sign Automation Conference in LasVegas, Nevada.The terms of the award are flexible:

one or multiple grants may be awarded,up to a total of $25,000. Selection ofawards and administration of the grantswill be conducted by a committee ofSIGDA officers and directors. More in-formation can be obtained from CharlesA. Shaw, Chairman, SIGDA, GE-Inter-sil, 10710 N. Tantau Ave., Cupertino,CA 95014; (408) 996-5444.

April 1985 1 1

AT&T grants $2.5 million to engineering schoolsThe AT&T Foundation has an-

nounced grants totalling $2.5 million to34 major colleges and universities in sup-port of science and engineering pro-grams. "These special-purpose grants inscience and engineering are an integralpart of our overall effort to supporthigher education," said Kumar Patel,chairman of the foundation's TechnicalGrants Review Committee.The grants will go to areas that AT&T

considers increasingly important to thefuture of information technology andthe nation's economy. Among theschools receiving grants are StanfordUniversity, the Massachusetts Instituteof Technology, Cornell University, theUniversity of California, Berkeley, and

the University of Illinois, Urbana. Theprimary fields funded were electricalengineering, computer science, materialsscience, and physics.

The AT&T Foundation, which award-ed its first grants this year, is the prin-cipal philanthropic group for AT&T andits subsidiaries. While emphasizing thesupport of higher education, the founda-tion also awards grants to leading in-stitutions in the areas of social action,health, and the arts. Through its educa-tion program, the foundation alsomatches the gifts of all AT&T employeesto colleges and universities, and providesfinancial aid for their capital and devel-opmental needs.

VLSI Research surveys semiconductor industryVLSI Research, a firm specializing in

providing information and consultingservices to the VLSI industry and itssuppliers, has released its overview ofthe semiconductor industry.

According to VLSI Research, thesemiconductor industry consists of 407competitors, with the majority in the USand Japan. Semiconductor manufactur-ers based in the US accounted for 52.5percent of the world market in 1983.Japanese manufacturers were responsiblefor 35.5 percent. Europe was anotherimportant area of production, as wereseveral new emerging production areas,including Taiwan, Korea, India, andChina.

In 1983, worldwide sales of semicon-ductor manufacturers grew by 24 per-cent. Total worldwide semiconductorshipments for 1984 were almost $34 bil-lion, representing a 38.5-percent increaseover 1983. The top 15 semiconductormanufacturers accounted for 61 percentof the total world supply of semi-conductors. Texas Instruments con-tinued to be the largest supplier. The

second position was shared by Motorolaand NEC.

Capital expenditures by semiconduc-tor manufacturers in 1984 amounted to$9.3 billion, an 89.9-percent increaseover 1983, according to VLSI Research.Of the three main geographic areas, theUS has consistently spent the largestamount on capital investment, measuredboth in terms of dollars and percentageof sales.The rapid growth in the overall elec-

tronics industry is responsible for the38.8-percent growth rate of the semicon-ductor industry. Except for the solarpower industry, electronic equipment isthe sole source of demand for semicon-ductors.

While electronics have become an in-tegral part of life, it accounts for justover two percent of the GNP, leavingplenty of room for growth.For additional information, contact

G. Dan Hutcheson, VLSI Research,Inc., 1754 Technology Dr., Suite 226,San Jose, CA 95110; (408) 289-9983.

Type

LogicMemoryDSPLinearDiscretePhotoelectricTotal

1983 1984 1985

8971.8 14182.7 24716.11523.6 2371.4 5634.31019.9 2060.7 8396.94029.7 6100.8 11329.2

59768.1 62542.0 73637.75430.0 5872.1 7564.1

80743.1 93129.7 131178.3

Compoundgrov

3M, Bellcore become MCCshareholders3M and Bell Communications

Research have become the 20th and 21stshareholders in the Microelectronics andComputer Technology Corporation, ajoint venture in Austin, Texas, of UScorporations conducting advancedmicroelectronics and computer technol-ogy research.Announcing his company's involve-

ment, Lewis Lehr, 3M chairman andCEO, said, "By joining MCC we feelthat we can take advantage of the effortbeing made toward developing the nextgeneration of electronics."

