DUT
description
Transcript of DUT
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DUT
VDD
(1) Power Supply/Current Meter
What you need to test an IC ?
Idd
2
DUT
VDD
(2) Signal Generator
What you need to test an IC ?
in
3
DUT
VDD
(3) Oscilloscope/Logic Analyzer
What you need to test an IC ?
out
4
DUT
VDD
(4) Voltage Source/Current Meter
What you need to test an IC ?
in
Iin
+Volt
_
I-meter
5
DUT
VDD
(5) Current Source/Voltage Meter
What you need to test an IC ?
out
Vout
+Current
_
V-meter
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Basic Request for IC Tester
Combine following function in Test Machine
(1) Power Supply/Current Meter (2) Signal Generator (3) Oscilloscope/Logic Analyzer (4) Voltage Source/Current Meter(5) Current Source/Voltage Meter
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DUTout2
PowerDriver
in2
out1
in1
DPS
PinDriver
Comparator
PMU
PEC
PMU
V-SourceI-Meter
I-SourceV-Meter
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PowerDriver
DPS
1. Provide device under test with operating power.
2. Power supply voltage can be programming. @2V, @4V, @8V, @10V Range
3. Ability for supply current measurement function. @1uA, @10uA, @100uA, @1mA, @10mA,@100mA, @1A Range
4. Four independent DPS source in System.
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PinDriver
PEC
Comparator
1. Provide DUT with specified level stimulus signals.
2. Provide two rail comparators to capture output signal.
3. Stimulus/Capture are controlled by “Pat”, “TG”, “Format” and “Levels” . All are programmable to fit application.
4. 256 independent channels source in System.
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PMU
1. Provide device pins with Voltage/Current source. And ability for Current/Voltage measurement. FVMI and FIMV mode.
2. Voltage Source/Measurement function. @2V, @4V, @8V, @10V Range
3. Current Source/Measurement function. @1uA, @10uA, @100uA, @1mA, @10mA,@100mA, @1A Range
4. Four independent PMU source in System.
V/I SourceI/V Meter
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PLAN(cont); DISCONNECT(ALLPINS, PMU); DPS_FV(DPS1, 0.000nV, V1I6); SET_REF_LEVEL( OS_TEST_LVL ); SET_PIN_LOW( ALLPINS ); CONNECT(ALLPINS, DCL); WAIT(3ms); PMU_FIMV(ALLPINS, -100.000uA, V1I4, -1.000V, -200.000mV, 0.000ms, OFF, ON ); SET_FORMAT(INIT); DISCONNECT(ALLPINS, PMU);END_PLAN;
FORMAT_SET( OS_TEST ); ALLPINS = ( NRZ, NRZ, NORMAL);END_FS;
TIMING_SET( FASTCON, 20.00us ); ALLPINS = F( 0.00ns, 100.00ns ), IO( 0.00ns, 100.00ns ), STB( 19.00us, 19.5us );END_TS;
LEVEL_SET( OS_TEST_LVL ); ALLPINS = VIH(3.60 V), VIL( 0.0 V), VOH(-0.2 V), VOL(-1.0 V), IOH(200uA), IOL(200uA), VCM(-2.00 V);END_LS;
Open/Short(Continuity) Test
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DCL
PMU
DCL
PMU
DCL
PMU
DCL
PMU
0.0V 0.0V
0.0V
VDD
IN_1
IN_2
OUT_1
OUT_2
GND
0.0V
Normal value= +0.6V(100uA)or -0.6V(-100uA)
DPS force 0.0V
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DCL
PMU
DCL
PMU
DCL
PMU
DCL
PMU
0.0V 0.0V
0.0V
VDD
IN_1
IN_2
OUT_1
OUT_2
GND
0.0V
Pin opened
Measured value= +2.5(100uA@V1)or -2.5(-100uA @V1)
DPS force 0.0V
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DCL
PMU
DCL
PMU
DCL
PMU
DCL
PMU
0.0V 0.0V
0.0V
VDD
IN_1
IN_2
OUT_1
OUT_2
GND
0.0V
Pin to pin short
Measured value = 0.0V
DPS force 0.0V
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VIH
VIL
0/1
ON/OFF
VOL
VOH
VCC
GND
A B010101 HLHLHL
CMP_H
CMP_L
A B
0 11 0
/* AB */
* 0H *; * 1L *;
Truth table pattern
7404
Connect to DPS
Connect to GND
TPDhl TPDlh
A
B
Functional Test
DUT
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What is Pattern ?
What is TG ?
What is FORMAT ?
What is Level ?
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Pattern
• Pattern is the “truth table”.
Symbol Main information in the period0 Force 01 Force 1H Compare HighL Compare LowX No Drive / Don’t care outputZ No Drive / Compare Tri-stateO Force 0 + Compare Lowo Force 0 + Compare HighI Force 1 + Compare Highi Force 1 + Compare Low
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TG (timing Generator)
• FTG define the timing of input signal goes 1 and goes 0• IOTG define the timing of input signal turns on and off• STB define the timing to capture output signal
F
IO
STB
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Format
• Format is waveform type.
