Prevention is better than Cure In-situ Monitoring and ...€¦ · “Defects” are clearly a...
Transcript of Prevention is better than Cure In-situ Monitoring and ...€¦ · “Defects” are clearly a...
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Prevention is better than Cure In-situ Monitoring and Machine Learning
P1: Process by Design Iain Todd
Director, MAPP EPSRC Future Manufacturing Hub RAEng / GKN Aerospace Research Chair
Department of Materials Science and Engineering The University of Sheffield
Input Process Output
Current situation 2
Variable
Fixed
Limited or no monitoring
Variable
MAPP Approach 3
Input Process Output
Designed for process
Monitored
Dynamic control via machine learning
Designed
Quality built in
Defects
“Defects” are clearly a function of process parameters
In a single build, the number of defects (red) can be altered by changing the melt strategy. Red = high circularity defects (gas pores)
S. Tammas-Williams, H. Zhao, F. Léonard, F. Derguti, I. Todd, P.B. Prangnell, XCT Analysis of the Influence of Melt Strategies on Defect Population in Ti-6Al-4V Components Manufactured by Selective Electron Beam Melting, Mater. Charact. 102 (2015) 47–61.
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Where: q = Beam power v = Beam traverse rate l = Layer thickness h = Hatch offset
S. Tammas-Williams, H. Zhao, F. Léonard, F. Derguti, I. Todd, P.B. Prangnell, XCT Analysis of the Influence of Melt Strategies on Defect Population in Ti-6Al-4V Components Manufactured by Selective Electron Beam Melting, Mater. Charact. 102 (2015) 47–61.
HIP
Whilst HIPing is undoubtedly good – it is not a “cure all” S. Tammas-‐Williams et al. Metallurgical and Materials TransacLons A May 2016, Volume 47, Issue 5, pp 1939–1946
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Defects After HIPing and heat treatments
As-built HIP
From Cordero et al.J Mater. Sci 52, (2017), 3429-‐3435
PrevenLon is be\er than Cure (1): In-‐situ DetecLon
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Thermal camera Specifications
• 2048x2048 resoluLon • High quantum efficiency allows good
detecLon in NIR spectrum (650 -‐ 1800C) • Temperature range can be shiced by
changing the ND filter • ConLnuous video feed during preheat
and melt • 100 fps at full resoluLon
• 2048x512 -‐ 400 fps • 2048x128 -‐ 1603 fps • 2048x8 -‐ 25,655 fps
• Custom made lenses with AR coaLng
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Thermal camera Example Footage
Tunnel Defects 10 mm
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Thermal camera Example Footage
10 mm
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Metallic powders Boron Nitride
plates
Scan direction
Attenuated X-ray
250 µm Synchrotron X-ray
In situ AM Synchrotron Setup
Diamond Light Source
In situ AM on Beamline I12
SS316, 200W, 7.5mm/s, 5000fps
Leung, Lee, Towrie et al, Funding EPSRC (RCaH&MAPP), FP7
PrevenLon is be\er than Cure (2): Control (Machine Learning)
Model-Based Feature Selection Based on Radial Basis Functions
and Information Theory George Panoutsos
EU H2020: Factories of The Future
Agreement no. 636902
Human-Centric Systems
• Human-Centric Systems: Computational Systems designed for user-centred information processing – Frameworks that mimic human cognition, i.e.
incremental learning, learning from examples etc. – Systems that are easy to interpret and interact with –
by non-experts i.e. linguistic interpretability
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Process monitoring • High-‐speed imaging and bespoke illuminaLon system for melt pool monitoring
• Spectral monitoring
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0,0 0,2 0,4 0,6 0,8 1,0 1,2 1,4 1,60
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Volta
ge [V
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Time [s]
Reference Limit 100 W (seam 1) 100 W (seam 2) 100 W (seam 3) 90 W (seam 1) 90 W (seam 2) 90 W (seam 3)
Courtes:y LZH, CAVITAR
Courtesy: 4D
Methodology
• Construct a modelling framework based on a data-‐driven approach (model output: defects)
• Develop a fast, but transparent ‘learning’ methodology for the model
• Observe (algorithmically) how the model learns from data
• Use informaLon theory to link the learning performance of the model to the input signals (process monitoring)
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The model’s learning evolution (training error) is
linked directly to the model’s inputs (monitoring signals)
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Output layer weights Training Error
Each model input ‘xj’ corresponds to a metric from the process monitoring signals
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Hypothesis: For two data sequences (model weights – evoluLon of model learning) we can use informaLon-‐theoreLc measures to idenLfy relevance/importance:
Cross-‐sample entropy is used [1]:
[1] G. Tzagarakis and G. Panoutsos, Model-‐Based Feature SelecLon Based on Radial Basis FuncLons and InformaLon Measures, Proceedings of the 2016 IEEE World Congress on ComputaLonal Intelligence, Canada (2016)
Simulation results • SimulaLon results on a
sample of 81 welds • 80 features from the
monitoring signals were used to create the overall dataset
• Most important metric linked to defects: – Mean of reference width
measurement (meltpool)
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Example model-‐based defect predicLon surface
What Next in MAPP?
• Development of Deeper Process “rules” • Performance by Design - building from / on
– models of differing levels of complexity – generation of Axioms – data acquisition – in and ex-situ and in-operando – direct observation – visual,thermal, spectral, X-Ray etc.
• Capacity to Develop “cyber-physical” manufacturing environments – Human Centric but Machine Learning enabled
• This is a clear intersection of AM and Industry 4.0 – but should enable the promise of AM (and other processes) to be fulfilled.
Our Partners
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