According to Bobby Ray Inman,chairman, president, and CEO of MCC,"3M's diversity brings an importantperspective to our organization, em-phasizing the potential application ofMCC innovations to a wide range oftechnologies." Inman said, "Bellcore'scommitment to excellence and techno-logical advancement represents the kindof philosophy that will be a key toMCC's success."

Bellcore, formed upon the divestitureof the Bell System, is a centralized tech-nical support for seven regional phonecompanies.3M will initially be involved in MCC's

semiconductor packaging program,while Bellcore will concentrate on soft-ware technology and computer archi-tecture.The other MCC shareholders are Ad-

vanced Micro Devices, Allied, BMC In-dustries, Boeing, Control Data, DigitalEquipment, Eastman Kodak, Gould,Harris, Honeywell, Lockheed, MartinMarietta, Mostek, Motorola, NationalSeminconductor, NCR, RCA, Rockwell,and Sperry.

AMD bUYS 100th TeradyneJ941 VLSI test system

Just two years after the first J941VLSI test system was shipped, Teradynehas announced receiving an order for the100th system. That system was shippedto AMD.Commenting in a recent issue of its

monthly newsletter, VLSI Researchnoted that Teradyne was not an early

annual participant in the VLSI test systemvth rate market. Since the J941 was introduced,22.5501 however, the company has emerged as

22.5°o the leading supplier of VLSI test equip-29.9%o ment and is shipping J941s at a rate52.10% greater than one a week.23.00'o David Braje, test operations manager

23*0/° of AMD's newest MOS wafer fabrica-4.3% tion operation in Austin, Texas, received6.9%o the 100th J941 and will use the system to

10.20%o test MOS microprocessors and micrope-ripherals, including the 80286.

IEEE DESIGN & TEST

VLSI Research's estimate of current and future worldwidesemiconductor shipments in millions of units

12

Gould AMI Semiconductors offers 10 offices such as the one above for visiting com- BNR researchers check connections topanies to design gate array and standard cell ICs. Gould rents space and computer an integrated circuit before using antime at the center to interested firms. electron beam in a scanning electron

microscope to watch the circuit's opera-tions in slow motion.

Gould AMI opens center for IC designGould AMI Semiconductors has

opened a 5000-square-foot center thatprovides equipment manufacturers withall the hardware, software, and person-nel support necessary to design applica-tion-specific ICs.The design center, at the company's

Cupertino, California, facility, providescomplete services for businesses thatwant gate array and standard cell ICs,but do not have in-house design re-sources. Gould will rent space and com-puter time at the center and will also actas a foundry to fabricate the circuits de-signed there.The center has 10 separate offices for

visiting companies, each large enoughfor two or three people. Each office is

equipped with a color graphics terminal,a symbolic layout terminal, or a com-mercial workstation. The offices can belocked and are soundproofed to ensureprivacy. Group facilities include a con-ference room, a software demonstrationarea, and two training rooms whereGould personnel regularly conduct gatearray and standard cell design classes, aswell as classes in the use of Gould soft-ware and commerical workstations.Training and applications engineers areavailable for support.

Arrangements to use the design centercan be made by contacting the GouldAMI headquarters at 3800 HomesteadRd., Santa Clara, CA 95051; (408)246-0330, or through any sales office.

General Electric announces MOS-controlled thyristorA new kind of power device that

promises to simplify and reduce the costof control circuits for a wide range of in-dustrial and consumer products is underdevelopment at the General ElectricResearch and Development Center inSchenectady, New York. Known as aMOS-controlled thyristor, or MCT, thenew device is essentially a thyristor thatincorporates metal-oxide-semiconductorfield-effect transistors for gating on andoff. It functions like a thyristor understeady-state conditions. The addition ofMOS gating allows the device to be gatedon and off reliably, a radical improve-ment over standard thyristors which re-quire elaborate commutation circuits tocontrol turn-on and turn-off.

