Outline

CALIBRATION OF TEVATRON IONIZATION CALIBRATION OF TEVATRON IONIZATION PROFILE MONITOR (IPM) FRONT END (FE) PROFILE MONITOR (IPM) FRONT END (FE)

MODULESMODULES

Moronkeji BandeleMoronkeji BandelePhysics and Engineering DepartmentPhysics and Engineering Department

Benedict College, Columbia, South CarolinaBenedict College, Columbia, South CarolinaSummer Internships in Science and TechnologySummer Internships in Science and Technology

Supervisor: Kwame BowieSupervisor: Kwame Bowie

August 7, 2007August 7, 2007 BandeleBandele 22

OutlineOutline Motivation Tevatron IPM DAQ System Tevatron IPM Front End (FE) Board Research Objectives Experimental Analysis

Material Preparation Initial Function Test Charge Injection Calibration Test Long – Term Stability Test

Data Analysis / Calculations Gain Plots Conclusions Future Works Acknowledgements


MotivationMotivation A Data Acquisition (DAQ)

instrument for Tevatron

Tevatron Ionization Profile Monitor (IPM) System - to monitor the proton and antiproton beam bunch size and position at a fixed location in the Tevatron

IPM Front End (FE) Components: In – Tunnel Subsystem Upstairs Subsystem – implements

all the intelligence and control for the Tevatron IPM DAQ system.

The Tevatron and Main Injector rings


MotivationMotivation In – tunnel Subsystem (Single Euro

Card Crate) Backplane – serves as medium for

power supply Fan – out card – duplicates signals it

receives from timing card Front – end (FE) boards – houses

the very important QIE8 chip, developed by engineers at Fermi Lab.

Upstairs Subsystem (Single PC) Timing Card – timing card sends

signals to the Euro card crate (fan – out card) on a single CAT5 cable.

Buffer Boards – stores data received

Buffer CardBuffer Card

Fan – out CardFan – out Card


Tevatron IPM System flow chartTevatron IPM System flow chart

Host PC (Labview)

Timing card(PCI)

Data Buffer(2*8 ch)

PCI

Timingfan-out

QIE cards(16x 8 ch)

Upstairs SubsystemUpstairs Subsystem

In – tunnel SubsystemIn – tunnel Subsystem


Tevatron IPM DAQ SystemTevatron IPM DAQ System

Computer screen

Oscilloscope

Schematic Diagram of Schematic Diagram of Experimental SetupExperimental Setup Pulse – carrying

Cable

Channel selectors

Trigger

Fan-out card

Backplane

Euro card Crate

CAT5 Cable

PC

Analog Pulse

Timing/Clock signal

Power supply

Pulse Generator

FE Boards

Bias Resistor

Optical Fiber

Oscilloscope


Materials PreparationMaterials Preparation Solder bias resistor onto cable

Connect cable to channel selector

Insert board (s) into Euro card crate

Insert optical fiber into the optical data link

Connect CAT5 cable into PC and Euro card crate

Connect charge – carrying table to FE board

Power on the pulse generator, power supply, oscilloscope


Material PreparationMaterial Preparation

Channel SelectorsChannel Selectors OscilloscopeOscilloscopeResistorsResistors

Power Supply systemPower Supply system FE Boards in FE Boards in Euro card crateEuro card crate

Bias resistorBias resistor soldered to cablesoldered to cable


Tevatron IPM SystemTevatron IPM System

Actual Experimental SetupActual Experimental Setup


Tevatron IPM FE BoardTevatron IPM FE Board Front End portion of the IPM DAQ

system Contains the very important radiation

tolerant Application Specific Integrated Circuit (ASIC), QIE8, developed by engineers at Fermi Lab. QIE8 uses parallel circuitry to achieve a dead timeless continuous integration.

