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Transcript of HALT/HASS and Accelerated Testing Durability Growth through HALT/HASS and Accelerated Testing Elite...
HALT/HASS and Accelerated Testing
Durability Growth through HALT/HASS and Accelerated Testing
Elite Electronic Engineering
HALT/HASS and Accelerated Testing
Topics Covered
Review Your Requirements Overview of Accelerated Stress Testing HALT
HALT Equipment, Test Methods, Expectations HASS Other Accelerated Tests Summary Q&A
HALT/HASS and Accelerated Testing
Test Requirements & Goals
Is Testing Desired by Manufacturer to Reduce Cost of Development, Manufacturing, and Warranty Obligations?
Mandated by Manufacturer’s Client? What are your expectations and goals for
this testing?
HALT/HASS and Accelerated Testing
New Product Development Testing Screens
Failure Modes
Qualitative Testing
Qualification Testing Qual Retest
Quantitative Testing Manufacturing Screen
New Product
HALT, HAST, ESD, Power Cycle, EMI RTCA DO-160
MIL-810, SAE J1455
Temp, Vibration, Shock, Waterproofness, Altitude, Humidity
HASSAnalysis Phase
Development Phase
HALT/HASS and Accelerated Testing
Quantitative Testing
.95 .80
.98
.65
.98
Reliability Block Diagrams
=0.73
Success Run Testing
Test to Failure- Weibull
HALT/HASS and Accelerated Testing
Which Tests To Run
Input from all departments Determine failure modes (FMEA) Consider complete life cycle of product Suggest stresses that will precipitate failures
Maximum Stress vs Time Dependent Develop test plan Execute test
HALT/HASS and Accelerated Testing
Time Dependent Failure Mechanisms
Loss of signal Silicon Diffusion Temperature
Power Failure Dielectric Breakdown Electric Field
Loss of signal Electromigration Temperature & Power Cycling
Intermittent Output Corrosion & Oxidation of Fractures
Humidity, Voltage, Temperature
Loss of signal Dendrite Growth Humidity, Temperature
Water Intrusion Seal Leaks Pressure
Cracked Solder Joint
Fatigue Thermal cycling & vibration
Failure Mechanism Accelerating FactorsFailure Mode
HALT/HASS and Accelerated Testing
HALT Testing (Qualitative)
Highly Accelerated Life Testing (HALT) Temperature and Thermal Shock (60C/min) Vibration 6 axis simultaneous (6 DOF) Very high stress levels to achieve time compression
& quickly find the weakest links. Additional stresses likely to precipitate flaws can be
used as a part of the HALT/HASS program. power cycling, voltage /electrical stress
HALT/HASS and Accelerated Testing
HALT Testing
Design Optimization Provide data to designers for risk assessment Weak links- opportunity to improve the product before the design is “locked in”. Build in lifetimes of use in its field environment, “very large margins”. Proactive technique focusing on the mode and mechanism of failure, not on the
specifications or the level of stress. No pass/fail criteria HALT specification. Some HALT specifications describe a
“common method”
Product Comparisons Side-by-side evaluation of various products and product revisions under similar
extreme stress
HASS Endpoints Large margins enables the use of high levels of stress in the HASS screen. Leave
several if not many lifetimes of use remaining in the product. Enables the use of HASS to quickly detect any slippage that might occur in the
manufacturing process.