The new type of thyristor is beingdeveloped by Victor Temple, who de-scribed his research in a paper presentedat the International Electron DevicesMeeting last December. Through com-puter modeling, Temple has comparedthe performance of the MCT to severalother types of power devices. Comparedto a 600-volt MOSFET, for example,Temple projects that the new device willhave about 20 times higher current den-sity at a two-volt forward drop.Temple has fabricated a number of

experimental devices rated at 1200 volts.Preliminary tests indicate that a 15-voltsignal is required to turn off an MCTrated at 1000 amperes per square milli-meter.

BNR uses voltage contrastto test IC designs

Bell-Northern Research scientists havestarted using a new voltage contrast pro-cess to look inside operating ICs and tohelp ensure the reliability of customchips. The process enables designers toanalyze and verify circuit designs at avery early development stage by viewingslow-motion pictures of electrical signalsas they pass through complex ICs.

Voltage contrast involves placing an

operating IC inside a modified scanningelectron microscope. An electron beamis used as a strobe light to view the op-eration of the circuit in slow motion.Voltages in the circuit appear on themicroscope's monitor as contrastingshades of black and white, enablingdesigners to detect and analyze design orfabrication flaws.Frank Shepherd, manager of materials

analysis at BNR's advanced technologylaboratory in Ottawa, said the voltagecontrast technique is an improvementover conventional mechancial probesbecause it allows engineers to examinelarge areas of the circuit operating simul-taneously. "Moreover," he said, "cir-cuit lines are becoming smaller. Mechan-ical probes are becoming very difficult touse because of their relatively large size,and voltage contrast may soon be theonly efficient way to test internal areasof highly complex prototype integratedcircuits. "Once perfected, custom ICs designed at

BNR are manufactured by NorthernTelecom Electronics for the corporation'stelecommunication and information-management systems.

April 1985 13

Josef Sukonick is the newly appointedsenior development technologist at ValidLogic Systems.

Valid appoints Sukonickdevelopment technologist

Valid Logic Systems, of San Jose,California, has appointed Josef Suko-nick as a senior development tech-nologist. Sukonick will report to TomMcWilliams, vice president and afounder, and will initiate new develop-ments for CAD/CAE products.

Before joining Valid Logic Systems,Sukonick served as vice president andchief scientist at Cadtrak, an architec-tural CAD/CAM workstation manufac-turer. In 1975 Sukonick founded Nu-Graphics to develop CAD technologyfor the architecture, engineering, andconstruction industry. NuGraphics was

acquired by Cadtrak in 1981. From 1970to 1975, he directed technology andproduct development at Calma/GE.

Skolnick obtained his PhD in mathe-matics from Massachusetts Institute ofTechnology and his BS in physics at theUniversity of Pennsylvania. He has heldWoodrow Wilson and National ScienceFoundation fellowships and won the Na-tional Putnam Mathematics prize in1964. He holds over 25 US and foreignpatents.

AT&T to manufacturemegabit CMOS DRAM chipAT&T Bell Laboratories in Allen-

town, Pennsylvania, has developed aIM x I CMOS dynamic random accessmemory chip with 1.3-a/m design rules.The design team has stressed manufac-turability, chip yield, and reliability withextensive computer simulations.The one-megabit DRAM uses a single

5-volt power supply with on-chip sub-strate bias generation and has a typicalaccess time of 80 nanoseconds. Its diesize is 4.8mm x 14.5mm and is pack-aged in an 18-pin, 300-mil plastic DIP.A mask option would allow the DIPpinout to meet the proposed JEDECstandard or an evolutionary patterncompatible with the standard 256KDRAM 16-pin package pinout. As anoption for the metal mask, the DRAMcan support either a conventional pagemode or a novel fast column modewhich simplifies the board-level timingat data rates up to 20 MHz. The newmegabit DRAM holds four times theamount of memory in the same area ofthe 256K DRAM fabricated by AT&Tin 1982 yet needs only half the operatingpower and two-thirds of the access time.Thomas R. Thompsen, president of

