Heat Removal of a Protection Chip after Surge Pulse · elements are now integrated in a single ASIC...
Transcript of Heat Removal of a Protection Chip after Surge Pulse · elements are now integrated in a single ASIC...
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Heat Removal of a Protection Chip after Surge Pulse
Tom Graf
Hochschule Luzern T&A
Technikumstrasse 21
CH-6048 Horw
Switzerland
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Abstract
• EMC protection elements experienced significant heating after surge impulses (253 W).
• The thermal behavior of the protection elements was modeled with the method of finite elements (FEM). COMSOL Multiphysics Heat Transfer Module
• The FEM results led to a compact model to allow for design and simulation with simpler tools.
• The company HMT used our results for a new series of protection elements. Sensor circuit and protection elements are now integrated in a single ASIC design.
P
Tc k T Q
tEquation solved:
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FEM
Test Chip 30 FEM model and ASIC design of a test chip of Zener protection elements. Heat is dissipated in the "Zener-A-bands".
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0
50
100
150
200
250
300
0.00001 0.0001 0.001 0.01time (s)
po
we
r (W
)
253 W p
ow
er
(W)
10 s 100 s 1 ms 10 ms time
Spice simulation of surge pulse ISO 7637-2 (Automotive: 24 V, 240 mJ)
Surge Pulse
ISO 7637-2 dissipates most heat of all studied standards
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Model Data
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Surface Temperature
Pin = 253W • no scribe line
• no bond wires
• air and radiation included
• bond pads included
Extremely large steady state temperatures are reached !
1115°C
Si
Cu
air loss:
Tground = 20°C
epoxy
T (°C)
Pin = 253W, stationary
air surf ambP h A T T
Pair 0.03 W
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Radiation W/m2
radiative area:
A = 5.47×10−6 m2
Minor heat removal via air and radiation
Pin = 253W, stationary
4 4 rad B surf ambP A T Tradiation loss:
Prad 0.13 W
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Heat Channels
Tmax is governed by contact to base
stationary
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Epoxy Resistance
Decrease of contact resistance by a factor 10 reduces Tmax considerably !
stationary
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Ab Initio 1D-Model
FEM
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Test Chip 30
20
660
212
940
36
40
150
chip dimensions in m
ABC
20
Zener structure,
A,B,C Zener bands
FEM GDS
C
A B
protection element
"oval"
oxide boxes
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heat
p-n Heat
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Details of TC30 Zener structure, "oval"
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Layer Data
thermal conductivity of titanium ≈ 22W/(m∙K); layer sheet resistance Ω/ is that of not pure Al
sheet resistance of Al: ρ/d = 2.8×10−8/1×10−6 = 30 mΩ/
>95%
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Layer Structure
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detailed structure at chip corner,
coarse test chip model
... including three metal layers
BC: Tground = 20°C
Detailed Model
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PT2
0.3W
60 m
50 m PT1
0.03W
PT2 PT1
Heat Input
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T (°C)
Dissipation level
Coarse model
Detailed model
Active Layer Temp.
T (°C)
stationary
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Oxide Barrier
Oxide layers and trenches form thermal barriers !
T (°C) stationary
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Heat Step
20
40
60
80
100
120
140
160
9.0E-06 1.0E-05 1.1E-05 1.2E-05 1.3E-05 1.4E-05 1.5E-05 1.6E-05 1.7E-05
∆T/∆t 60°C/μs
PT1
10 μs 12 μs 14 μs
Very fast initial Temp. increase !
transient
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Compact Model Parameter Value Unit
P 253 W
TJ =TG +T1 +T2 +T3 1225 °C
T3 = PR3 48 K
R3 "oxide trench"
0.19 K / W
T2 = PR2 199 K
2 = R2 C2 1.810−5 s
C2 (fit) "active silicon"
2.310−5 J / K
R2 (fit) "buried oxide"
0.79 K / W
T1 = PR1 958 K
1 = R1 C1 4.210−3 s
C1 (fit) "die + epoxy"
1.110−3 J / K
R1 (fit) "die + epoxy"
3.79 K / W
1 1 2 2
1 2 31 1
t t
R C R CJ GT t T T e T e T
1 2 31 2 3
tot
T T TR R R R
P BC: TJ (t=) = 1225°C (FEM)
transient
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Validation Temperature evolution of the bulk silicon and the junction during a 2.0 A surge impulse-equivalent (triangular shape). Time axis is 50 s / div .
Note the high junction temperature of 153°C after mere 20 s and the ultra fast measurement !
transient
The mechanism of heat flux and temperature evolution of the test chip is essentially understood. Material and geometry data of similar chips allow for prediction of the temperature evolution prior to FEM simulations.
