EMC TEST REPORT For CE - Forum CGVcgv_systeme/pub/CGV/IP/_Certifications/...2013/12/30 · CTK Co.,...

CTK Co., Ltd. 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea

Tel: +82-31-339-9970 Fax: +82-31-339-9855 www.e-ctk.com

Test Report No.: CTK-2012-01042-2 Date: December 30, 2013

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This Report shall not be reproduced except in full without the written approval of CTK Form No.: CTK-RF-EC-EN55022&EN50130-4(Rev.5.7)

EMC TEST REPORT For CE Test Report No. : CTK-2012-01042-2 Date of Issue : December 30, 2013 Model/Type No. : NCB-2003PR, NCB-2003P, NCB-1303PR, NCB-1303P,

EZIC-IBR4M20, CHS-NCB-2003PR, LTV-ICDM1-623LH-V3-9, LTV-ICDM2-623LH-V3-9, VGON-4042HR, VGON-5042HR, FKP-IP203IR, CNC-330, ZN-B2MTP, ZN-B1MTP, NVIP-2DN3001H/IRH-2P/GO, NVIP-1DN3001H/IRH-2P/GO and TELETEC-HD113

Kind of Product : Network Camera Applicant : ITX Security CO., LTD Applicant Address : 9F Kolon Digital Tower Aston Bldg, 505-14, Gasan-dong,

Geumcheon-gu, SEOUL, 153-803, KOREA Manufacturer : ITX Security CO., LTD Manufacturer Address : 9F Kolon Digital Tower Aston Bldg, 505-14, Gasan-dong,

Geumcheon-gu, SEOUL, 153-803, KOREA Contact Person : Kim Chil-Gu (QA Research Engineer) Telephone : +82-2-2082-8500 Received Date : August 29, 2012 Test period : Start : September 12, 2012 End : September 20, 2012 Test Results : In Compliance Not in Compliance The test results presented in this report relate only to the object tested. Tested by Reviewed by

Hee-Sung Ahn EMC Test Engineer

James Hong EMC Technical Manager

Date: December 30, 2013 Date: December 30, 2013




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REPORT REVISION HISTORY

Date Revision Page No October 9, 2012 Issued (CTK-2012-01042) All

February 4, 2013

Issued (CTK-2012-01042-1) * Add of Model name ZN-B2MTP, ZN-B1MTP,

NVIP-2DN3001H/IRH-2P/GO and NVIP-1DN3001H/IRH-2P/GO

All

December 30, 2013 Issued (CTK-2012-01042-2) * Add of Model name TELETEC-HD113 All

This report shall not be reproduced except in full, without the written approval of CTK Co., Ltd. This document may be altered or revised by CTK Co., Ltd. personnel only, and shall be noted in the revision section of the document. Any alteration of this document not carried out by CTK Co., Ltd. will constitute fraud and shall nullify the document.




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TABLE OF CONTENTS

REPORT REVISION HISTORY ........................................................................................... 2 1.0 General Product Description ................................................................................ 4 1.1 Model Differences .............................................................................................. 5 1.2 Device Modifications ........................................................................................... 5 1.3 EUT Configuration(s) .......................................................................................... 6 1.4 Test Software .................................................................................................... 7 1.5 EUT Operating Mode(s) ...................................................................................... 7 1.6 Configuration .................................................................................................... 8 1.7 Calibration Details of Equipment Used for Measurement ....................................... 10 1.8 Test Facility ..................................................................................................... 10 1.9 Laboratory Accreditations and Listings ................................................................ 10 1.10 Measurement Uncertainty ................................................................................. 10 2.0 Emissions Test Regulations ............................................................................... 11 2.1 Conducted Voltage Emissions ............................................................................ 12 2.2 Radiated Electric Field Emissions ....................................................................... 14 2.3 Harmonic Current Emissions ............................................................................. 15 2.4 Voltage Fluctuations and Flicker ......................................................................... 16 3.0 Immunity Test Regulations ................................................................................ 17 3.1 Criteria for compliance ..................................................................................... 18 3.2 Electrostatic Discharge ..................................................................................... 20 3.3 Radiated Electric Field Immunity ........................................................................ 23 3.4 Electrical Fast Transients/Bursts......................................................................... 26 3.5 Surge Transients .............................................................................................. 28 3.6 Conducted Disturbance..................................................................................... 31 3.7 Mains Supply Voltage Variations ........................................................................ 35 3.8 Voltage Dips and Short Interrupts ...................................................................... 36 APPENDIX A - Test Setup Photos and Configuration.......................................................... 38