the AT&T Technology Systems Group,said that the race toward a production-line megabit chip was the KentuckyDerby of the semiconductor industry."We'll see the unique influence of themegabit chip as designers learn how tocombine it with other leading-edgetechnologies, such as the 32-bit micro-processor, and innovative software ar-chitectures," Thompsen said. "Thesetwo next generation chips could be thefoundation of powerful and easily por-table computers. In the not too distantfuture, they could help put a superminiin business, industrial, or other specialenvironments where space is a premium,or, for that matter, in your lap."AT&T expects to be ready for manu-

facture in quantity by the end of thisyear and in full production in 1986. Thetechnical details of the chip design werepresented in February at ISSCC in NewYork City.

MOSAID sells DRAM design to US, Japanese companiesMOSAID has sold the design for a

256K dynamic random-access memoryto a US and a Japanese semiconductorcompany. MOSAID President Dick Fossclaims that the DRAM design can befabricated with simple extensions of theprocess technology currently used to

build 64K DRAMs. This claim is basedon not using Polycide processes whichthe company judges to have a high risk.Founded in 1975, MOSAID is known

for its MOS memory designs as well asfor a series of design analysis reportswhich examine commercial ICs.

Howard C. Kirsch, supervisor ofMemory Design, AT&T Bell Labora-tories holds a wafer bearing megabitmemory chips.

Zycad publishes designevaluation newsletter

Zycad, the manufacturer of the FaultEvaluator fault simulation system, pub-lishes Zyline, a four-page newsletter thatcontains news about the company andits products. For information, contactZycad, 3499 Lexington Ave. North, St.Paul, MN 55112; (612) 631-3175.

Separately, Zycad announced that ithas delivered the first two Fault Eval-uator systems to beta sites at DigitalEquipment Corporation and DataGeneral.

Accutest and Megatestmake acquisitions

Accutest, a privately held manufac-turer of memory, logic, VLSI, and para-metric test equipment has purchasedBasic Test Systems, a maker of lineardevice test systems. The undisclosedterms of the acquisition were for stockand cash.

Basic Test Systems, which currentlyemploys about 35 people, began ship-ment last October of its first product,the BTSOI.

Megatest, meanwhile, announcedthat it has acquired Parallel Systems ofSanta Clara, a manufacturer of devicehandlers.

IEEE DESIGN &TEST14

Tektronix acquires CAETektronix has announced it will ac-

quire CAE Systems, subject, at presstime, to a number of conditions includ-ing the negotiation of a formal agree-

ment and formal approval by the twocompanies.

Privately held CAE has about 140 em-ployees and is based in Sunnyvale, Cali-fornia. The company offers design-cap-ture and design-verification capabilitywith its CAE 2000 software that runs on

Apollo and Sun workstations, and on

Digital Equipment's Vax super-minicom-puters.

Tektronix, a slow starter in the CAEbusiness, clearly sees its acquisition ofCAE as a major step in its ambition tobe among the leaders. Outbidding rivalbuyers, rumored to include Hewlett-Packard, Gould, Lockheed, and Perkin-Elmer, Tektronix is said to have paid$75 million for CAE's know-how andproduct line.

Tektronix sees the combination of itstest and measurement capabilities withits own and CAE's software expertise as

the basis for a powerful solution to de-sign problems for electronics systems de-signers. The company says, "The mar-

ket now demands a full-fledged databasethat can serve as the foundation for in-tegration of other tools. CAE Systemsprovides a way to offer that critical linkto our (Tektronix's) customers. We arefully committed to being a leader in thisexciting and high-growth CAE market."The company believes that the acquisi-tion of CAE gives it an immediatemarket presence.

Tektronix plans to port CAE softwareto the 6000 family of workstations. Theintegration of CAE software with layoutsoftware products from Tektronix's VRInformation Systems subsidiary and ap-

plications software from the company'sDesign Systems Division is said to pro-

vide a comprehensive line of integratedCAE tools.