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Conclusions
Equation solved:
• The maximum temperature is governed by the die attach. Heat flux through bond-wires or by conduction or radiation to air is negligible.
• Oxide trenches in the active silicon layer and the buried oxide cause efficient thermal insulation.
• We were able to measure the initial temperature rise after a heat step emulating surge pulse ISO 7637-2: The junction temperature increases by 60 K / s .
• A compact model based on exponential fitting reproduces the temperature evolution of the FEM simulation accurately.
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Ab Initio Model To emulate the FEM results a Spice model was created. The model consists of the active chip layer (top) and the wafer handle (bottom).
Pin = 253W top layer b.o. wafer epoxy socket
Rth (K/W) 0.03 0.11 0.45 2.94 0.15
Cth (J/K) 6.1×10−5 0 1.3×10−3 0 2.3×10−3
R1 = 0.14 K/W C1 = 6.1E-05 J/K τ1 = 8.2E-06 s Tj1
R2 = 3.51 K/W C2 = 3.6E-03 J/K τ2 = 0.013 s Tj2 = 922 K Pv = 253 W
Two-layer model: Ab initio R and C
0
200
400
600
800
1000
1200
1400
1.E-06 1.E-05 1.E-04 1.E-03 1.E-02 1.E-01
FEM Tj2, ab initio spice model
T (°C)
t (s)
1 2
1
2
921
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2 au Excel Fit
The FEM thermal simulation (blue) can be fitted with two exponential functions (pink). The linear thermal equations should allow to predict the surge pulse behavior prior to FEM simulations.
parameters:
1 1 2 2
j1 v 1 j2 v 2
t tR C R C
j j1 j1 j2 j2 A
T P R , T P R
T (t) T T e T T e T
Boundary conditions (fixed parameters) were TA = 20°C, Tj, t=∞ = 1225°C (FEM) and Rtot = R1 + R2 = (Tj1 + Tj2)/Pv . The three fit parameters were R1, C1 and C2.
0
200
400
600
800
1000
1200
1400
1.E-06 1.E-05 1.E-04 1.E-03 1.E-02 1.E-01
EXCEL fit, 2 τau
FEM calculation
time (s)
C1 R1
C2 R2
Pv
Tj
TA
T (°C)
R1 = 0.92 K/W R2 3.85 K/W C1 = 9.0E-06 J/K C2 1.1E-03 J/K τ1 = 8.2E-06 s τ2 4.1E-03 s Tj1 = 231 K Tj2 973 K Pv = 253 W TA = 293K ≡ 20°C
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Seal Ring
20μm
10μm to Zener
250μm thick Si
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Layer Thickness
Metal 1, AlSiCu, 0.7μm
Buried Oxide, 0.5μm
Si Handle, 250μm, polished
Si, N-Well, 2μm
Oxide, 0.77(+0.53)μm
Oxide, 0.9μm
Oxide, 0.9μm
Metal 2, AlSiCu, 1μm
Metal 3, AlSiCu, 2μm
P-N Heat 0.5μm
surface ratio = oxid : via(M2-M1) = 4:1
surface ratio = oxid : via(M3-M2) none
surface ratio = oxid : via(M1-P) = 2:1
Roger Bostock:
Al ≈ 3×1μm
SiO2 ≈ 3×0.7μm
0.5μm
0
2.5μm
3.5μm
4.2μm
5.1μm
6.1μm
7.0μm
9.0μm
10.0μm
20.0μm
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Dimensions
Metall 1, 20
Cont, 19
Trench, 7
5.4μm
0.8μm
20.4μm
53.2μm
130μm
9.6μm
5.8μm
73μm
11.9μm
10.9μm
x,y = 3μm
s = 4.2μm
x,y = 9.6μm
s = 13.6μm
110μm
75μm
0.8μm 4μm
9.7μm
0.4μm
Surface area ratio =
oxid : via(M1-P) = 2:1
Area ratio = oxid : via(M2-M1) = 4:1
Area ratio = oxid : via(M3-M2) = almost inexistent
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Layer Model
Al + 10% Oxide, 0.7μm
Buried Oxide, 0.5μm
Si Handle, 250μm, polished
Si, N-Well, 2μm
Oxide + 30% Al, ≈1μm
Oxide + 20% Al, 0.9μm
Oxide, 0.9μm
Al + 10% Oxide, 1μm
Al + 10% Oxide, 2μm
P-N Heat
0.5μm
0
1.5μm 2.0μm
2.7μm
3.7μm
5.7μm
20.0μm
k W/(m·K) ρ kg/m3 Cp J/(kg·K)
1.38 2203 703
144 2650 880
144 2650 880
144 2650 880
33 2300 740
54 2370 770
99.5
Oxide, 1μm 1.38 2203 703
163 2230 703
2410 780