Conducted Voltage Emissions .................................................................................. 38 Conducted Voltage Emissions at Telecommunication Ports ........................................... 39 Radiated Electric Field Emissions (Below 1 ㎓) ........................................................... 40 Radiated Electric Field Emissions (Above 1 ㎓) ........................................................... 41 Harmonic Current Emissions and Voltage Fluctuations and Flicker ................................ 42 Electrostatic Discharge ........................................................................................... 43 Radiated Electric Field Immunity .............................................................................. 44 Electrical Fast Transients/Bursts ............................................................................... 45 Surge Transients .................................................................................................... 46 Conducted Disturbance ........................................................................................... 47 Voltage Dips, Short Interrupts and Voltage Variations ................................................. 48

APPENDIX B – TEST DATA............................................................................................. 49 Conducted Voltage Emissions (for EUT Input Power : 24 Vac) ...................................... 49 Conducted Voltage Emissions (for EUT Input Power : PoE) .......................................... 53 Radiated Electric Field Emissions (for EUT Input Power : 24 Vac) ................................. 55 Radiated Electric Field Emissions (for EUT Input Power : PoE) ...................................... 57 Harmonic Current Emissions (for EUT Input Power : 24 Vac) ....................................... 59 Voltage Fluctuations and Flicker (for EUT Input Power : 24 Vac) ................................... 60

APPENDIX C – EUT Photographs .................................................................................... 62 EUT External Photographs ....................................................................................... 63 EUT Internal Photographs ....................................................................................... 64 LENS .................................................................................................................... 65 PCB ...................................................................................................................... 66




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1.0 General Product Description 1.0.1 Tested Equipment

Unless otherwise indicated, all tests were conducted on Model NCB-2003PR.

Tests performed on Model NCB-2003PR were considered to be representative of Model(s) NCB-2003P, NCB-1303PR, NCB-1303P, EZIC-IBR4M20, CHS-NCB-2003PR, LTV-ICDM1-623LH-V3-9, LTV-ICDM2-623LH-V3-9, VGON-4042HR, VGON-5042HR, FKP-IP203IR, CNC-330, ZN-B2MTP, ZN-B1MTP, NVIP-2DN3001H/IRH-2P/GO, NVIP-1DN3001H/IRH-2P/GO and TELETEC-HD113.

1.0.2 Equipment Mobility and Identification

Dimensions: 145(Ø) by 343(H) ㎜ inch Mobility: Hand-held Table-top Stationary Built-in Serial No.: Prototype

1.0.3 Electrical Ratings

EUT Input: 24 Vac, PoE

Output: -

1.0.4 Test Voltage & Frequency

Unless indicated otherwise on the individual data sheet or test results, the test voltage and frequency was as indicated below.

Voltage: 230 Vac Frequency: 50 ㎐

1.0.5 Clock & Other Frequencies Utilized

CORE : 486 ㎒

DDR : 360 ㎒ System main clock : 24 ㎒

Network main clock : 25 ㎒ RTC : 32.768 ㎑ Sensor Pixel Clock : 96 ㎒




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1.1 Model Differences

These models are identical except for as below; - NCB-2003PR is Basic model. - NCB-2003P, NCB-1303PR, NCB-1303P, EZIC-IBR4M20, CHS-NCB-2003PR,

LTV-ICDM1-623LH-V3-9, LTV-ICDM2-623LH-V3-9, VGON-4042HR, VGON-5042HR, FKP-IP203IR, CNC-330, ZN-B2MTP, ZN-B1MTP, NVIP-2DN3001H/IRH-2P/GO,

NVIP-1DN3001H/IRH-2P/GO and TELETEC-HD113 are identical with NCB-2003PR except for model designations at requests of a buyer.

1.2 Device Modifications

The following modifications were necessary for compliance: Not applicable




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1.3 EUT Configuration(s)

See Appendix A for individual test set-up configuration(s). The following peripheral devices and/or interface cables were connected during the measurement:

[EUT Input Power : 24 Vac]

Peripheral Devices

Device Manufacturer Model No. Serial No.

AC ADAPTER Dream Electronic Co., Ltd. DRL-241500AC - Personal Computer Samsung Electronics Co., Ltd. DB-A150 ZMSI96BSB00125F LCD Monitor LG Electronics Inc. M2294DJ 902KCVU6M135 Keyboard(PS/2) Dongguan Great Pleasure Electronics Co., Ltd. GP-K5000 82019943 Mouse(USB) MICROSOFT CORPORATION. Basic Optical Mouse 1.OA USB/PS2 Compatible X09-13962

Cable Description

# Description Ferrite Core

Length (m) Other Details

1 AC Power Cable, Unshielded No 1.8 Connect to AC Power 2 AC Power Cable, Unshielded No 1.8 Connect to AC Power 3 AC Power Cable, Unshielded No 1.8 Connect to AC Power 4 AC IN Cable, Unshielded No 1.5 Between the EUT and an AC ADAPTER 5 Network Cable, Unshielded No 3.0 Between a Personal Computer and the EUT 6 D-SUB Cable, Shielded Yes 1.8 Between a Personal Computer and a LCD Monitor 7 Mouse(USB) Cable, Shielded Yes 1.5 Connect to a Personal Computer 8 Keyboard(PS/2) Cable, Shielded No 1.5 Connect to a Personal Computer 9 I/O Cable, Unshielded No 3.0 Connect to the EUT

[EUT Input Power : PoE]

Peripheral Devices

Device Manufacturer Model No. Serial No.

