Independent Studies with Industry Partnership John Cohn (Sr. Engineer, IBM) Joanna Ellis Monaghan...

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Independent Studies with Industry Partnership John Cohn (Sr. Engineer, IBM) Joanna Ellis Monaghan (Math, St. Michael’s College)* Dan Nardi (Student, University of Vermont) Robert Snapp (CS, University of Vermont)

Transcript of Independent Studies with Industry Partnership John Cohn (Sr. Engineer, IBM) Joanna Ellis Monaghan...

Independent Studies withIndustry Partnership

John Cohn (Sr. Engineer, IBM) Joanna Ellis Monaghan (Math, St. Michael’s College)*Dan Nardi (Student, University of Vermont)Robert Snapp (CS, University of Vermont)

Goal To solicit industry applications that

provide rewarding independent study projects for both undergraduate and graduate students.

Make Contact Identify area industries. Start with community outreach person,

get in touch with a manager (keep trying until you get someone who seems interested)

emphasize potential benefit to the company

describe similar endeavors (for us, ground work was laid by very successful bio-informatics collaboration)

Have a forum A mechanism for facilitating the

building of individual relationships (for us, the “applied” combinatorics seminar).

Solicit problems Give industry presenters an

audience of potential collaborators, particularly faculty who can see the potential in the problems and then share them with students.

Select areas Combinatorics Operations Research Statistics Dynamical Systems Computer Science Biology Physics

(interdisciplinary as well as academic/industry collaboration)

Involving students These projects are generally very appealing to students

Not busywork--someone actually cares about the results.

Good for work experience and resume building. Potential source of non-academic letter of

reference. Summer job/co-op/permanent employment

potential

Find Funding Lots of potential,

(but no action yet….)

A Current Independent Study Goal of this project is to check a

chip’s design and find all occurrences of a simple pattern

Can be used to: Find possible error spots Check for already patented segments Locate particular devices

The Haystack Sample layout of a chip

(includes multiple layers)

The Needle in the Haystack Sample pattern we might look for

The Input The data to explain these patterns

comes in the following format (.gul)

BEGIN /* GULP2A CALLED ON THU FEB 21 15:08:23 2002 */EQUIV 1 1000 MICRON +X,+YMSGPER -1000000 -1000000 1000000 1000000 0 0HEADER GYMGL1 'OUTPUT 2002/02/21/14/47/12/cohn'LEVEL PCLEVEL RXCNAME ULTCB8AD

CELL ULTCB8AD PRIME PGON N RX 1467923 780300 1468180 780300 1468180 780600 + 1469020 780600 1469020 780300 1469181 780300 1469181 + 781710 1469020 781710 1469020 781400 1468180 781400 + 1468180 781710 1467923 781710 PGON N PC 1468500 782100 1468300 782100 1468300 781700 + 1468260 781700 1468260 780300 1468500 780300 1468500 + 780500 1468380 780500 1468380 781500 1468500 781500 RECT N PC 1467800 780345 1503 298ENDMSG

Sub-Graph Overlay Problem

Two different layers/rectangles are combined into onelayer that contains three shapes; one rectangle (purple)and two polygons (red and blue)

Overlay Visualization

Data represented visually after the algorithm is run.

After the Overlay Algorithm is runthere are no overlapping shapes.Each distinct shape is represented by a polygon with 4 or more sides.

Algorithms is cutting edge, and not currently used for this application in industry