FE board functions QIE8 Chip integrates and digitizes charge

received at its input channels Generate timing and error information for

each beam bunch Transmit data to Buffer Boards via optical

link


Front End (FE) CardFront End (FE) CardB

AC

KP

LA

NE

QIEs,Biasing, and

Interface

PowerSupply

ClockDistribution

CircuitryQIE clock = 15 MHz

Serializer clock = 40MHz

9 Bits

9 Bits

9 Bits

9 Bits

Laser Optical Module1.6Gb/sOptical Link

9 Bits

9 Bits

9 Bits

9 Bits

Logic and ControlFPGA Module

8 Point to point PECL Clock Pairs

Header Word

Serializer

PECL

QIEclock


IPM FE CARD OverviewIPM FE CARD Overview1. Optical Link2. Clock Distribution3. Crystal Oscillator4. CERN GOL5. FPGA6. Analog Connectors7. QIE8 Chips8. Glue Logic9. Power Regulator10. Backplane

Connectors

6a6a

55

44

33

2211

8b8b

7a7a

7f7f

7f7f

7e7e

7d7d

7c7c

7b7b

7g7g

8c8c

8d8d

8a8a

6b6b

9a9a

9b9b

10a10a

10b10b


Research ObjectivesResearch Objectives

To test/calibrate the boards To collect charge data To analyze data

Testing Process Initial Functional Test Charge Injection Calibration Test : Research Focus Long Term Stability Test


Initial Function TestInitial Function TestInsert FE boards into Euro card crateSupply power through backplaneRun boards for five consecutive events

using Labview program; process dataMonitor closely for errors at channelsLog events in a data text fileProceed to Charge Injection Calibration

Test phase.


Initial Function TestInitial Function Test

Sample data logged into text fileSample data logged into text file


Charge Injection Calibration TestCharge Injection Calibration Test

Set and record pulse width and amplitude

Calculate expected output charge (area under pulse)

Inject charge to FE board/QIE generated by pulse generator

Run five consecutive events Read and analyze data using

Labview Software Record Pulse Peak Convert peak value from QIE

code to charge value Plot experimental results against

expected charge value

ME!ME!


Charge Injection Calibration TestCharge Injection Calibration Test


Long Term Stability TestLong Term Stability Test

Many boards are placed into Euro card crate A looping acquisition is started. The

acquisition counts the number of errors of each type on each board.

Test is run long enough to acquire enough statistics to be confident of the actual error rate.

This test is repeated with different groups of boards.


Long Term Stability TestLong Term Stability Test

Screenshot from the Tevatron IPM Labview programScreenshot from the Tevatron IPM Labview program


Data Analysis - CalculationData Analysis - CalculationVoltage (V) = Current (I) * Resistance(R), Ohm’s

Law

I = V R

7.32V= I 1.3MΩ; 1.3MΩ = 1.3 * 106 Ω I = 7.32V

1.3 * 106 Ω =5.63 * 10-6A

Area of Rectangle (Length * breath)

= (4.56 * 10-9s) * (5.63 * 10-6A)= 25.6763 * 10-15C= 25.6763fC

Area of Triangle {(1/2) * base * height}= {((5.22/2) * 10-9 s) * (5.63 * 10-6A)}=14.6943fC * 2=29.3886fC

Area under the curve (Expected charge value)= Area of Rectangle + Area of Triangle= 25.6763fC + 29.3886fC= 55.0649fC

7.32V / 7.32 * 10-6A

15.0ns

4.56ns

4.56ns

5.22ns5.22ns

ba c


Calibration Test - DataCalibration Test - DataQIE code Charge Value (fC)

43 112

44 117

45 122

46 127

47 132

48 142

49 152

50 162

51 172

52 182

53 192

54 202

55 217

56 232

57 247Conversion TableConversion Table

Screenshot from the TevatronScreenshot from the Tevatron IPM Labview programIPM Labview program


Calibration Test - DataCalibration Test - DataChannel 0 Channel 1 Channel 2 Channel 3 Channel 4 Channel 5 Channel 6 Channel 7

47 54 55 55 56 55 56 54

49 55 54 54 59 52 54 53

50 55 54 55 58 54 52 53

48 54 55 51 55 55 54 54

43 53 54 55 55 54 55 52

Channel 0

(fC)Channel 1

(fC)Channel 2

(fC)Channel 3

(fC)Channel 4

(fC)Channel 5

(fC)Channel 6

(fC)Channel 7

(fC)