PoE Switch - - - Personal Computer Samsung Electronics Co., Ltd. DB-A150 ZMSI96BSB00125F LCD Monitor LG Electronics Inc. M2294DJ 902KCVU6M135 Keyboard(PS/2) Dongguan Great Pleasure Electronics Co., Ltd. GP-K5000 82019943 Mouse(USB) MICROSOFT CORPORATION. Basic Optical Mouse 1.OA USB/PS2 Compatible X09-13962

Cable Description

# Description Ferrite Core

Length (m) Other Details

1 AC Power Cable, Unshielded No 1.8 Connect to AC Power 2 AC Power Cable, Unshielded No 1.8 Connect to AC Power 3 AC Power Cable, Unshielded No 1.8 Connect to AC Power 4 LAN Cable, Unshielded No 3.0 Between a Personal Computer and a PoE Switch 5 Network Cable, Unshielded No 3.0 Between the EUT and a PoE Switch 6 D-SUB Cable, Shielded Yes 1.8 Between a Personal Computer and a LCD Monitor 7 Mouse(USB) Cable, Shielded Yes 1.5 Connect to a Personal Computer 8 Keyboard(PS/2) Cable, Shielded No 1.5 Connect to a Personal Computer 9 I/O Cable, Unshielded No 3.0 Connect to the EUT




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1.4 Test Software EMC Test V 1.0 Display Test Patterns – V1.5

Ping.exe Not applicable

1.5 EUT Operating Mode(s) Equipment under test was operated during the measurement under the following conditions:

Stand by Scrolling ‘H’ Display circles pattern Read / Write Practice operation – Monitoring the EUT’s video signal and Ping Test.




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1.6 Configuration


* Radiated Electric Field Emissions and Radiated Electromagnetic Fields has been completed while all devices were located outside of test site where it took place except EUT.

AC Power

Personal Computer

6

EUT (NCB-2003PR)

Keyboard(PS/2)

8

LCD Monitor

4

Mouse(USB)

7

AC ADAPTER

1

AC Power

AUDIO IN AUDIO OUT

ALARM Cable

5

2

9

3




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* Radiated Electric Field Emissions and

Radiated Electromagnetic Fields has been completed while all devices were located outside of test site where it took place except EUT.

3

1

AC Power

Personal Computer

6

EUT (NCB-2003PR)

Keyboard(PS/2)

2

LCD Monitor

Mouse(USB)

7

PoE Switch

8

3

4

9 AUDIO IN AUDIO OUT

ALARM Cable

5




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1.7 Calibration Details of Equipment Used for Measurement

Test equipment and test accessories are calibrated on regular basis. The maximum time between calibrations is one year or what is recommended by the manufacturer, whichever is less. All test equipment calibrations are traceable to the Korea Research Institute of Standards and Science (KRISS), therefore, all test data recorded in this report is traceable to KRISS.

1.8 Test Facility

The measurement facility is located at 386-1, Ho-dong, Cheoin-gu, Yongin-si, Gyeonggi-do, 449-100, Korea. The sites are constructed in conformance with the requirements of ANSI C63.7, ANSI C63.4 and CISPR Publication 22.

1.9 Laboratory Accreditations and Listings

Country Agency Scope of Accreditation Logo USA FCC 3 m & 10 m OATS, 3 m & 10 m SAC and

Conducted Test Site to perform FCC Part 15/18 measurements

805871

JAPAN VCCI 10 m OATS, 3 m & 10 m SAC and Conducted Test Site

R-948, C-986, T-1843,

R-3627, G-387 KOREA KCC EMI (10 m OATS, 10 m SAC and Conducted

Test Site) EMS (ESD, RS, EFT/Burst, Surge, CS, Magnetic, Dips and Interruptions)

No. 51, KR0025 1.10 Measurement Uncertainty Compliance of the product is based on the measured value.

However, the measurement uncertainty is included for information purposes. The measurement uncertainties given below are based on a standard uncertainty multiplied by a coverage factor of k=2, providing a level of confidence of approximately 95 %.