Format RemarkNRN Non Return to Zero ( Once goes 1, not back to 0 in period)RZ Return to zero ( Once goes 1, back to 0 later in period)
RTO Return To One (Once goes 0, back to 1 later in period)NXOR Surround by compliment @1
FH Static 1, not pattern controlledFL Static 0, not pattern controlled
• F- Format.(control goes 1/0)
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Format RemarkNRN Non Return to Zero ( Once drive on, not back to off in period)RZ Return to zero ( Once drive on, back to off later in period)
RTO Return To One (Once drive off, back to on later in period)NXOR Surround by compliment @2DON Driver always turns on , not pattern controlledDOFF Driver always turns off , not pattern controlled
• IO- Format.(control drive on/off)
Format Remark
NORMALFollow IO( IO turns on , load is off. IO turns off, load is on automatically)
LON Load always on , not pattern controlledLOFF Load always off , not pattern controlled
• L- Format.(control load on/off)
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D Q( D Flip-Flop )CLK
AND
NRZ Block
PAT
TG
PAT
TG
RZ Block
OR
XOR
RTO Block
PAT
TG
PAT
TG
NXOR Block
INV
INV
NRZ Out
RZ Out
RTO Out
NXOR Out
DFF. D = PATDFF. CLK = TGNRZ Out = DFF. Q
RZ Out = PAT TG
RTO Out = TG + PAT
NXOR Out = TG PAT
.
- Data bus- Addr bus
- Clock pin- Control pin(high active)
- Clock pin- Control pin(low active)
- Addr bus (access test)
Function Block Function Description Application
F and IO Format
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PAT 0 1 1 0 0
TG
NRZ
RZ
RTO
NXOR
Combine Pattern, TG and Format
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Level
Level RemarkVIH The voltage when pin driver goes 1 VIL The voltage when pin driver goes 0
VOH The High threshold voltage for of DUT outputVOL The low threshold voltage for of DUT outputIOH The current load when DUT output HighIOL The current load when DUT output Low
• Level defines the Input/Output DC level
VCM The communication voltage for Tri-State or switching IOH/IOL
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NRZ
RZ
RTO
NXOR
MUX
F_PATF_TG
(Fixed High) 1
(Fixed Low) 0
F_CTRL
F_FORM_SEL 3
NRZ
RZ
RTO
NXOR
MUX
D_PATD_TG
(Drv On) 1
(Drv Off) 0
D_CTRL
D_FORM_SEL 3
Pin Drive
VIH
VIL
IO control
Transmission gate
(IO_TG)
(IO_FORM_SEL)
Pin Driver Block Diagram
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VIH
VIL
Hi-Z
F_CTRL
D_CTRL
Strobe
Goes 1Goes 0
Drive off
Drive on
F_CTRL, D_CTRL and Level
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VIHx
VILx
F_CTRLx
D_CTRLx
1
0
IOLx
IOHx
GND
L_CTRLx
VCMx
Comp
Comp
VOHx
VOLx
PEH_Px
PEL_Px
PMU
PE_PxDCL
(From reference buffer)
(From reference buffer)
(From reference buffer)
(From reference buffer)
(From reference buffer)
PEC Block Diagram -- Pin Electronics
D1 D2
(To Format/Response Chips)
(To Format/Response Chips)
(To Back plane connector,then to DUT via Flat Cable)
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*XXXXXXXXXX* TS = FASTCON;*Z000000000*;*0Z00000000*;*00Z0000000*;*000Z000000*;*0000Z00000*;*00000Z0000*;*000000Z000*;*0000000Z00*;*00000000Z0*;*000000000Z*;*XXXXXXXXXX* Halt;
PLAN(fast_con); DISCONNECT(ALLPINS, PMU); CONNECT(ALLPINS, DCL); SET_FORMAT(OS_TEST); SET_REF_LEVEL(OS_TEST_LVL); DPS_FV(DPS4, 0.000nV, V1I6); BURST_PATTERN(OS); SET_FORMAT(INIT); DISCONNECT(ALLPINS, PMU); END_PLAN;
FORMAT_SET( OS_TEST ); ALLPINS = ( NRZ, NRZ, NORMAL);END_FS;
TIMING_SET( FASTCON, 20.00us ); ALLPINS = F( 0.00ns, 100.00ns ), IO( 0.00ns, 100.00ns ), STB( 19.00us, 19.5us );END_TS;
LEVEL_SET( OS_TEST_LVL ); ALLPINS = VIH(3.60 V), VIL( 0.0 V), VOH(-0.2 V), VOL(-1.0 V), IOH(200uA), IOL(200uA), VCM(-2.00 V);END_LS;
Fast Continuity Test
