Department of MaterialsUniversity of Oxford

Electron microscopy in the Department of Materials

The electron-microscopy group Web site:

http://www-em.materials.ox.ac.uk/

Department of MaterialsUniversity of Oxford

Modular courses A variety of modular courses in different aspects of electron

microscopy are held throughout the year. The local-access section of the Web site gives details of forthcoming courses. Those without prior experience should start with Basic SEM or Basic TEM, as appropriate.

It is important to get the timing right. These courses involve considerable investment in effort and time. A common mistake is to take a modular too soon, before specimens are available. The basic courses are repeated twice each term, towards the beginning and end of term. Plan accordingly. Some courses are not given each term.

Department of MaterialsUniversity of Oxford

Basic SEM and TEM in Michaelmas Term 2006

SEM: Weeks 1 (9th/10th Oct) and 7 (22nd, 23rd Nov) – next week

TEM: Weeks 2 (10th Oct) and 8 (27th Nov) Sign up by contacting me as soon as possible –

deadline for week 1SEM and week 2 TEM tomorrow.

Copy katherine.hartwell@materials Only do these if you need instruction urgently. You must commit the full time (2 days for SEM,

at least 4 for TEM initially).

Department of MaterialsUniversity of Oxford

To apply for other modular courses

Discuss with your supervisor which course(s) are appropriate. You will find details on the EM group website.

Download a modular course request form from the Website.

Return completed form to Katherine Hartwell (preferably electronically): katherine.hartwell@materials.ox.ac.uk

Department of MaterialsUniversity of Oxford

Modular courses in Michaelmas TermModular training courses in electron

microscopyProvisional dates(Michaelmas Term 2006)

Introduction to Scanning Electron Microscopy

(offered twice per term)

Dr M.L. Jenkins G Chapman

Weeks 1 and 7Given also in mid-September

Introduction to Transmission Electron Microscopy

(offered twice per term)

Dr M.L. Jenkins (coordinator) Dr J.L. Hutchison

G Chapman

Weeks 2 and 8Given also in mid-September

Specimen preparation

Energy-Dispersive X-Ray Analysis

Dr M L Jenkins, C Salter

Dr M.L. Jenkins, G Chapman

Week 3

Week 4

FIB Dr Y Huang Week 5

WDS X-ray Analysis Mr C.J. Salter Week 9

EELS Dr J L Hutcison,Dr C.J.D. Hetherington

Week 6

High Resolution Electron Microscopy Dr J.L. Hutchison Week 7

Electron Backscattering Diffraction (EBSD)

Dr A J Wilkinson Week 6

Department of MaterialsUniversity of Oxford

Access to microscopes

We have many instruments, ranging from basic to very sophisticated. Details of the instruments and their capabilities are also given in the local

access section of the Web page. To gain access to particular instruments, you (together with your

supervisor) will have to complete an access request form – which can be downloaded from our Web site.

You will be required to describe your project and what you hope to achieve. This helps us to ensure that you get the right advice and training. For example, if you will need to use the sophisticated JEOL 3000F FEGTEM you will first need to become an approved user of a more basic instrument, then you will need to attend appropriate advanced training modules, combined with one-on-one training.

Department of MaterialsUniversity of Oxford

Certificate of Competence in Electron Microscopy

The Certificate of Competence in Electron Microscopy is awarded to researchers (including DPhil students, and post-doctoral researchers) who successfully complete an approved set of graduate lectures and modular training courses on a selection of electron microscopy (EM) techniques.

The course includes a specified number of hours of practical work, and in some cases the use of advanced techniques.

The certificate is not a formal requirement for those undertaking training in electron microscopy techniques, but is an additional qualification for researchers to gain during their time at Oxford, if they wish to do so.

The time required to complete the certificate is flexible, it may be completed within a year, but equally can be spread over the course of a whole DPhil project or period of postdoctoral research.

Department of MaterialsUniversity of Oxford

The Course Structure (1)

The exact title of your specialty will vary depending on the area of specialisation you have chosen. In order to successfully pass the Certificate, you must achieve the following standards: pass at least two practical training modules, and one

relevant lecture course in the area or areas of specialisation become an approved user of at least one microscope in the

area of specialisation, with at least 100 hours of independent use. If you choose more than one area of specialisation) you will need to log an additional 50 hours for each additional specialisation

submit a portfolio of your work to the Director of EM Facilities or his nominee, such work to be adjudged competent.

Department of MaterialsUniversity of Oxford

The Course Structure (2)

It is possible to obtain a certificate in more than one area of specialisation – there are currently three areas: SEM, TEM and analytical microscopy.

In such cases, you complete further complementary training modules and lectures, or undergo individual training in advanced techniques and the certificate will state in which area or areas you have been deemed competent.

The certificate will also detail modules and lecture courses attended, and advanced training given.

Department of MaterialsUniversity of Oxford

Required training modules and lecture courses

Area of specialisation

Practical training modules Relevant lecture courses

Microscopes for approved user status

Scanning Electron Microscopy

Introduction to Scanning Electron Microscopy

IT for electron microscopy

Focussed ion-beam thinningElectron Backscattering Diffraction (EBSD)

Scanning Electron Microscopy

Any SEM

Department of MaterialsUniversity of Oxford

Required training modules and lecture courses Area of specialisation

Practical training modules

Relevant lecture courses

Microscopes for approved user status

Transmission Electron Microscopy

Introduction to Transmission Electron Microscopy

Focussed ion-beam thinning

IT for electron microscopy

Specimen preparation techniques

Dislocation analysisWeak-beam electron microscopy

TEM Image Interpretation

Any TEM

Department of MaterialsUniversity of Oxford

Required training modules and lecture courses

Area of specialisation

Practical training modules

Relevant lecture courses

Microscopes for approved user status

Analytical Electron Microscopy

Energy-Dispersive X-Ray AnalysisWDS and Quantitative X-ray Analysis Electron Energy Loss Spectroscopy and Imaging Analysis of Electron Energy Loss SpectraAdvanced analysis module

STEM and MicroanalysisAdvanced microscopy and microanalysis

JXA 8800 JEOL 3000FJEOL 2200FSVG HB501

Department of MaterialsUniversity of Oxford

Registering for the Certificate

All researchers wishing to undertake the Certificate must register with Mrs Katherine Hartwell by returning to her the registration form found on the EM-group website : (http://www-em.materials.ox.ac.uk/)

Researchers who register part the way through their EM training will not necessarily qualify for the Certificate.