MarkRaymond I2C-problems CMStracker11 07 01.ppt...

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I 2 C investigations - some reported problems from some APV users - sensitivity to “termination” resistance and power supply levels -I 2 C scheme very simple, ought to be problem free - so what’s going on? Outline probable cause of problems measurements on I2C transactions on CCUM/hybrid measurements of APV I2C drive strength possible solutions July, 2001 CMS Tracker Electronics 1 Mark Raymond [email protected] content here summarises e-mail exchanges between: S.Marchioro, R.Hammarstron, V.Commichau, J.Mnich, J-D.Berst, U.Goerlach, G.Hall, M.French, C.Ljuslin, C.Paillard, W.Karpinski. I 2 C website http://www.semiconductors.philips.com/i2c/

Transcript of MarkRaymond I2C-problems CMStracker11 07 01.ppt...

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I2C investigations

- some reported problems from some APV users

- sensitivity to “termination” resistance

and power supply levels

- I2C scheme very simple, ought to be problem free

- so what’s going on?

Outline

probable cause of problems

measurements on I2C transactions on CCUM/hybrid

measurements of APV I2C drive strength

possible solutions

July, 2001 CMS Tracker Electronics 1

Mark Raymond

[email protected]

content here summarises e-mail exchanges between:

S.Marchioro, R.Hammarstron, V.Commichau, J.Mnich, J-D.Berst,

U.Goerlach, G.Hall, M.French, C.Ljuslin, C.Paillard, W.Karpinski.

I2C website

http://www.semiconductors.philips.com/i2c/

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I2C electrical scheme

APV

(slave)

R

I2C line

(SDA)

DRIVER

(master,

e.g. CCU)

out

inPull-up

resistor

C

(parasitic)out

DRIVER

0.25 µm CCU directly in CMS. VI2C in lab. CCU module for hybrid presently.

LEVEL SHIFTER

Not needed in CMS. Incorporated in CCUM. Various solutions possible.

in5V 2.5V

LEVEL

SHIFTER

hysteresis

July, 2001 CMS Tracker Electronics 2

Not needed in CMS. Incorporated in CCUM. Various solutions possible.

I2C line

RC should be small cf I2C clock period (10µs). C will be layout dependent.

APV (MUXPLL)

hysteresis characteristic gives noise immunity

input has to be pulled below lower threshold for APV to correctly recognise data

What’s going wrong?

Suspect problem arises due to output drive capability of level shifter stages

combined with small values of pull-up resistor R.

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Level shifter circuitsOpto-isolated level shifter (simplified schematic)

used in APV test setup in IC lab

DRIVER

SDA

APV

SDA

isolation

barrier5V side 2.5V side

*

*

*Diodes used to implement bi-directionality

use low forward drop devices (Schottky) but still ~ 0.25V or more if Rpullup small

Rpullup

Rpullup

July, 2001 CMS Tracker Electronics 3

*use low forward drop devices (Schottky) but still ~ 0.25V or more if Rpullup small

If SDA not pulled low enough to trip APV I/P hysteresis threshold then APV

will fail to recognise its own address and I2C transaction will fail

CCU module/hybrid system

Level shifting is implemented using MOSFET on CCU module

Copes better with low values of Rpullup, but ON resistance still exists

5V 2.5V

SDA

CCU side

SDA

APV side

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I2C measurements on the IC APV test setup

APV

acknowledges

own address

2.50

2.00

1.50

1.00

0.50

0.00

Vo

lts SCK, pull-up = 10k

2.50

2.00

1.50

1.00

0.50

0.00

Vo

lts SDA, pull-up = 10k

2.50

2.00

1.50

1.00

0.50

Vo

lts

SDA, pull-up = 1.5k

APV address 0100001

0 indicates

write cycle

0.25V

0.35V

July, 2001 CMS Tracker Electronics 4

APV fails to

decode own

address and so

doesn’t generate

acknowledge

I2C transaction fails on this setup if SDA line not pulled lower than ~ 0.35 Volts

0.00

2.50

2.00

1.50

1.00

0.50

0.00

Vo

lts

10 usec/division

SDA, pull-up = 1.3k

0.35V

>0.35V

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Measurements on the CCU module/hybrid setup

APV

acknowledges

own address

2.50

2.00

1.50

1.00

0.50

0.00

Vo

lts SCK, pull-up = 1.5k

2.50

2.00

1.50

1.00

0.50

0.00

Vo

lts SDA, pull-up = 1.5k

2.50

2.00

1.50

1.00

0.50

Vo

lts SDA, pull-up = 500Ω

0.25V

0.35V

APV address 0100001

‘0’ indicates

write cycle

July, 2001 CMS Tracker Electronics 5

APV fails to

decode own

address and so

doesn’t generate

acknowledge

I2C transaction fails at pull-down voltage > ~ 0.35V

corresponding to pull-up resistance of

375Ω = 1.5k // 500Ω

(1.5k is built in resistance on CCU module)

0.50

0.00

2.50

2.00

1.50

1.00

0.50

0.00

Vo

lts

10 usec/division

SDA, pull-up = 375Ω

0.35V

>0.35V

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APV25 I2C drive strength

How low can APV pull SDA line for a given pull-up resistor value?

Use strong driver circuit (so that APV can always respond to I2C transaction)

and use different values of Rpullup, measuring how low APV can pull SDA

during Acknowledge cycle.