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
Halt Chamber Workspace
42”x42”x40”
Heating & Cooling -100C to +200C >60C/min depending
on product loading and temperature range
HALT/HASS and Accelerated Testing
HALT Testing
Heating Elements Nichrome
Coils FLA 135A Min Service
175A 460VAC 3ph Airflow
4,000CFM
HALT/HASS and Accelerated Testing
HALT Testing
LN2 Cooling 4.5GPM 30 PSIG
HALT/HASS and Accelerated Testing
HALT Testing
RS Vibration Table Multi-axis repetitive shock 3 linear, 3 rotational Axes 2Hz-10,000Hz Up to 60GRMS
(depending on loading) Table Size 30” x 30” Payload up to 400lbs
(reduced vibration amplitude)
Compressed Air 90PSIG, 48CFM
HALT/HASS and Accelerated Testing
HALT Testing
RS Impactors
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
HALT PSD
1.E-06
1.E-05
1.E-04
1.E-03
1.E-02
1.E-01
1.E+00
1.E+01
1.0E+00 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05
Frequency (Hz)G^
2/H
z
HALT/HASS and Accelerated Testing
HALT Testing
Ckt board resonant frequencies
Components on PWB
Chip capacitors and die bond wires
HALT/HASS and Accelerated Testing
Feb 11, 2005 10:23:11
Demand: 6.061 G
Control: 6.06 G
Level 1) 100%
Level Time: 0:05:00
Total Time: 0:05:22
Output: 0 V RMS
End of Test
Ice Corporation (33141)
De-Icing Control Unit (9510 Rev T)
Y Axis sn: C350-00057-SAC
20 2000100 1000-31x10
-21x10
-11x10
Demand
Control
Frequency (Hz)
Acceleration (G
²/H
z)
Acceleration Profile
RS vs. ED
HALT/HASS and Accelerated Testing
RS vs. ED
ED (Electrodynamic Vibration) Controllable Vibration Spectra 5Hz-2000Hz Single Axis 2” Displacement
RS Random Only 6 Axis 30Hz-10,000Hz 10x -15x higher peak accel vs. ED
HALT/HASS and Accelerated Testing
STEP 1: Pre-HALT Planning
Discuss product with multi-functional team Develop test plan Bench test to confirm operation before starting HALT
Steps Involved with HALT
HALT/HASS and Accelerated Testing
HALT Process
STEP 2: Preparing for the HALT
Setup Design appropriate vibration fixture Tune chamber proportional & integral parameters Configure air flow for maximum product temperature
change rate Apply thermocouples and accelerometers to device
under test Setup functional test equipment
HALT/HASS and Accelerated Testing
HALT ProcessSTEP 3: Thermal Step Stressing Cold
Begin at ambient Step down in 5°C or 10°C increments Use caution as fundamental limit is approached Approximate dwell time of 10 minutes at each temperature Allow sufficient time to run functional tests Find and fix failures Verify operation of thermal safeties Disable safeties to determine actual operating & destruct limits Continue until fundamental limit of technology is reached Practice continuous failure monitoring
HALT/HASS and Accelerated Testing
HALT Process
STEP 4: Thermal Step Stressing Hot
Begin at ambient Step up in 5°C or 10°C increments Use caution as fundamental limit is approached Approximate dwell time of 10 minutes at each temperature Allow sufficient time to run functional tests Find and fix failures Verify operation of thermal safeties Disable safeties to determine actual operating & destruct limits Continue until fundamental limit of technology is reached Practice continuous failure monitoring
HALT/HASS and Accelerated Testing
Limits Encountered in HALT
Stress
LowerOperating
Limit
Margin
Operating
ProductSpecs
LowerDestruct
Limit
Destruct Margin
UpperOperating
Limit
Margin
Operating
UpperDestruct
Limit
Destruct Margin
Data from Gregg Hobbs of Hobbs EngineeringData from Gregg Hobbs of Hobbs Engineering
HALT/HASS and Accelerated Testing
HALT Process
STEP 5: Rapid Thermal Cycling
Transition temperature at maximum product temperature change rates
Select temperatures 5°C inside upper and lower operational limits Reduce change rate by 10°C/min if product cannot withstand
maximum rate Continue thermal cycling until operating limit (°C/min) is found Continue cycling for a minimum of 10 minutes Apply functional testing and continuous failure monitoring Depending on the product or application, this step is sometimes
omitted
HALT/HASS and Accelerated Testing
HALT Process
STEP 6: Vibration Step Stress
Understand how product responds to vibration input Vibration is stepped-up in increments, normally 3-5
Grms on the product Dwell time of 10 minutes at each level is typically
sufficient Start dwell once product reaches vibration set point Continue until operational or destruct limit is found Apply additional product stresses during process
HALT/HASS and Accelerated Testing
HALT Process
