Opportunity and Challenge: >21% large-area n-type PERT bifacial...
Transcript of Opportunity and Challenge: >21% large-area n-type PERT bifacial...
Yifeng Chen, Shengzhao Yuan, Yanfeng Cui, Zigang Wang, YunSheng, Chengfa Liu, Daming Chen, Pietro P. Altermatt, Zhiqiang Feng and Pierre J. Verlinden
Opportunity and Challenge: >21% large-area n-type PERT bifacial solar cells in research and production
BifiPV2016 workshop, Miyazaki
Sep 29th, 2016
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Low cost
Reducing the Levelized Cost of Electricity
(LCOE)
High efficiency
High reliability
Good field performance
Key elements for a PV module
Module
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First development of n-type bifacial in Lab
n-type Si base
ARC Front contacts
p+ emitter
n+ BSF
20
20.5
21
21.5
Eff
icie
ncy
[%]
Time
Avg EffMax Eff
Industrial feasible tools and process for stable mass production:
Tube boron diffusion
Tube phosphorus diffusion
PECVD double side passivation
Front & Back screen printing
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J0,e 8% J0,e (metal)
13%
J0, bulk 52%
J0, bsf 15%
J0, BSF (metal)
12%
Power loss analysis
Fabricate reference sample to extract J0 in: Emitter
Auger, SRH, front surface (passivated), front contact
Base: Auger, SRH
BSF: Auger, SRH, rear surface (passivated), rear contact
J0 distribution of a 20.4% cell No. 1
No. 2
No. 3
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Shallow defects in n-type material
n-type: lifetime may be influenced by shallow defects
• Thermal double donors (TDD). Defect levels from 50 – 69 meV below the conduction band edge, Ec, (neutral states), from 114 – 156 meV for singly ionized (positively charged) states. [1,2]
• Sometimes, thermal donors can form associated deep defect levels by reacting with impurities [3,4]
[1] D. Wruck, P. Gaworzewski, Phys. Stat. Sol. (a) 56, 557 (1979). [2] A.R. Bean, R.C. Newman, J. Phys. Chem. Solids 33, 255 (1972). [3] E. Simoen et al, J. Elchem. Soc. 150 , G520-G526 (2003). [4] M. Tomassini et al, J. Appl. Phys. 119, 084508 (2016).
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Shallow defects in n-type material
n-type: lifetime may decrease with bias (with inj. level)
Higher injection Δn widens plateau, shallow defects become more
recombination active
Difference in lifetime between Vmpp and Voc is maximal at
Ed < 100 meV and at low Ndop.
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Mechanism of FF changes
n-type: lifetime decreases with bias → increase of FF
Higher voltage Higher Δn (injection density)
inj.-dep. lifetime
increases FF W. Duan et al, 23nd EU PV Conf., paper 2CO.2.1 (to appear)
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Efficiency improvements roadmap in Lab Improvements to avg. eff. 21.3% by: Base:
→Improving bulk lifetime
Emitter: →Optimization of surface passivation →Improving metallization →Boron diffusion thermal budget
BSF: →Selective BSF
n-type Si base
n++ BSF
n+ BSF
20
20.5
21
21.5
Eff
icie
ncy
[%]
Time
Avg Eff Max EffSelective BSF
Improving bulk lifetime
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Demonstration of >21% efficiency in pilot line
Solar Cell Efficiency
Quality of Starting Material
Cleanliness of Facilities
Solar Cell Design Process
Operating Procedures
Stability of production equipments
Solar Cell design is not the only thing to improve
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Demonstration of >21% efficiency in pilot line
Trina Solar,2016/9
Eff. [%]
Jsc [mA/cm2]
Voc [mV]
FF [%]
Average 21.23 39.48 668.4 80.74
Median 21.44 39.60 671.4 80.89
Best 21.74 39.81 673.1 81.49
We started pilot line from June 2016 Latest batch run in a pilot line in “Golden Line”, rear side efficiency 20.4-20.8%
20.6
20.8
21
21.2
21.4
21.6
21.8
0 50 100 150 200 250 300 350 400 450
Cel
l eff
icie
ncy
[%]
Cell number
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First batch of double glass modules & reliability
Front side 280W 285W 290W 295W
Distribution 2% 22% 62% 14% Calibrated with reference modules tested in Fraunhofer CalLab.
Fabrication of the first batch 300pcs of modules Bifaciality of 93%
Rear contribution 10% 20% 30% Total power 317W 344W 370W
Reliability: LID < 1% TC300 < 2% Mechanical loading <2% PID <2% Hot spot defined by UL and IEC
DH+ML and TC+HF ongoing
Reliability: Dual Glass PV Module Design (DuoMax)
• Replacing the backsheet of standard modules with another glass panel significantly reduces the reliability risk in harsh climates
2.5mm front glass/2.5 back glass
Both heat-strengthened
Frameless
60 or 72 cells
Mono or Multi
White reflective EVA or transparent EVA
Designed for 1500V max system voltage (IEC 1500V & UL1000V certified)
900MW modules sold No.1 market share
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108kW fish culture &PV system in Changzhou
Location: Menghe, Changzhou (31°59'11.4"N, 119°49'59.9"E)
Climate: subtropical Surroundings: over the lake System capacity:
36 kW multi 36 kW bifacial 36 kW bifacial
System starting: Oct, 2016 LCOE calculation Publication sharing
Trina farmland Lake
Same inverter Same location & Climate Same operators Same installation Same measurement system “Apple-to-Apple” comparison
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Achievements:
Significant progress of n-type bifacial project in Trina Solar since 2016: Power loss analysis indicates that recombination in the bulk dominates
Improving of technologies yields avg. 21.2% efficiency and >670 mV Voc in pilot line, with best efficiency of 21.7%
Module power 285W-295W (front) demonstrated with promising reliability
Issues to be solved:
Standard! Standard! Standard! Black sheet is NOT that black
Reproducible, measureable, useful for system builders
Mounting designs still need optimization
LCOE should be demostrated
To enter the market, the rear side gain “X”% should be clear System level test
Conclusions
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Issues of bifacial technologies
0
20
40
60
80
100
300 500 700 900 1100
Refle
ctan
ce (%
)
Wavelength (nm)
Black backplane (4%)
White Backplane (70%)
4%
4% 4%
Cell/module
4%
Cell/module
Measured Eff drop 0.2% Overestimation of Jsc!
Too many “21%” n-PERT cells with <665mV Voc
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Achievements:
Significant progress of n-type bifacial project in Trina Solar since 2016: Power loss analysis indicates that recombination in the bulk dominates
Improving of technologies yields avg. 21.2% efficiency and >670 mV Voc in pilot line, with best efficiency of 21.7%
Module power 285W-295W (front) demonstrated with promising reliability
Issues to be solved:
Standard! Standard! Standard! Black sheet is NOT that black
Reproducible, measureable, useful for system builders
Module and mounting designs still need optimization
LCOE should be demonstrated
To enter the market, the rear side gain “X”% should be clarified System level test
“Apple-to-Apple” comparison
Conclusions
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