Measurement Type Frequency Range Expanded Uncertainty

Conducted Emission 150 ㎑ to 30 ㎒ ± 2.48 ㏈ (C.L.: Approx. 95 %, k=2) Radiated Emission 30 ㎒ to 1000 ㎒ ± 3.70 ㏈ (C.L.: Approx. 95 %, k=2)




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2.0 Emissions Test Regulations

The emissions tests were performed according to following regulations:

EMC – Directive 2004/108/EC

EN 61000-6-3:2007

EN 61000-6-4:2007

EN 55011:2007 +A2:2007 Group 1 Group 2 Class A Class B

EN 55013:2001 +A1:2003 +A2:2006

EN 55014-1:2006 +A1:2009

EN 55015:2006 +A1:2007 +A2 :2009

EN 61204-3:2000 Class A Class B

EN 61131-2:2003

EN 61326-1:2006 Class A Class B

EN 55022:2006 +A1:2007 Class A Class B

EN 61000-3-2:2006 +A1:2009 +A2:2009

EN 61000-3-3:2008

VCCI V-3/2008.04 Class A Class B

AS/NZS CISPR22:2006 Class A Class B

FCC Part 15 Subpart B Class A Class B

CISPR 22:2006 Class A Class B




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2.1 Conducted Voltage Emissions Test Date September 12, 2012 Test Location Shielded Room Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date EMI Test Receiver Rohde & Schwarz ESCI7 100910 2013-03-30 LISN Rohde & Schwarz ENV216 101235 2013-08-06 LISN Rohde & Schwarz ENV216 101236 2013-08-06 EMI Test Receiver Rohde & Schwarz ESHS30 828144/002 2013-02-09 LISN Rohde & Schwarz ENV216 101150 2013-02-09 LISN EMCO 3825/2 9607-2575 2013-07-17 ISN TESEQ GMBH ISN T8 25191 2012-11-12 ISN TESEQ GMBH ENY81-CA6 101553 2012-11-12 ISN SCHWARZBECK CAT5 8158 CAT5-8158-0042 2013-06-11

Frequency Range of Measurement

150 ㎑ to 30 ㎒ Instrument Settings IF Band Width: 9 ㎑ Test Results The requirements are: MET NOT MET NOT APPLICABLE

Mains Ports: [EUT Input Power: 24 Vac]

Frequency (㎒)

Measured Data (㏈㎶)

Margin (㏈) Remark

18.303 000 52.7 7.3 Average

[EUT Input Power: PoE] Frequency

(㎒) Measured Data

(㏈㎶) Margin

(㏈) Remark

NOT APPLICABLE




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Telecommunication Ports:

[EUT Input Power: 24 Vac]

Tested Ports Frequency (㎒)


Margin (㏈) Remark

LAN (10 Mbps) 10.000 500 75.2 11.8 QuasiPeak LAN (100 Mbps) 18.244 500 64.3 9.7 Average

[EUT Input Power: PoE]

Tested Ports Frequency (㎒)


Margin (㏈) Remark

LAN (10 Mbps) 10.000 500 74.7 12.3 QuasiPeak LAN (100 Mbps) 16.228 500 62.5 11.5 Average

Remarks

See Appendix B for test data.




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2.2 Radiated Electric Field Emissions Test Date September 13, 2012 Test Location

Testing was performed at a test distance of: 10 m OATS 3 m OATS 10 m SAC 3 m SAC Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date EMI Test Receiver Rohde & Schwarz ESCI7 100814 2012-12-13 Trilog Broadband Antenna Schwarzbeck VULB 9161 SE 9161-4133 2014-06-11 6dB Attenuator Rohde & Schwarz DNF 272.4110.50 2012-11-14 AMPLIFIER Sonoma Instrument Co. 310 291721 2013-03-27 EMI Test Receiver Rohde & Schwarz ESU40 100336 2013-06-29 Double Ridged Guide Antenna ETS-Lindgren 3115 00078894 2013-03-22 PREAMPLIFIER Agilent Technologies 8449B 3008A02307 2012-11-17

Frequency Range of Measurement 30 ㎒ to 1 ㎓

1 ㎓ to 2 ㎓ Instrument Settings

IF Band Width: 120 ㎑ IF Band Width: 1 ㎒ Test Results The requirements are: MET NOT MET NOT APPLICABLE

[EUT Input Power: 24 Vac] Frequency

(㎒) Measured Data

(㏈㎶/m) Margin

(㏈) Remark

62.374 31.5 8.5 Quasi-peak

[EUT Input Power: PoE] Frequency

(㎒) Measured Data

(㏈㎶/m) Margin

(㏈) Remark

106.630 35.2 4.8 Quasi-peak Remarks See Appendix B for test data.