STEP 7: Combined Environments
Develop thermal profile Use established thermal operating limits, dwell times and change
rates Incorporate functional tests and continuous failure monitoring Begin with constant vibration level of approximately 3-5 Grms Step up in 3-5 Grms increments upon completion of each thermal
cycle Use tickle vibration when higher Grms levels are reached Add 3-5 Grms tickle to determine if failures were precipitated at
high G level but only detectable at lower G level
HALT/HASS and Accelerated Testing
Suggested HALT Process Per GMW 8287
HALT/HASS and Accelerated Testing
The Product Determines the Stress Power Cycling Output Loading Voltage/Electrical Stresses Humidity (HAST) Pressure Altitude Corrosion
Other Stresses
HALT/HASS and Accelerated Testing
HALT Process
STEP 8: Lessons Learned
Determine root cause of all failures that occurred Meet with design engineers to discuss HALT results Management cost justification & risk assessment Determine and implement corrective action Perform Verification HALT Insure problems are fixed and new problems were not
introduced Periodically evaluate product as it is subjected to engineering
changes
HALT/HASS and Accelerated Testing
HALT Testing
Other considerations Quantity of Samples
Product Improvement Preparation for HASS/HASA Comparison Testing
Fixturing Stimulation vs. Simulation
Product and Fixture Weight Test Uniformity
LowerOperating
Limit
Margin
Operating
HALT/HASS and Accelerated Testing
HALT Testing
Cross Table Uniformity
69.364.0
45.2
60.065.5
136.3130.0
93.3
128.4
136.1
17.9
12.9
10.8
14.7
16.3
0.0
20.0
40.0
60.0
80.0
100.0
120.0
140.0
160.0
1 2 3 4 5 Table Location
25 &
55
Grm
s In
pu
t S
cale
0.0
5.0
10.0
15.0
20.0
25.0
5 G
rms
Inp
ut
Sca
le
25 Grms Input55 Grms Input5 Grms Input
HALT/HASS and Accelerated Testing
HALT Testing
Response Level
Test Location Control Level Grms- X Grms-Y Grms-Z Mean
1 5 21.2 19.2 13.4 17.9
1 25 79.8 73.0 55.0 69.3
1 MAX (55) 158.1 138.3 112.6 136.3
2 5 14.2 14.6 9.8 12.9
2 25 73.3 68.4 50.3 64.0
2 MAX (55) 150.1 134.2 105.6 130.0
3 5 10.5 13.8 8.1 10.8
3 25 42.6 55.6 37.3 45.2
3 MAX (55) 85.5 113.6 80.7 93.3
4 5 16.6 17.4 10.1 14.7
4 25 68.1 67.5 44.5 60.0
4 MAX (55) 145.3 140.3 99.7 128.4
5 5 19.1 18.4 11.3 16.3
5 25 77.1 69.5 50.0 65.5
5 MAX (55) 157.4 140.5 110.5 136.1
1 5 20.5 17.9 12.1 16.8
1 25 75.1 72.3 51.9 66.4
1 MAX (55) 158.1 140.7 112.8 137.2
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
HALT Testing
Failure Analysis Services
HALT/HASS and Accelerated Testing
HALT Testing
“SEM photographs showing and overall view (top, ~40x) and a typical closer view (bottom, ~800x) showing some surface debris but no damage to the integrated circuit from sample D4.”
Failure Analysis Services
HALT/HASS and Accelerated Testing
HALT Testing
HALT/HASS and Accelerated Testing
Component Selection Did vendor perform HALT AND HASS? Use to verify products operating limits. Use to select most robust product.
Vendor Selection If subcontracting, vendor needs to meet your
standards (Halt and Hass equipment, should be the same.)
Other Uses of HALT
HALT/HASS and Accelerated Testing
HASS- Highly Accelerated Stress Screening
HASS is used as a production quality screen quickly identify any weaknesses that might enter the
product due to changes or malfunctions in the manufacturing process.
Each weakness detected, represents an opportunity to take corrective action prior to shipping large quantities of flawed product.
The screen is “tuned” so that it detects weak product while still leaving several, if not many lifetimes of field use in the shipped product.
HALT/HASS and Accelerated Testing
HASS Testing
HASS- 100% Production Screening HASA- 1-10% Production Auditing Safety of of HASS
Repeat screen a minimum of 20 times Assuming remove less than 5% life Failures after less than 10 times, too harsh
Re-HALT- Confirm margins
HALT/HASS and Accelerated Testing
Other Accelerated Stress Testing
Acceleration Factors Temperature
Arrhenius Model Humidity
Arrhenius-Peck Model Vibration
Miner Criteria Voltage
Inverse Power Law Product Life Cycling
CALT Testing Test to Failure & Apply Weibull Analysis
HALT/HASS and Accelerated Testing
Product Life Cycling
Calibrated Accelerated Life Testing (CALT) Suggest primary fatigue mechanism Simulate loads at three stress levels
90% of foolish load (first test) 80% of first test load Third stress level
Depends on first two and ultimate life Test all units to failure Plot S-N curve, Determine AF’s Generate Weibull Plot
