Macroscopic property measurements to assess the degree of domain switching
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Time-resolved structure-property relationships in piezoelectric ceramics Jacob L. Jones (University of Florida), DMR 0746902 The primary goal of this CAREER program is to establish a new research and education framework in which to probe the relationship between microscale and nanoscale structural mechanisms and macroscopic properties in the time domain. Thus far, this has involved: Macroscopic piezoelectric (d 33 ) measurements of La- PZT as a function of Zr:Ti ratio and electric field amplitude. 0 200 400 600 800 1000 0 200 400 600 800 d 33 (pm /V) E le ctric F ie ld (V /mm) d 33 = 461.47 + 0.43E 0 pm/V PLZT5248 PLZT6040 d 33 = 207.26 + 0.36E 0 pm/V PLZT4060 d 33 = 103.28 + 0.07E 0 pm/V Macroscopic property measurements to assess the degree of domain switching Fracture surface of La-doped PZT with Zr:Ti of 60:40. The marker is 5 μm wide. Synthesis of Pb(Zr,Ti)O 3 -based ceramics with various dopants and Zr:Ti ratios Time-resolved X-ray diffraction during application of dynamic electric fields to measure domain switching directly Crystallographic changes as a function of time during application of an electric field. Data collected on a time-resolved laboratory diffractometer.
description
Time-resolved X-ray diffraction during application of dynamic electric fields to measure domain switching directly. Synthesis of Pb(Zr,Ti)O 3 -based ceramics with various dopants and Zr:Ti ratios. Fracture surface of La-doped PZT with Zr:Ti of 60:40. The marker is 5 μm wide. - PowerPoint PPT Presentation
Transcript of Macroscopic property measurements to assess the degree of domain switching
Time-resolved structure-property relationships in piezoelectric ceramics
Jacob L. Jones (University of Florida), DMR 0746902
The primary goal of this CAREER program is to establish a new research and education framework in which to probe the relationship between microscale and nanoscale structural mechanisms and macroscopic properties in the time domain. Thus far, this has involved:
Macroscopic piezoelectric (d33) measurements of La-PZT as a function of Zr:Ti ratio and electric field amplitude.
0 200 400 600 800 10000
200
400
600
800
d 33 (
pm/V
)
Electric Field (V/mm)
d33= 461.47 + 0.43E0 pm/V
PLZT5248
PLZT6040d33= 207.26 + 0.36E
0 pm/V
PLZT4060d33= 103.28 + 0.07E
0 pm/V
Macroscopic property measurements to assess the degree of domain switching
Fracture surface of La-doped PZT with Zr:Ti of 60:40. The marker is 5 μm wide.
Synthesis of Pb(Zr,Ti)O3-based ceramics with various dopants and Zr:Ti ratios
Time-resolved X-ray diffraction during application of dynamic electric fields to
measure domain switching directly
Crystallographic changes as a function of time during application of an electric field. Data collected on a time-resolved laboratory diffractometer.
Time-resolved structure-property relationships in piezoelectric ceramics
Jacob L. Jones (University of Florida), DMR 0746902
PbPtx
PLZT perovskite
Fluorite
PLZT perovskite
Ptbottom electrodeAmorphous
film
PbPtx
PLZT perovskite
Fluorite
PLZT perovskite
Ptbottom electrodeAmorphous
film
A collaboration with Sandia National Laboratories using the new diffractometer reveals the sequence of crystallization in PLZT thin films as a function of time and temperature in situ.
Screenshot of graphical user interface illustrating the
directional-dependence of the piezoelectric effect in a
PbNb2O6 crystal.
A visualization program for 3rd-rank tensors was written and presented at the International Symposium on Applications of Ferroelectrics (ISAF). It is available for free on the PI’s website.
A student preparing time-resolved X-ray diffraction measurements at the European Synchrotron Radiation Facility (ESRF).
A major component of this project involves the development and utilization of a local time-resolved X-ray diffractometer as well as the use of synchrotron diffraction facilities. The time-resolved laboratory diffractometer has been commissioned and we have started working with international collaborators.
Components of the in-house
laboratory diffractometer
for research and education.