Gateway DesignAutomationspecializes in CAD toolsGateway Design Automation Corp.,

located in Littleton, Massachusetts, wasincorporated in August 1982 withPrabhu Goel as its president. Goel hasnine years of technical and mangementexperience at IBM and Wang. Co-founders are Barry Rosales, formerly ofIBM; Philip Moorby, formerly of CirrusComputers and the principal architect ofHILO-2 and a key contributer toHITEST; and Chi-Lai Huang, an expertin the automation of logic synthesis.Both Goel and Rosales received IBMOutstanding Innovation Awards while atIBM.

Gateway offers a number of productsand services in CAD software for designverification and testing of very large dig-ital circuits contained on LSI/VLSIchips or on complex cards and boards.Its Verilog integrates the capabilities ofbehavioral-level languages such as N2,register-transfer-level languages such asISP, gate-level languages such asTegas-V, and switch-level languagessuch as BIMOS. Verilog provides sym-bolic debugging facilities for the designerto find design errors at all levels ofdigital design description.

Other CAD tools include AIDSSIM,for interactive logic and concurrent faultsimulation at the gate/switch level;AIDSTG, for generation of integratedtests based on the scan design discipline;and PCLIB, a gate-level model libraryfor most of SSI/MSI integrated circuits.

GDA is privately financed. By July1984, its second year sales rose to$600,000 from the first year sales of$60,000. Additional information can beobtained from Gateway Design Automa-tion Corp., PO Box 1545, 235 GreatRd., Littleton, MA 01460; (617)486-9701.

IMP selects Robinson director of customer toolingInternational Microelectronic Prod-

ucts appointed Marc Robinson as thedirector of its customer tooling business.Robinson will report to Zvi Grinfas,senior vice president of business groups

and will be responsible for all aspects ofthe silicon foundry business at IMP.Most recently Robinson was with

Advanced Micro Devices as operationsmanager for its MOS ATD fabricationarea and manager of planning and ad-ministration for corporate technology.Before coming to AMD, he held man-

agement and technical positions inAmerican Microsystems, Inc., Mono-lithic Memories, National Semicon-ductor, and AT&T Technologies.

Robinson holds a BS in physics fromthe Cooper Union in New York City andan MS in physics from Franklin andMarshall College in Lancaster, Penn-sylvania. IMP, headquartered in SanJose, California, designs and manufac-tures standard cell-based CMOS VLSIcircuits and offers 3- and 5-micronCMOS and NMOS processes.

April 1985

F,

The fourteenth edition of this interna-tional forum addresses the full spectrumof related problems and solutions. Thebroad program discusses the testing ofevery conceivable integrated circuit andimplications of concern to every profes-sional involved in testing.

Order #502PROCEEDINGS: 1983 InternationalTest Conference, October 1983

Nonmembers-S66.00Members-$33.00

Order from IEEE Computer SocietyOrder Dept.

PO Box 80452, Worldway PostalCenter

Los Angeles, CA 90080 USA

Functional, structural, and perfor-mance testing of digital logic systems are

described in this volume, which contains46 papers reprinted from sources such as

Design A utomation Conference Proceed-ings, IEEE Transactions on Computers,and International Test Conference Pro-ceedings.

Order #573

Selected Reprints on Logic Designfor Testability 1984

Nonmembers-$25.00Members-S18.75

Handling charges extraOrder from IEEE Computer Society

Order Dept., PO Box 80452Worldway Postal Center

Los Angeles, CA 90080 USA(714) 821-8380

KaNoDfi?i .DGs+EIni

1111111i N11'wE1Ku!!"ooT,cS

Technical program addresses factory-of-the future issuesThe 1985 Test & Measurement World

Expo, May 14-16 at the San Jose, Cali-fornia, Convention Center, will featuretechnical sessions and an exhibition.