132 202 217 217 232 217 232 202

152 217 202 202 282 182 202 192

162 217 202 217 262 202 182 192

142 202 217 172 217 217 202 202

112 192 202 217 217 202 217 182

Average 140 206 208 205 242 204 207 194

Raw Data from Lab view ProgramRaw Data from Lab view Program

Converted Data from Lab view ProgramConverted Data from Lab view Program


channel 0

(fC)channel 1

(fC)channel 2

(fC)channel 3

(fC)channel 4

(fC)channel 5

(fC)channel 6

(fC)channel 7

(fC)

ExpectedCharge

(fC)

15ns 140 206 208 205 242 204 207 194 55.0649

35ns 294 277 327 289 316 310 320 265 154.825

55ns 432 377 378 397 392 417 422 382 258.98

channel 0

(fC)channel 1

(fC)channel 2

(fC)channel 3

(fC)channel 4

(fC)channel 5

(fC)channel 6

(fC)channel 7

(fC)

Expected

Charge(fC)

15ns 112 139 136 137 126 136 145 122 6.59

35ns 169 175 171 156 161 173 181 167 18.59

55ns 203 199 193 186 202 199 207 194 31.08

channel 0

(fC)channel 1

(fC)channel 2

(fC)channel 3

(fC)channel 4

(fC)channel 5

(fC)channel 6

(fC)channel 7

(fC)

Expected

Charge (fC)

15ns 557 542 527 542 512 537 527 537 715.896

35ns 898 878 938 928 968 833 918 948 2013

55ns 1130 1205 1215 1200 1225 1150 1285 1245 3367.2

Calibration Test - DataCalibration Test - Data100k100kΩΩ

1M1MΩΩ

10M10MΩΩ


Gain Plots – Board #21Gain Plots – Board #21Board 21 - Channel 0

01000200030004000

0 200 400 600 800 1000 1200

Observed charge

Exp

ecte

d C

harg

e

Board 21 - Channel 1

0

1000

2000

3000

4000

0 500 1000 1500

Observed charge

Exp

ecte

d ch

arge


01000200030004000

0 500 1000 1500

Observed charge

Expe

cted

cha

rge


01000200030004000

0 500 1000 1500

Observed charge

Exp

ecte

d ch

arge


Gain Plots – Board #23Gain Plots – Board #23Board 23 - Channel 0

0

1000

2000

3000

4000

0 500 1000 1500

Observed charge

Exp

ecte

d ch

arge


0

1000

2000

3000

4000

0 100 200 300 400 500 600

Observed charge

Expe

cted

cha

rge


0

1000

2000

3000

4000

0 500 1000 1500

Observed charge

Exp

ecte

d ch

arge


0

1000

2000

3000

4000

0 200 400 600 800 1000 1200

Observed charge

Exp

ecte

d ch

arge


ConclusionsConclusions

Difference in readings due to the variation in the experimental setup from advised specifications for QIE8

Chip was originally designed to function at the Large Hadron Collider (LHC) at CERN

The clock integration period at which the QIE8 operates in Tevatron is 66ns (15.17MHz);should be 25ns (40MHz)

Longer clock integration time is necessary here at the Tevatron at Fermi Lab because of the difference in particle spacing

Bias resistance value of 750kΩ being used in the QIE circuitry, instead of the specified 220kΩ


ConclusionConclusion

Some channels on some test boards are dead

The majority of the channels have a similar linear transfer function, as expected

Most of the Front End Boards are good and can be used in Tevatron IPM Data Acquisition (DAQ) System


Future WorksFuture Works

There will be modifications made to several components of the channels

Boards will be re – tested until the desired result is attained


AcknowledgementsAcknowledgements

Almighty God

Dianne Engram

Dave Ritchie and Elliot McCrory, Mentors

Kwame Bowie – My Supervisor

Dr Davenport, Mentor

Particle Physics Division / Electrical Engineering Department Staff, 14th Floor

SIST Interns

Outline

Documents

Transcript of Outline