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2.3 Harmonic Current Emissions Test Date September 20, 2012

Test Location Shielded Room

Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date Universal Power Analyzer Voltech PM6000 200006700362 2013-07-07 AC POWER SOURCE Schaffner NSG1007-3-240 54350 2013-03-27

Classification Of Equipment for Harmonic Current Emissions Class A Class B Class C Class D Test Results MET NOT MET NOT APPLICABLE Remarks

Because the EUT power is less than 75 W, limits are not specified. See Appendix B for test data.




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2.4 Voltage Fluctuations and Flicker Test Date September 20, 2012

Test Location Shielded Room

Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date Universal Power Analyzer Voltech PM6000 200006700362 2013-07-07 AC POWER SOURCE Schaffner NSG1007-3-240 54350 2013-03-27

Test Results The requirements are:

MET NOT MET NOT APPLICABLE Remarks

See Appendix B for test data.




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3.0 Immunity Test Regulations

The immunity tests were performed according to following regulations:

EMC – Directive 2004/108/EC

EN 61000-6-1:2007

EN 61000-6-2:2005

EN 50130-4:1995 +A1:1998 +A2:2003

EN 61204-3:2000 Low severity level – residencial, commecial or light-industrial environments High severity level – industrial environment

EN 55014-2:1997 +A1:2001

EN 55024:1998 +A1:2001 +A2:2003

EN 60601-1-2:2007

EN 61326-1:2006

EN 61000-4-2:2009 EN 61000-4-3:2006 +A1:2008 EN 61000-4-4:2004 EN 61000-4-5:2006 EN 61000-4-6:2009 EN 61000-4-8:2010 EN 61000-4-11:2004




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3.1 Criteria for compliance Criteria for compliance was based on the following guidelines:

Test Item Criteria for compliance Electrostatic Discharge There shall be no damage, malfunction or change of status due to the

conditioning. Flickering of an indicator during the application of the discharges is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.

Radiated Electromagnetic Fields

There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators occurs at a field strength of 3 V/m. For components of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the picture is allowed at 10 V/m, providing. a) there is no permanent damage or change to the EUT (e.g. no corruption of

memory or changes to programmable settings etc.); b) at 3 V/m, any deterioration of the picture is so minor that the system

could still be used; and c) there is no observable deterioration of the picture at 1 V/m.

For components with radio links, it is accepted that communications via the radio link may not be possible during the conditioning within the transmitter and receiver exclusion bands defined in the relevant part of ETSI EN 301 489 for that type of radio link equipment. If the EUT is designed to detect and indicate this loss of communication, then this indication is permitted, providing it is in accordance with the manufacturer’s specification. It may be necessary to use appropriate filters to ensure that failures out of the exclusion bands are not due to harmonics generated by the test system. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.

Fast Transients Bursts There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of the bursts is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.

Slow High Energy Voltage Surge

There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the application of the surges is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.




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Conducted Disturbance

There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change, and no such flickering of indicators occurs at Uo = 130 ㏈㎶. For components of CCTV systems, where the status is monitored by observing the TV picture, then deterioration of the picture is allowed at Uo = 140 ㏈㎶, providing: a) there is no permanent damage or change to the EUT (e.g. no corruption of

memory or changes to programmable settings etc.); b) at Uo = 130 ㏈㎶, any deterioration of the picture is so minor that the

system could still be used, and; c) there is no observable deterioration of the picture at Uo = 120 ㏈㎶.

The EUT shall meet the acceptance criteria for the functional test, after the

conditioning.

Mains Supply Voltage Variations

There shall be no damage, malfunction or change of status due to the different supply voltage conditions. The EUT shall meet the acceptance criteria for the functional test, during the conditioning.

Mains Supply Voltage Dips and Short Interruptions

There shall be no damage, malfunction or change of status due to the conditioning. Flickering of an indicator during the conditioning is permissible, providing that there is no residual change in the EUT or any change in outputs, which could be interpreted by associated equipment as a change. The EUT shall meet the acceptance criteria for the functional test, after the conditioning.




