Lifecycle analytics for reliable electronics€¦ · Lifecycle analytics for reliable electronics...

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Lifecycle analytics for reliable electronics Uzi Baruch, GM & VP Automotive & Electronics Solution for automotive electronics Month 2019

Transcript of Lifecycle analytics for reliable electronics€¦ · Lifecycle analytics for reliable electronics...

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Lifecycle analytics for reliable electronics

Uzi Baruch, GM & VP Automotive & Electronics

Solution for automotive electronics

Month 2019

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© OptimalPlus 2019. All rights reserved.

It’s a changed worldTechnological innovation has transformed our lives.

Products and devices are more intelligent and connected.

These products rely on thousands of electronic components.

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Electronics reliability is criticalComponents must be more reliable than ever before.

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Automotive innovation exemplifies the challenge

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© OptimalPlus 2019. All rights reserved. 51) Automotive change drivers for the next Decade, EY, 20162) BMW - AEC Automotive electronics reliability workshop, 20173) NHTSA Recall Data4) Audi, DVCon Munich, 2017

Automotive innovation reliability challenge

90%

22%

3x

car innovations & new features are driven by electronics1

warranty costs related to electronics & semiconductors2

car recall increase from 2014-2016 due to electronics3

15x Drive per day4: 1.5hr traditional car vs.22.5hr autonomous car

1 car failure

every hour4

Reliable electronics is a must

Audi says

$10Bn50Bn cars

Toyota’s gas pedals recallFord’s failure-to-park recallTakata’s air bag recall

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Growth of electronics creates safety and reliability challenges

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of car innovations and new features are driven by electronics90%

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Just ask Audi

7Source: Audi, DVCon Munich, 2017

7,000 4,000 1 dppm

1 carfailure

an hour

semiconductor devices per car

cars each day

failure rate

x x

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Recall

400,000 Jeep, Chrysler and Dodge cars recalled in 2017 due to electrical component failure

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Growth of electronics creates safety and reliability challenges

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car recall increasefrom 2014-2016 due to electronics

3X

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Growth of electronics creates reliability challenges

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New cars < 3yrs are significantly prone to recalls

x3.5 Total car recallsdue to electronic components

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Growth of electronics creates safety and reliability challenges

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of warranty costs are related to electronics and semiconductors22%

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Growth of electronics creates reliability challenges

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Majority of semiconductor fails within warranty period

Warranty share of electronics 0 to 24 months

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…only synergy enables new potentials“

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Autonomous cars will only intensify the reliability issue

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1.5 hrs/day traditional car drives

22.5 hrs/day autonomous car drives

vs

Our electronics need to get much more reliable

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Supply chain shift from value “pyramid” to “hub and spoke”

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Autonomous driving will disrupt the automotive industry…

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Our roleWe deliver unprecedented manufacturing efficiency and reliability to the Automotive, Semiconductor and Electronics supply chains.

We provide actionable insights through unique data analytics to prevent bad products from reaching the market.

We call it lifecycle analytics

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Lifecycle analytics – Following the product journey

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Chip Board Product In use ReturnsECU modules

Machine • Process • Test • Rework • Genealogy • Performance • Reliability • Usage • Warranty

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Analyzing huge volumes of data

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100bn+devices per year

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Our expertise

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Semiconductor Automotive Electronics Consumer Electronics & Computing

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Significant business impact

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Reliability50% case avoidance

Efficiencyup to 25% cost savings

Yieldincrease up to 10% NPI2% HVM

Speedfrom weeks to days NPI, TTM, RCA

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We help our clients transform data into automated actions

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Collect Detect Act

• Data harmonization

• Product, machine and process data

• Prescriptive analytics

• AI / Machine learning

• 24x7 analytics engine

• Real-time

• Automatic

• Distributed

• Controlled

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Accelerating innovation

Open platform synergetic with any big data strategyMachine learning | Artificial intelligence | Prescriptive analytics

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Trusted by leading brands

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Customers

Supply chain

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Supply chain visibility + Lifecycle analytics = Reliable electronics

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Thank you

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Use cases

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Use Case #1: Process to inspection yield

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Input: Welding process parameters

Output: SAM inspection yieldEV inverter

• Quality Index is computed based on process parameters data and correlated to inspection yield

• Monitoring and controlling the uniformity of the process contributes to the overall quality of the product

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Use Case #2: PCB functional test final assembly

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Instrument cluster• Homogeneity Quality

Index of functional test data is correlated to the yield of the final assembly

• The yield is strongly dependent on the accumulated variation of the upstream process steps parametric measurements

Input: Functional test parameters

Output: Assembly yield

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Use Case #3: Process to assembly yield (ADAS)

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• Lens modulation transfer parameters are measured during the stacking assembly process.

• Overall 17 curves are obtained, each at 12 different spatial frequencies (overall >200 values are produced for each of the 2 lenses).

• The final product undergoes testing at system level

Lens assembly

Spatial frequency ContrastLens 1

cmos sensor cmos sensor

Lens 2

FPGA

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Use Case #4: Process to assembly yield (ADAS)

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• Homogeneity Quality Index of lens assembly data is correlated to the yield of the final assembly testing.