700

600

500

400

300

Vd

iff

[mV

]

2.50

2.00

1.50

1.00

0.50

0.00V

olt

s10 usec/division

Vdiff

APV

ACK

bitwrite

bit

address

bit

July, 2001 CMS Tracker Electronics 6

300

200

100

0

Vd

iff

[mV

]

1002 3 4 5 6 7 8 9

10002 3 4 5

SDA pull-up resistor value [Ω]

e.g. for Rpullup = 500Ω APV can pull SDA line down to within 200mV of VSS (0V)

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CCUM FEH

OH

? ?

?

Pull-up resistor/s (where and what value?)

Seems as though ought to be trivial, but of course isn’t quite

In final system 0.25um CCU master talks directly to 0.25um APV/MUXPLL/LD slaves

no level shifting required => problems go away

Interim situation

July, 2001 CMS Tracker Electronics 7

Interim situation

present CCUM, test systems incorporate level shifting stages

will want to test hybrids (FEH,OH) in isolation, and together, on different test beds

e.g.

assume worst case cable capacitance ~100pF (reasonable?)

for RC < 1µs (CR < 5τ, τ=5µsec) => R ~ 10k

Could split 10k between FEH and OH (20k on each)

May need different variants depending

on location in detector

C~cable capacitance

R=pull-up resistor

SCK

SDA

5 µs

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CCUM FEH

OH

Put pull-up here only

(~few kΩ)

Pull-up resistor (where and what value?)

Alternatively

Leave these resistors out altogether

(or make large)

July, 2001 CMS Tracker Electronics 8

Shouldn’t confuse pull-up with termination

Present choice of resistor on CCUM (1.5k) will probably work in all cases

Components on FEH and OH can be finalised now

Suggestion only – others will want to comment

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Conclusions

I2C problems experienced probably due to level shifter circuits

coupled with low values of pull-up resistor

Should be no problems in all 0.25µm final system

Suggested solution

put large pull-up resistor values on FEH and OH (~20k say)

(will, in any case, be dominated by 1.5k on present CCUM)

if necessary (large bus capacitance) put smaller value on CCUM

July, 2001 CMS Tracker Electronics 9

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Other matters

APV25s1 biasing

- manual needs update, I2C values correct for APV25s0, not s1

Recommended bias settings. Because of current mirroring change

between s0 and s1 versions the numbers in the manual must change

(approx 70% of s0 values).

External bias at 128 µµµµA, power supplies = 0, 1.25V, 2.5V

IPRE 85

IPCASC 45

IPSF 30

ISHA ~30 (tune for optimum pulse rise time)

ISSF 30

IPSP 48

July, 2001 CMS Tracker Electronics 10

IPSP 48

IMUXIN 30

VFP ~30 (preamp fall time - can be higher but depends on occupancy)

VFS ~60 (tune for optimum pulse fall time)

Pulse shape tuning (rough guide):

As detector capacitance increases ISHA needs to increase

VFS needs to be reduced

For capacitances in the range 0 -> 20 pF:

ISHA in range 20 -> 65,

VFS in range 65 -> 50

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APV25s1 biasing

Internal biasing

dependence on value of on-chip resistor

testing so far => 15 % increase of all I2C current settings

(w.r.t. external (128µA) values)

i.e. external (128µA) internal

IPRE 85 98

IPCASC 45 52

IPSF 30 34

ISHA ~30 ~34

ISSF 30 34

IPSP 48 55

IMUXIN 30 34

=> values in “internal” column should be used for the hybrid (for now)

July, 2001 CMS Tracker Electronics 11

Need to find a strategy for choosing I2C bias current settings

Internal Iref will depend on local power supply values,

and on internal resistor value (+/-10%)

Can probably be managed by correction factor applied to all

values (as above) to achieve “correct” power consumption

Something to look at in system test?

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APV25s1 biasing

ICAL I2C register setting

determines magnitude of calibration step applied to capacitors

feeding preamp inputs

actual value of charge injected will depend on:

reference current value (external/internal(on-chip resistor value))

I/V resistor value in bias generator

very small charge injection capacitors

⇒can be used to calibrate (tune) pulse shape, but not for accurate

gain measurement

rough value to get 1 mip signal

APV25s0 APV25s1 APV25s1

external, 128µA external, 128µA internal

July, 2001 CMS Tracker Electronics 12

~ 40 ~ 25 ~ 29

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APV performance dependence on LV power supplies

Currently under study, no show-stopping discoveries, but some aspects of performance

affected (mainly dynamic range identified so far)

Pictures show peak mode pulse

shapes for signals from

-2 to +6 mips in 0.5 mip steps

gain change minimal but

loss of headroom in –10% case

assumptions so far:

2.7 V not exceeded

power differences symmetrical

on both rails

I2C current settings tuned to

get same analogue current for

400

300

200

100

0

-100

nominal(0, 1.25V, 2.5V)

400

300

200

100

0

AD

C u

nit

s+8% (0, 1.35V, 2.7V)

July, 2001 CMS Tracker Electronics 13

get same analogue current for

different PSU voltages-100

400

300

200

100

0

-100

200150100500

time [nsec]

-10% (0, 1.125V, 2.25V)

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APV performance dependence on LV power supplies

500

400

300

200

100

0

AD

C u

nit

s

6543210-1-2

- 10% (0, 1.125V, 2.25V)

nominal (0,1.25V, 2.5V)

+8% (0, 1.35V, 2.7V)

July, 2001 CMS Tracker Electronics 14

6543210-1-2

signal [Mips]