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DCL
DCL
VDD
IN_1
IN_2
GND
0.0V
100uA~200uA
100uA~200uA
VCM = 2.0V (-2.0V)
VOH = 1.0V (-0.2V)
VOL = 0.2V (-1.0V)
0.6V(-0.6V)
To Responseblock
To Responseblock
(compare Z)
1(1)
1(1)
DPS force 0.0V
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DCL
DCL
VDD
IN_1
IN_2
GND
0.0V
100uA~200uA
100uA~200uA
VCM = 2.0V (-2.0V)
VOH = 1.0V (-0.2V)
VOL = 0.2V (-1.0V)
2.0V(-2.0V)
To Responseblock
To Responseblock
(compare Z)
0(1)
1(0)
DPS force 0.0V
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DCL
DCL
VDD
IN_1
IN_2
GND
0.0V
100uA~200uA
100uA~200uA
VCM = 2.0V (-2.0V)
VOH = 1.0V (-0.2V)
VOL = 0.2V (-1.0V)
0.0V(-0.0V)
To Responseblock
To Responseblock
(compare Z)
1(0)
0(1)
DPS force 0.0V
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D[0..7] Q[0..7]
74HC273
CLK
/CLR
D[0..7]
CLK
/CLR
Q[0..7]
1(F-RTO) /CLR(IO-NRZ)
(F-NRZ) D(IO-NRZ)
(F-NRZ) Q(output)(IO-NRZ)
(F-RZ) CLK(IO-NRZ)
A B C D
A B C D
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A[0..14] D[0..7]
62256
/OE
/WE
ADDR[0..14]
/OE
/WE
DATA[0..7]
1(F-NRZ) /OE(IO-NRZ)
(F-NRZ) ADDR(IO-NRZ)
(F-NRZ) DATA(input)(IO-NRZ)
(F-RTO) /WE(IO-NRZ)
A A+1 A+2 A+3
D(A) D(A+1) D(A+2) D(A+3)
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DB[0..11]
/CS
/WE
(F-NRZ) /CS(IO-NRZ)
(F-NRZ) DATA(input)(IO-NRZ)
(F-RTO) /WE(IO-NRZ)
D(0) D(1) D(2) D(3)
DB[0..11]
DAC Digital to Analog Converter
/CS/WE/LDAC
VOUT
/LDAC
(F-RTO) /LDAC(IO-NRZ)
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A[0..14] D[0..7]
62256
/OE
/WE
ADDR[0..14]
/OE
/WE
DATA[0..7]
0(F-NRZ) /OE(IO-NRZ)
(F-NXOR) ADDR(IO-NRZ)
(F-NRZ) DATA(output)(IO-NRZ)
(F-NRZ) /WE(IO-NRZ)
A1 A1A1 A2 A2A2 A3 A3
D(A1) D(A1)D(A1) D(A2) D(A2) D(A3)D(A2)
1
access time
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A[0..7] B[0..7]
74HC245
/G
DIR
A[0..7]
/GATE
DIR
B[0..7]
1(F-NRZ) /GATE
(F-NRZ) A(IO-RZ)
(F-NRZ) B(IO-RZ)
(RZ) DIR
A B
A B
A IO_TG
B IO_TG
A B
A B
A B
A B
A B
A B
A
A
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How to check if the pull-high resistor exist.
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DCL
DCL
VDD
IN_1
IN_2
GND
DPS FV=VDD
Pull high resistor = Ry
Pull high resistor = Rx
VIH = VDD + Vy
VIL
VIH = VDD + Vx
VIL
Ix = Vx/Rx
Iy = Vy/Ry
ISB = ISBexp - (Vx/Rx) - (Vy/Ry)
Note : Vx,Vy might be +/-20 mV deviation if Rx,Ry are 20K Ohm, ISB will have 1uA/pin deviation
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DCL
DCL
VDD
IN_1
IN_2
GND
DPS FV=VDD
Pull high resistor = Ry
Pull high resistor = Rx
VIH = VDD + Vy
VIL
VIH = VDD + Vx
VIL
Ix = 0
Iy = 0
ISB = ISBexp
Note : Vx,Vy might be +/-20 mV deviation
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PMU
PMU
VDD
IN_1
IN_2
GND
DPS FV=VDD
Pull high resistor = Ry
Pull high resistor = Rx
Rx ~= V_drop/Ix
Ry ~= V_drop/Iy
PMU FV = VDD - V_drop
PMU FV = VDD - V_drop
Ix
Iy
Check pull-high resistor by PMU_FVMI to get current value.Set PMU force value to be a little voltage drop(ex. 0.1 or 0.5V)lower than VDD. Pull-high resistance can be roughly calculatedby Voltage_drop/Current_value.
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PATTERN( Demo, Header1, F_Fumc); *000111XXXXXXXXXX* TS= TS1; *000111XXXHLHLXXX*; *000111XXXHLHLXXX*; *000111XXXHLHLXXX*; *000111XXXHLHLXXX*; *000111XXXHLHLXXX* Halt;END_PATTERN;
PLAN( Low_Func); . . BURST_PATTERN(Demo); . . END_PLAN;
PATTERN( Demo, Header1); *000111XXXXXXXXXX* TS= TS1; *000111XXXHLHLXXX*; *000111XXXHLHLXXX*; *000111XXXHLHLXXX*; *000111XXXHLHLXXX*; *000111XXXHLHLXXX* Halt;END_PATTERN;
PLAN( Low_Func); . . SET_FORMAT(F_Func); BURST_PATTERN(Demo); . . END_PLAN;
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