Field Ion Microscopy
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Transcript of Field Ion Microscopy
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Field Ion Microscopy
Presented byNishant Kumar Sony
16PH62R03
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content
• Introduction• Essential instrumentation and design• Basic Principle• Advantages• Application
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Introduction
• It is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip.
• First Field ion microscope (FIM) was invented by Müller in 1951.
• FIM, provides atomic-resolution imaging of the surface of a specimen.
• FIM is a projection type microscope.
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Essential Instrumentation and Design
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Basic principle• FIM is differ considerably from those other of
optical and electron microscopy.• Image is produce by the applying of high
voltage to the specimen with respect to the channel plate screen.
• Required field strength at the sample surface measure up to 50v/nm.
• Needle shape of specimen is prepared with average radius of curvature 10-100nm.
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• The electric field at the apex of the specimen is of the order of 1010 V m–1.
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Seeing Atom
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Application
• Orientation• Radios of curvature• Shank angle• Image compression factor• Surface diffusion process
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Refreances
• http://www.springer.com/978-1-4614-3435-1• E.W. M€uller, J. Appl. Phys. 27(5), 474–476
(1956)• E.W. M€uller, Phys. Rev. 102(3), 618–624
(1956)
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THANKYOU
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