IMC 2014ZEISS Microscopy Conference Program

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Your FIB-SEM for Nanotomography and Nanofabrication

• Highest Throughput: Analyze larger volumes in better resolution• Highest 3D Resolution: Thinnest homogenous slice thicknesses• Maximum Information: Unique detector contrast and

widest analytical application range

ZEISS Crossbeam 540 New

Column Cross-section ZEISS FIB-SEM

Field lens

Electromagnetic aperture changer

Magnetic lens

Electrostatic lensBSE detector

Brightfield STEM detector

Darkfield STEM detector

Annular SE detector Beam booster

FIB column

Everhart-Thornley detector SE imaging

in HV mode

Specimen

Annular BSE detector

1 µm

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Revolutionize Your Confocal Imaging

• Your powerful combination for fast linear scanning • Perform productive quantitative imaging • Highest signal to noise, speed and superresolution

ZEISS LSM 880 with AiryscanNew

Beam path of ZEISS LSM 880 with Airyscan

1. Excitation laser lines2. Twin Gate main beam splitters3. Galvo scanning mirrors4. Objective5. Pinhole and pinhole optics

6. Secondary beam splitters7. Recycling loop8. Quasar detection unit9. Emission fi lters10. Zoom optics11. Airyscan detector

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2 µm

Confocal Airyscan

Courtesy of S. Traikov, BIOTEC, TU Dresden, Germany

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Your Solution to Seamlessly Correlate Your Samples across

Platforms in 3D

• Learn about FIB-SEM and X-ray workflows• Investigate your samples with light and electron microscopy to investigate both structure and function• Profit from using identical software on different microscopes

ZEISS 3D Correlative Workflows

Learn more about our new Atlas. Profit from a universal data acquisition engine combined with a correlative workspace. It enables fusion of data across ZEISS microscopes, multiple imaging modalities and length scales in 3D. Enjoy Atlas‘ unique capabilities to seamlessly link different technologies such as light, electron and X-ray microscopy.

20 µm

100 µm

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Your FE-SEM with Analytical Power

for the Sub-nanometer World

• Get optimum results, fast and straightforward with proven GEMINI technology

• Analyze your samples comprehensively: acquire compo- sitional, topographical & crystalline information in parallel

• Image and analyze even nonconductive samples reliably with local charge compensation

• Let ZEISS MERLIN grow with your needs: upgrade your instrument with leading edge technology, e.g. AFM, 3View

ZEISS MERLIN

Your 3D X-ray Microscopes for High Resolution

X-ray Microscopy

Image your samples with state-of-the-art technology• Non-destructively in 3D • At highest resolution• With highest contrast

Investigate a wide range of samples

• Look into volumes from cubic centimeters to cubic micrometers

• Study in situ environments• Experiment with 4D materials evolution• Navigate & correlate with ZEISS FIB-SEMs

2 µm 2 µm

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Your Automated Digital Microscope for Routine and

Failure Analyses

ZEISS Smartzoom 5 New

Your Zoom Microscope for Large Fields

ZEISS Axio Zoom.V16

• Combine high resolution with an excellent zoom range• Get superior fl uorescence brightness in large object fi elds thanks to a very high aperture• Capture images more effi ciently and speed up your quantitative analyses thanks to large tile sizes and automated stitching

• Smart Design: choose between different objectives and profi t from the integrated LED ring light

• Smart Workfl ow: Orientation made simple, workfl ow stored away neatly, results presented easily

• Smart Output: View surface structures with the microscope’s swing arm from continuously adjustable angles between -45° and +45°

2000 µm

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On Monday, Tuesday, and Wednesday, September 8 – 10,

join us for lunch at our lunch workshops and learn from our

microscopy experts about the newest advances in FIB–SEM

tomography, confocal imaging, and correlative microscopy.

Places are limited!

Join us for Lunch while you Learn from our Experts

Monday, September 8, 2014 (Room: North Hall)

Advanced nanotomography for a more extensive

understanding of materials

Presented by: Ingo Schulmeyer | ZEISS Microscopy

3D imaging and analytics allow an extensive characterization

of a sample‘s volume. It is widely used in materials and

life sciences and allows better understanding of compound

materials, brain tissues, electronic devices and other samples.

We will demonstrate, how ZEISS Crossbeam allows to

analyze larger volumes in better resolution and quality in a

shorter time. Moreover, we will show a workflow how the

information obtained on the Crossbeam can be correlated

with other imaging technologies to get the maximum

information on any sample.

Tuesday, September 9, 2014 (Room: Meeting Hall V.)

Revolutionize your confocal imaging with

ZEISS LSM 880 and Airyscan

Presented by: Richard Ankerhold | ZEISS Microscopy

Learn about a new confocal technology that provides you with

high sensitivity, improved resolution in x, y and z, and high

speed. With ZEISS LSM 880 and Airyscan you will be able to

go beyond the resolution limits of a confocal laser scanning

microscope without sacrificing on sensitivity and speed.

Wednesday, September 10, 2014 (Room: North Hall)

Correlating multi-modality microscopy and tomography

across space and time

Presented by: Arno P. Merkle | ZEISS Microscopy

Characterization of matter across a variety of length scales

from 10’s of μm to sub–10 nm resolution is essential for the

areas of materials research, natural resources and life sciences.