During the three days, 24 technicalsessions with over 100 papers will focuson test, measurement, and inspection,particularly as these topics relate to thefactory of the future. Sessions of par-ticular interest include "Memory TestingChallenges in the 80's," "Testing ofSurface-Mounted Devices," "SoftwareIssues in Test and Measurement," and

IBM'S VLSI academic initiativeIBM's Federal System Division in

Manassas, Virginia, has established aVLSI program with the University ofIllinois, Pennsylvania State University,and Purdue University. This programallows universities to use IBM's MasterImage chip design system and methodol-ogy. Students design 4.2 mm x 4.2 mm,2-micron NMOS Master Image chips.Each contains 560 cell locations. ThisMaster Image provides a sufficient areato implement nontrivial designs, but alsolimits the design complexity to a man-ageable semester project.

Students are provided with a macro-cell library of predesigned functionalblocks ranging from inverters to highlyautomated placement and wiringfacilities, allowing designers to concen-trate on logic design and functionalverification.The unique feature of this arrange-

ment is the design methodology and testrequirements levied on the designer.

"Future Factory Test and MeasurementConcepts. "The expo includes a four-day course

entitled "Automatic Testing Technol-ogy: Hardware & Software Systems."Exhibitors will display a wide range ofequipment, including CAD/CAE/CATand ATE systems.

Complete details of the technical pro-gram and course are available from MegBowen, Conference Director, Test &Measurement World Expo, 215 BrightonAve., Boston, MA 02134; (617) 254-1445.

Only a limited number of designs whichpass rigorous logical, physical, andtestability rule checks may subsequentlybe selected by the professors to be fabri-cated by IBM. Fabricated chips returnedto the student designers are accompaniedby the results of stuck fault verificationtesting.

Complete closure of the design pro-cess is obtained by the student designerfunctionally testing the chip and verify-ing that it performs its predicted logicfunction. The chips are packaged in48-pin dual in-line packages with 43 I/Oconnections.The hardware portion of the design

facility is centered around an IBM 4341computer or its equivalent. Schematicsand physical layouts can be viewed on aTektronix 618/614 storage display ter-minal. More information can be ob-tained from N. C. Panella, IBM FederalSystems Division, 9500 Godwin Dr.,Manassas, VA 22110.

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Intelrs CMOS EPROM getsfirst IC mask copyright

In early January, Intel's 27C256CMOS EPROM chip became the firstchip to be registered under the newSemiconductor Chip Protection Act of1984. Motorola, Inc., and Harris Corp.reportedly also registered a MC6BO2032-bit microprocessor and a 64KPROM, respectively.To secure protection, owners of mask

works must apply for registration oftheir claims with the copyright office.Owners must register their works withintwo years after the date on which themask work is commercially exploited, orthe opportunity to gain protection underthe act will be lost.

Protection for a mask work begins onthe date the work is registered with thecopyright office, or on the date themask work is first commercially ex-ploited anywhere in the world. Protec-tion lasts for 10 years.To apply for registration of a mask

work, a completed Form MW and anonrefundable $20 filing fee must besent with the appropriate identifyingmaterial to Register of Copyrights,Department MW, Library of Congress,Washington, DC 20540. Form MW canbe obtained free of charge by sending arequest to Information Section, LM-401,Copyright Office, Library of Congress,Washington, DC 20540, or by calling theforms hotline at (202) 287-9100.

Sentry discontinuesshowing at semicon west

Sentry Test Systems (previously Fair-child Component Test Systems) says thatit will no longer show its products atSemicon West. Instead, Sentry will dem-onstrate its test systems at its own WestCoast facilities. The company feels thatin-house demonstrations are more effec-tive, particularly for large, high-tech-nology, high-pin-count systems such asthe Sentry 50 VLSI and the Series 80analog/digital test systems.

During Semicon West, Sentry willconduct an open house at its San Jose,California, facility. A broad range ofmemory, digital, and analog productswill be on display. Visitors will also havethe opportunity to preview new productsand to inspect the company's engineer-ing, research, and production facilities.

Sentry notes that it will continue toparticipate in Semicon technical pro-grams and that it will exhibit products atthe International Test Conference No-vember 19-21 in Philadelphia.

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