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3.2 Electrostatic Discharge

Reference Standard EN 61000-4-2:2009

Test Date September 15, 2012 Test Location EMS-ESD: Shielded Room Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date ESD Simulator Noiseken ESS-2000 0199C02387 2013-03-28 ESD Gun Noiseken TC-815R ESS0898829 2013-03-28

Test Specifications Discharge Factor: ³ 1 s Discharge Impedance: 330 ohm / 150 pF Kind of Discharge: Air, Contact (direct and indirect) Polarity: Positive and Negative Number of Discharge: ³ 10 at all locations Discharge Voltage: Contact Air HCP VCP 2 ㎸ 2 ㎸ 2 ㎸ 2 ㎸ 4 ㎸ 4 ㎸ 4 ㎸ 4 ㎸ 6 ㎸ 6 ㎸ 6 ㎸ 6 ㎸ 8 ㎸ 8 ㎸ 8 ㎸ 8 ㎸ 15 ㎸ 15 ㎸ 15 ㎸ 15 ㎸ Notes: HCP: Horizontal coupling plane VCP: Vertical coupling plane Test Data

Test Conditions: Temperature: (25 ± 1) ℃

Relative Humidity: (52 ± 1) % Atmospheric Pressure: (99 ± 1) ㎪




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Location of Discharge

Air

Contact




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Test Results MET Required Performance Criteria

NOT MET Required Performance Criteria Remarks

No any function degraded during the test

Air

Contact




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3.3 Radiated Electric Field Immunity

Reference Standard EN 61000-4-3:2006 +A1:2008

Test Date September 17, 2012 Test Location EMS-RS: Fully anechoic chamber Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date Power Meter Agilent E4418B MY45104818 2013-03-27 Control Unit System Controller Noiseken NA25MF1G2010 A00148 N/A Power Sensor HP 8482A US37293310 2013-07-11 BAND 1 Power Amplifier Noiseken NA25MF1G2010 A00148 2013-03-27 BAND 2 Power Amplifier Noiseken NA25MF1G2010 A00148 2013-03-27 P.S. UNIT Power Supply Noiseken NA25MF1G2010 A00148 N/A RF AMPLIFIER Noiseken NA1GF3G50 A70540 2013-03-27 Signal Generator R&S SML03 103171 2012-11-10 ULTRA Broadband Antenna R&S HL562 100203 N/A

Test Specifications Antenna Polarization: Horizontal & vertical unless indicated otherwise Antenna Distance: 3 m Field Strength: 1 V/m 3 V/m 10 V/m Frequency Range: 27 ㎒ to 500 ㎒ 80 ㎒ to 2 ㎓ 26 ㎒ to 1 ㎓ Modulation: AM, 80 %, 1 ㎑ sine wave

PM, 1 ㎐ (0.5 s ON : 0.5 s OFF) Frequency step: 1 % step # of Sides Radiated: 4 6

Required Performance Criteria: A




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Test Data

[EUT Input Power : 24 Vac / PoE]

AM, 80 %, 1 ㎑ sine wave Dwell Time: 3 s at 1 V/m

Observation Side Exposed Horizontal Vertical

Front No any function degraded No any function degraded Right No any function degraded No any function degraded Back No any function degraded No any function degraded Left No any function degraded No any function degraded

Dwell Time: 3 s at 3 V/m Observation

Side Exposed Horizontal Vertical Front No any function degraded No any function degraded Right No any function degraded No any function degraded Back No any function degraded No any function degraded Left No any function degraded No any function degraded

Dwell Time: 3 s at 10 V/m Observation

Side Exposed Horizontal Vertical Front No any function degraded No any function degraded Right No any function degraded No any function degraded Back No any function degraded No any function degraded Left No any function degraded No any function degraded

PM, 1 ㎐ (0.5 s ON : 0.5 s OFF)

Dwell Time: 3 s at 1 V/m









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Note: “Blank” = Not performed




NOT MET Required Performance Criteria Remarks See above observations in tables.




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3.4 Electrical Fast Transients/Bursts


Test Date September 15, 2012 Test Location EMS-EFT: Shielded Room Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date Fast Transient Noise Simulator Noiseken FNS-AX3 B50B FNS10Y0900 2013-03-27 Capacitive Coupling Clamp Noiseken 15-00001A - 2012-11-14

Test Specifications Pulse Amplitude & Polarity: ± 0.5 ㎸ ± 1.0 ㎸

(Power Lines) ± 2.0 ㎸ Pulse Amplitude & Polarity: ± 0.25 ㎸ ± 0.5 ㎸ (Signal Lines) ± 1.0 ㎸

Burst Period: 300 ms 2 s Repetition Rate: 5 ㎑ Duration of Test Voltage: ³ 1 min




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Test Data

[EUT Input Power : 24 Vac] Input a.c. power ports – Coupling/Decoupling Network used

Mode of Application OBSERVATIONS (±) Burst (㎸)

2.0 L1 & L2 No any function degraded

Signal ports and telecommunication ports – Coupling Clamp used

Mode of Application OBSERVATIONS (±) Burst (kV)

1.0 I/O Ports No any function degraded NETWORK Port No any function degraded


Input a.c. power ports – Coupling/Decoupling Network used

Mode of Application OBSERVATIONS (±) Burst (㎸)

2.0

Signal ports and telecommunication ports – Coupling Clamp used

Mode of Application OBSERVATIONS (±) Burst (kV)