• The yield is strongly dependent on the accumulated variation of the upstream process steps parametric measurements

Input: Lens optical parameters

Output: Final lens assembly yield

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Use case #4: Improve tier-1 quality & supplier yield (Win-Win)

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With visibility

Tier-1

Chip supplier

σσ

Outlier detection with tighter control limits on

the 10 tests

Without visibility

No information shared with

OCM

“Blind” outlier detection on 100 tests

σσσσσ

Outlier detection only on 10 tests

σσ

Supplier yield loss:

Tier-1 yield loss:

Tier-1 quality:

0.4%

1.0%

10 DPPM

0.5%

0.5%

1 DPPM

0.7%

1.0%

10 DPPM

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Appendix

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© OptimalPlus 2019. All rights reserved. 33

Global company

Founded in2005

Employees250+

HQ and R&DIsrael

Sales and supportUSA | EMEA | APAC

Market leader in lifecycle analytics

Transforming product manufacturing data

Providing end-to-end supply chain visibility

with domain expertise in electronics supply chain

into intelligent actions in real-time

for best reliability, efficiency and fastest TTM

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Cloud or on-prem.

O+ central analytics24x7 rule execution & orchestration

O+ data platformCentral repository

Central

System architecture – Automotive & Electronics – generic

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Factory C

Edge (factory floors)

Factory B

Factory A (internal or outsourced)

Actionable insights across all mfg. lines and facilities

Portal+PLM, ERP, CRMMES

Act

ion

Act

ion

Dat

a

Act

ion/

Rul

esD

ata

Dat

aD

ata

O+ edge analytics24x7 rule execution & orchestration

O+ data platformEdge repository

Data

Data

Action/RulesData

Release to

factory

Work activity

Other equipment & data sources

3rd party incoming material

Process activity

Verify Work activity

Final verify

O+ agent

Data

Assy.

Work Verify

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Cloud or on-prem.

O+ central analytics24x7 rule execution & orchestration

O+ data platformCentral repository

Central

System architecture – Automotive & Electronics – SMT example

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Factory C

Edge (factory floors)

Factory B

Factory A (internal or outsourced)

Actionable insights across all mfg. lines and facilities

Portal+PLM, ERP, CRMMES

Act

ion

Act

ion

Dat

a

Act

ion/

Rul

esD

ata

Dat

aD

ata

O+ edge analytics24x7 rule execution & orchestration

O+ data platformEdge repository

Data

Data

Action/RulesData

Screen printer

SPI

Other equipment & data sources

3rd party incoming material

Pick & place

Reflow oven

AOI/AXI

FT

O+ agent

Data

ICT

Work Verify

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System architecture – Automotive & Electronics – single factory

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Single factory

Actionable insights across all mfg. lines and facilities

MES

Act

ion

Act

ion

Dat

a

O+ central/edge analytics24x7 rule execution & orchestration

O+ data platformSingle repository

Data

Data

Release to

factory

Work activity

Other equipment & data sources

3rd party incoming material

Process activity

Verify Work activity

Final verify

O+ agent

Data

Assy.

Work Verify

PLM, ERP, CRM

Act

ion

Dat

a

Portal+

Act

ion

Dat

a

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Solutions for electronics verticals

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OptimalPlus BI

Vertical’s solutions

Data analytics open platform

Sup

port

& S

ervi

ces

Sec

urity

Automotive Electronics Solutions

Safety & Reliability

Suite

Productivity & YieldSuite

RampSuite

Consumer Elect. and Computing Solutions

Quality Suite

Productivity & YieldSuite

RampSuite

Semiconductor Solutions

Quality Suite

Productivity & YieldSuite

RampSuite

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Column store databaseMetadata index +“Hot” cacheSQL over Hadoop

Optimal+ data pipelinePortal+ desktop & web UI

Analytics engine & API

Data pipeline

Optimal+ platform

Customer data lake

IBM Streams

Customer platform

(public, private, hybrid)Cloud

Customer data

OptimalPlus and 3rd party big data platform synergy

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Synergetic with any big data strategy

Connect to existing infrastructure

Open for all kinds of data

Accelerate innovation

Optimized“Manufacturing”data

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We collect and harmonize data

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Data harmonization

Time series

Parametric measurements

Bin/Error code data

Any data granularity

Any data source

PCBA machines

Field failures

Pass/Fail data OptimalPlus parser

Unified schema

Inspection tools

Rework

MES, WMS, QMS…

Test

Streaming • Host PC • PLC • DB • Manual data

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DNA based analytics

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Generate product DNA Advanced analytics and machine learning

Advanced solutions

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Homogeneity – Improving product performance

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ECU ADAS

EV inverter Instrument cluster

Process variability reduction = Better control Automatically leads to quality (& yield) improvement

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Turning data into actions

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Action categories

Equipment actions

•• Pause

•• Engineering tool Alert

Process actions

•• Put materials on hold

•• Re-binning

Recipe adjustment

•• Re-test skip/add

•• Adaptive testing

Data augmentation

•• Feed-forward

•• Feed-backward

•• Virtual operation

Alerts

•• Quality outlier alerts

•• Yield alerts

•• Predictive/Anomaly alerts

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Diagram editable – DO NOT DELETE, KEEP IN HIDE

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22%Electric/Electronic

100%Annual

warranty costs

23%Active & passive

components

7% ESD/EOS

23%Active & passive

components

77%Semiconductors

77%Semiconductor

24% Test Coverage

48% Systematic

failures

15% Random failures

6%*

* Re-tested without observed failures

Failure pareto

24% Front-end

41% Final test

22% Design

12% AssemblyS

emic

ondu

ctor

failu

re m

echa

nism

s

22%E/E – ECUwarranty

costs