HALT/HASS and Accelerated Testing
Product Life Cycling
Accelerated Life Testing
•“Accelerated Testing: Statistical
Models, Test Plans, and Data Analysis”
•By Wayne Nelson
•CALT GMW 8758
•Example
Automatic Lubricating System
HALT/HASS and Accelerated Testing
CALT Test Example
•Simulate loads at three stress levels
•Monitor test counting cycles to failure
HALT/HASS and Accelerated Testing
CALT Test ExampleStress Cycles To Failure
36 312136 107536 62936 945231 1138631 110431 662431 157725 1104425 1540525 1925725 28723
Pump S-N Curve
y = 3050953219559.39x-5.93
100
1000
10000
100000
10 100Applied Stress (PSI)C
ycle
s to
Fai
lure
•Collect Failure Data
•Plot and determine Inverse Power Relationship
•AF = (Saccel/Snormal)b
Determine AF'sConditionHigh StressMid StressConfirm StressNormal Stress
Accel Factor1807421
Stress Value (PSI)36312515 N/A
HALT/HASS and Accelerated Testing
CALT Test ExampleStress Level Test Stress Accel Factor Rank
High (IG) 3121 180 9High (IG) 1075 180 4High (IG) 629 180 2High (PP) 9452 180 12
Medium (PP) 11386 74 11Medium (IG) 1104 74 1Medium (PP) 6624 74 8Medium (IG) 1577 74 3Confirm (PP) 11044 21 5Confirm (PP) 15405 21 6Confirm (PP) 19257 21 7Confirm (PP) 28723 21 10
Cycles at Normal Stress5609791932241130591698933
398246594009
84318981757490540116785228397318585
Median Rank5.6113.6021.6729.7637.8545.9554.0562.1270.2478.3386.4094.39
81757
228397
594009843189
1698933
Sorted Least to Most (Resort these numbers for each
change to spreadsheet)
318585398246490540560979
113059116785193224
Sort and apply median ranks Generate Weibull Plot
HALT/HASS and Accelerated Testing
CALT Test Example
Weibull Plot
•Obtain distribution parameters
•Reliability metrics
•B1, B10
•Reliability vs life
•Reliability Block Diagrams
ReliaSoft Weibull++ 7 - www.ReliaSoft.comProbability - Weibull
Time, (t)
Un
reliab
ilit
y, F(t)
10000.000 1.000E+7100000.000 1000000.0001.000
5.000
10.000
50.000
90.000
99.000Probability-Weibull
Data 1Weibull-2PRRX SRM MED FMF=12/S=0
Data PointsProbability Line
Steve LayaElite Electronic Engineering6/12/20084:58:49 PM
HALT/HASS and Accelerated Testing
HAST TestingAccelerated Humidity Testing
•HAST (Highly Accelerated Stress Testing)
•JESD22-A110 B
•Compress 1000 Hour 85/85 Humidity to 96 Hours
•High Temperatures may stimulate uncorrelated failures
•Arrhenius-Peck Accelerated Model for Temperature Humidity
HALT/HASS and Accelerated Testing
HAST Testing
“…Photographs showing environmental damage to the solder joints of A8.”
HALT/HASS and Accelerated Testing
Instrumentation & Data Acquisition
Yokagawa DL708 Scope Ten Systems In-House 4, 8, and 16 Channel
LeCroy Digital Storage Scopes 1.5GHz Bandwidth, 8GS/s, 16M data
points Seven Systems In-House
400MHz, 500Mhz scopes
Agilent 34970A Data Acquisition System 120 Single Ended or 60 Differential Input AC/DC, Volts, Amps, Frequency, Ohms
HALT/HASS and Accelerated Testing
Advanced Material Center
Materials Testing and Failure Analysis Physical Testing Thermal Testing Chemical Testing Light & Appearance Exposure Testing Product Comparisons
Location: Ottawa, Illinois
www.amc-testlabs.com
HALT/HASS and Accelerated Testing
Advanced Material Center
Physical Testing Tensile Tear Dart Flextural Friction Surface Tension Specific Gravity Density COF
HALT/HASS and Accelerated Testing
Advanced Material Center
Thermal Analysis Differential Scanning Calorimeter
(DSC) Melt range Purity
Thermal Mechanical Analyzer (TMA) Expansion/Contraction
Thermal Gravimetric Analyzer (TGA) Thermal degradation Ash
HALT/HASS and Accelerated Testing
Materials Engineering Incorporated
Complete Metallurgical Laboratory Failure Analysis Analysis of Processing Problems Contamination Identification Engineering Support/Consulting Laboratory Testing Specialized Testing Litigation Support and Expert Testimony
Location: Virgil, Illinois
www.materials-engr.com
HALT/HASS and Accelerated Testing
Materials Engineering Incorporated
Complete Metallurgical Laboratory Scanning Electron Microscope (SEM) with EDS OES Chemical Composition Metallography and Microscopy Microhardness and Hardness Electrical Conductivity Density/Specific Gravity Surface Roughness (Ra) Pressure and Torque Testing Specialized Product and Component Testing ISO 17025 Accredited by A2LA
HALT/HASS and Accelerated Testing
Other Tests to Failure
HALT/HASS and Accelerated Testing
Other Tests to Failure
HALT/HASS and Accelerated Testing
Durability Growth to HALT HASS
Any Questions?
Thank You!