1.0 I/O Ports No any function degraded NETWORK Port No any function degraded



Relative Humidity: (53 ± 1) % Atmospheric Pressure: (99 ± 1) ㎪ Test Results MET Required Performance Criteria


I/O ports: AUDIO IN, AUDIO OUT, ALARM Cable




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3.5 Surge Transients


Test Date September 14, 2012 Test Location EMS-Surge: Shielded Room Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date Lightning Surge Simulator Noiseken LSS-6030 0189E00251 2013-07-07 Lightning Surge Simulator Noiseken LSS-15AX-C3A LSS0780786 2013-02-09 TELECOM LINES INJECTION UNIT Noiseken LSS-INJ6401TEL LSS0961027 N/A INTERCONNECTION LINE UNIT Noiseken LSS-INJ6400SIG LSS0961028 N/A

Test Specifications Power Lines

Source Impedance: 12 W for common mode and 2 W for differential mode

Surge Amplitude: Common Mode 0.5, 1.0 & 2.0 ㎸

Differential Mode 0.5 & 1.0 ㎸ Number of Surges: 5 surges per angle Angle: 0°, 90°, 180°, 270° (input a.c. power port) Polarity: Positive & Negative Repetition Rate: 1 surge per min

Signal Lines (Unshielded) Source Impedance: 42 W for common mode

Surge Amplitude: Common Mode 0.5 & 1.0 ㎸

Number of Surges: 5 Surges per mode

Polarity: Positive & Negative

Repetition Rate: 1 surge per min




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Signal Lines (Shielded)

Source Impedance: 2 W for common mode

Surge Amplitude: Common Mode 0.5 & 1.0 ㎸

Number of Surges: 5 Surges per mode

Polarity: Positive & Negative

Repetition Rate: 1 surge per min Test Data

[EUT Input Power : 24 Vac] Power Lines

Line to Earth – Common Mode

Mode of Application OBSERVATIONS (±) Surge (㎸)

0.5 1.0 2.0 L1 to PE L2 to PE

Line to Line – Differential Mode


0.5 1.0 L1 to L2 No any function degraded L2 to L1 No any function degraded

Signal Lines (Unshielded)



0.5 1.0 I/O Ports No any function degraded NETWORK Port No any function degraded




0.5 1.0




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[EUT Input Power : PoE] Power Lines



0.5 1.0 2.0 L1 to PE L2 to PE

Line to Line – Differential Mode


0.5 1.0 L1 to L2 L2 to L1

Signal Lines (Unshielded)



0.5 1.0 I/O Ports No any function degraded NETWORK Port No any function degraded




0.5 1.0





I/O ports : AUDIO IN, AUDIO OUT, ALARM Cable




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3.6 Conducted Disturbance


Test Date September 18, 2012 Test Location EMS-CS: Shielded Room Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date Power Meter HP E4419B GB39290775 2013-07-10 RF Power Amplifier Schaffner CBA954815 1011 2013-07-09 Power Sensor Agilent E9304A MY41497499 2013-07-10 Signal Generator R&S SML03 102254 2013-03-27 Attenuator BIRD 100-A-FFN-06 9933 2013-07-10 CDN Noiseken NCDN-M2-32A 2001 2012-11-11 CDN Noiseken NCDN-M3-32A 2016 2012-11-11 RF-SYNTHESIZER/AMPLIFIER Schaffner NSG2070-1 1068 2012-11-17 Attenuator Schaffner INA2070-1 2068 2012-11-14 CDN FCC NCDN-M2-16A 091361 2013-07-16 CDN FCC NCDN-M3-16A 091362 2013-07-16 CDN Noiseken NCDN-T2 2001 2012-11-11 CDN Noiseken NCDN-T4 2002 2012-11-11 CDN Noiseken NCDN-T8 2015 2012-11-11 CDN Noiseken NCDN-C1-50-BNC 2001 2012-11-11 EM Clamp Noiseken NEM-23 275 2012-11-21

Test Specifications Frequency range: 150 ㎑ to 100 ㎒ 10 ㎑ to 30 ㎒ 150 ㎑ to 230 ㎒ 10 ㎑ to 100 ㎒ Voltage Level: 1 Vrms 3 Vrms 10 Vrms Modulation: AM, 80 %, 1 ㎑ sine wave PM, 1 ㎐ (0.5 s ON : 0.5 s OFF) Frequency step: 1 % step




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Test Data


AM, 80 %, 1 ㎑ sine wave

Dwell Time: 3 s at 1 V Coupling Location (Line Stressed) Coupling Method Observation

Input a.c. power port CDN(M2) No any function degraded I/O ports EMC No any function degraded