Furthermore, a multitude of modalities, including structural,

chemical and crystallographic information at these scales can

illuminate the properties of the macroscopic system under

study. Lastly, the capability to explore multiple dimensions,

from 2D to 3D (destructively or non–destructively) to 4D (3D

+ time) have become regular endeavors for the microscopist.

This lunch and learn will explore ways in which multiple

dimensions, length–scales and modalities are being used to

solve characterization challenges in materials research, life

sciences and natural resources, including light, electron, ion

and X–ray microscopy approaches. Going a step further, we

will describe how ZEISS is playing a key role in the emergence

of such correlative workflows, and establishing common

platforms for data handling, visualization, ROI navigation and

beyond.

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ZEISS Contributed Talks and Posters

Oral Presentation (Chamber Hall)Instrumentation and Techniques September 10, 2014, 2:15 pm – 4:15 pm

Diffraction Contrast Tomography as an Additional Charac-terization Modality on a 3D Laboratory X–ray Microscope (IT-15-O-2550)Presented by: Michael Feser | ZEISS Microscopy

Poster Presentations Instrumentation and Techniques September 10, 2014, 4:45 pm – 6:45 pm September 11, 2014, 4:30 pm – 6:30 pm

Energy Low Loss Backscattered Electrons Imaging in Material Characterization and Analysis (IT-4-P-1467)Presented by: Xiong Liu | ZEISS Microscopy

Energy Filtered Imaging in a Scanning Electron Microscope (IT-4-P-6044)Presented by: Markus Boese | ZEISS Microscopy

Enabling Future Nanotomography and Nanofabrication with Crossbeam Technology (IT-13-P-2590)Presented by: Ingo Schulmeyer | ZEISS Microscopy

Poster Presentations Interdisciplinary September 8, 2014, 5 pm – 7 pm September 9, 2014, 4:30 pm – 6:30 pm

Comprehensive Nanofabrication by Correlating Crossbeam and ORION Nanofab (ID-1-P-2591)Presented by: Ingo Schulmeyer | ZEISS Microscopy

Illuminating Correlative Research using Light, X-ray and Electron Microscopy (ID-1-P-2908)Presented by: Arno Merkle | ZEISS Microscopy

Correlative Light and Electron Microscopy – On the Way from 2D towards 3D (ID-1-P-3247)Presented by: Christina Berger | ZEISS Microscopy

Correlative Automated Particle Analysis – A New Way to Link Light Microscopy and Scanning Electron Microscopy/EDX in an Automated Workflow (ID-1-P-6023)Presented by: Christina Berger | ZEISS Microscopy

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Join our ZEISS Health Run on Tuesday, September 9, 2014!

The 1st ZEISS Health Run will take place at Vysehrad close to the Prague Congress Center (congress venue).

The length of the run will be 4 km. The run starts at 7:30 am. The meeting point is in front of the Prague Congress Centre at entrance no. 5 at 7:00 am.

Please register online: http://www.zeiss.com/health-run

ZEISS Health Run and Conference Party

ZEISS Health Run Tuesday, 9 September 2014

ZEISS Conference Party, IMC 2014 Prague

Join us for an evening of fun and friendship during IMC 2014. Enjoy music, dinner and drinks at the famousStaropramen Brewery while networking with colleagues and your ZEISS Team.

Location: Potrefená husa Hybernská Staropramen Brewery Dláždená 1003/7 110 00 Praha 1

Date: September 10, 2014Time: 7:00 pm – 12:00 am

By invitation only. Please ask for a ticket at our information desk at booth #5.

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Whether you’re looking to explore today’s modern microscopy

portfolio, learn more about the instruments you’re currently

using, or wish to share your questions and ideas with

the microscopy community, we hope to meet you at

ZEISS Microscopy Labs.

Choose the most suitable technology for your application ZEISS Microscopy Labs are designed to serve our customers with our most state-of-the-art light, electron/ion and X-ray microscopes available for you to choose the most suitable technology for your application. Experience our products and our people in order for you to know without a doubt that we are the right partner for your microscopy needs.

ZEISS Microscopy Labs Germany

From sample preparation to result: your one-stop microscopy lab

ZEISS Microscopy Labs in Munich assist you in every step of your research, from perfect sample preparation in the lab and our advanced imaging solutions up to analysis and evaluation of your data. Besides imaging analysis we also offer our services and experience in molecular sample analysis for laser micro- dissection as well as sample analysis for electron microscopes.Additionally, we organise conferences and microscopy work-shops on a regular basis and stay in close contact with renow-ned academic microscopy experts and core facilities.

Location: ZEISS Microscopy Labs Munich Kistlerhofstrasse 75 81379 Munich Germany

ZEISS Microscopy Labs in Oberkochen is an excellence center for microscopy with special focus on eletron, ion and X-ray microsocopy. We enable you to get the best out of your samples, your applications, and your instrument – prior and after the acquisition of your ZEISS equipment.

Location: Carl Zeiss Microscopy GmbH Carl-Zeiss-Str. 56 73447 Oberkochen Germany

More information about ZEISS Microscopy Labs:www.zeiss.com/labs

Carl Zeiss Microscopy GmbH07745 Jena, Germany

microscopy@zeiss.comwww.zeiss.com/microscopy