NETWORK port EMC No any function degraded



NETWORK port EMC No any function degraded Dwell Time: 3 s at 10 V

Coupling Location (Line Stressed) Coupling Method Observation



PM, 1 ㎐ (0.5 s ON : 0.5 s OFF)






NETWORK port EMC No any function degraded Dwell Time: 3 s at 10 V







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AM, 80 %, 1 ㎑ sine wave


I/O ports EMC No any function degraded NETWORK port EMC No any function degraded

Dwell Time: 3 s at 3 V






PM, 1 ㎐ (0.5 s ON : 0.5 s OFF)












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Notes: CDN = Coupling Decoupling Network EMC = Electro Magnetic Clamp “blank” = Not performed





I/O ports : AUDIO IN, AUDIO OUT, ALARM Cable




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3.7 Mains Supply Voltage Variations

Reference Standard EN 50130-4:1995 +A1:1998 +A2:2003 Test Date September 15, 2012 Test Location Shielded Room Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date Constant Voltage Constant Frequency NewTech CVCF 3 kW 4269 N/A

Test Specifications Supply voltage max.: Unom + 10 % Supply voltage min.: Unom - 15 % Unom = Nominal mains voltage (230 Vac) Test Data

[EUT Input Power : 24 Vac] Input a.c. power ports

Mode of Application Observation Supply voltage max. (253 Vac) No any function degraded

Supply voltage min. (195.5 Vac) No any function degraded

[EUT Input Power : PoE] Input a.c. power ports

Mode of Application Observation Supply voltage max. (253 Vac)

Supply voltage min. (195.5 Vac)

Note: “Blank” = Not performed Test Conditions: Temperature: (25 ± 1) ℃


NOT MET Required Performance Criteria Remarks

See above observations in tables.




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3.8 Voltage Dips and Short Interrupts


Test Date September 15, 2012 Test Location EMS-Voltage dip: Shielded Room Test Equipment

Name of Equipment Manufacturer Model No. Serial No. Due Date Power Quality Test System s SCHAFFNER ProfLine 2103 200048-202EK 2013-03-27

Test Specifications & Observations/Remarks


Voltage Dips and Short Interruptions Test Level Duration [in period/ms (50 ㎐)] Observation 0 %Ut 0.5 /10 No any function degraded (100 % dip) 1.0 /20 No any function degraded

5.0 /100 No any function degraded 10 /200

25 /500 50 /1000

250 /5000 40 %Ut 0.5 /10 No any function degraded (60 % dip) 1.0 /20 No any function degraded

5.0 /100 No any function degraded 10 /200 No any function degraded

25 /500 50 /1000

70 %Ut 0.5 /10 No any function degraded

(30 % dip) 1.0 /20 No any function degraded 5.0 /100 No any function degraded

10 /200 No any function degraded 25 /500

50 /1000




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APPENDIX A - Test Setup Photos and Configuration Conducted Voltage Emissions




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Conducted Voltage Emissions at Telecommunication Ports




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Radiated Electric Field Emissions (Below 1 ㎓)




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Radiated Electric Field Emissions (Above 1 ㎓)




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Harmonic Current Emissions and Voltage Fluctuations and Flicker




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Electrostatic Discharge




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Radiated Electric Field Immunity




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Electrical Fast Transients/Bursts




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Surge Transients




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Conducted Disturbance




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Voltage Dips, Short Interrupts and Voltage Variations




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APPENDIX B – TEST DATA Conducted Voltage Emissions (for EUT Input Power : 24 Vac)

[HOT]

[Neutral]




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[HOT]

[NEUTRAL]




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[Telecommunication Ports - LAN (10 Mbps)]




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Conducted Voltage Emissions (for EUT Input Power : PoE)





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Radiated Electric Field Emissions (for EUT Input Power : 24 Vac)

- Below 1 ㎓ –




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– Above 1 ㎓ –

* No emission were detected at a level greater than 20 ㏈ below limit.




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Radiated Electric Field Emissions (for EUT Input Power : PoE)

– Below 1 ㎓ –




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– Above 1 ㎓ –

* No emission were detected at a level greater than 20 ㏈ below limit.




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Harmonic Current Emissions (for EUT Input Power : 24 Vac)




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Voltage Fluctuations and Flicker (for EUT Input Power : 24 Vac)




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APPENDIX C – EUT Photographs




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EUT External Photographs




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EUT Internal Photographs




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LENS




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PCB




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EMC TEST REPORT For CE - Forum CGVcgv_systeme/pub/CGV/IP/_Certifications/...2013/12/30 · CTK Co.,...

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Transcript of EMC TEST REPORT For CE - Forum CGVcgv_systeme/pub/CGV/IP/_Certifications/...2013/12/30 · CTK Co.,...