David Fritz [email protected] LUSI DOE Review July 23-24, 2007 XPP (WBS 1.2) Breakout 1...

David [email protected]

LUSI DOE Review July 23-24, 2007XPP (WBS 1.2) Breakout 1

X-ray Pump-Probe (WBS 1.2)

David Fritz

X-ray Pump-Probe (WBS 1.2)

David Fritz

System Specifications System Description

Instrument LayoutX-ray Optics &DiagnosticsSample EnvironmentsDetectorsLaser System

Costs and ScheduleSummary

System Specifications System Description

Instrument LayoutX-ray Optics &DiagnosticsSample EnvironmentsDetectorsLaser System

Costs and ScheduleSummary



Science TeamScience Team

Specifications and instrument concept developed with the science team.

The XPP team leadersKelly Gaffney, Photon Science, SLAC (leader)Jorgen Larsson, Lund Institute of Technology, SwedenDavid Reis, University of MichiganThomas Tschentscher, DESY, Germany

Specifications and instrument concept developed with the science team.

The XPP team leadersKelly Gaffney, Photon Science, SLAC (leader)Jorgen Larsson, Lund Institute of Technology, SwedenDavid Reis, University of MichiganThomas Tschentscher, DESY, Germany



X-ray Pump-Probe ScienceX-ray Pump-Probe Science

Phase TransitionsOrder / Disorder Metal/Insulator Phonon Dynamics

Charge Transfer Reactions

PhotosynthesisPhotovoltaicsVision

Photoactive Proteins

Phase TransitionsOrder / Disorder Metal/Insulator Phonon Dynamics

Charge Transfer Reactions

PhotosynthesisPhotovoltaicsVision

Photoactive Proteins

photo-excitation

Stampfli and Bennemann Phys. Rev. B 49, 7299 (1994)

photo-excitation



AcceleratingElements

ExperimentalPump Laser

Electron Gun

Master Clock

RF Distribution

Network

Laser/FEL TimingLaser/FEL Timing

Sources of Short Term JitterE-beam phase to RF phase jitter

Electron beam energy jitter + dispersive electron opticsEnd station laser phase to RF Phase

~ 1 ps limit

Sources of Short Term JitterE-beam phase to RF phase jitter

Electron beam energy jitter + dispersive electron opticsEnd station laser phase to RF Phase

~ 1 ps limit



Traditional Pump-probeTraditional Pump-probe

Delay will be achieved by optical delay and/or RF phase shiftResolution limited by LCLS/laser jitter ~ 1 ps limit

Delay will be achieved by optical delay and/or RF phase shiftResolution limited by LCLS/laser jitter ~ 1 ps limit



Single Shot Pump-ProbeSingle Shot Pump-Probe

time (fs)di

ffra

cted

in

tens

ity

Limited to X-ray diffractionNeed ‘large’ effectsImaging resolution affects temporal resolution

Limited to X-ray diffractionNeed ‘large’ effectsImaging resolution affects temporal resolution



Non-sequential SamplingNon-sequential Sampling

100 consecutive shots

Single shot, Lorentzian fit

Diagnostic required to measure LCLS/laser timingEOS demonstrated at SPPS

Diagnostic required to measure LCLS/laser timingEOS demonstrated at SPPS



Non-sequential SamplingNon-sequential Sampling



XPP SCOPE - WBS 1.2XPP SCOPE - WBS 1.2

Scope/CD-1 Estimate Includes:Physics support & engineering integration

X-ray optics – monochromator, focusing optics, slit systems, attenuators

Ultrafast laser system

Detectors - 2D detector from BNL by MOU, Emission Spectrometer

Sample environments - diffractometer system, thermal environments, vacuum environment

Laboratory facilities

Vacuum system

Installation

Diagnostics (WBS 1.5)

Controls and data system (WBS 1.6)



System SpecificationsSystem Specifications

Secondary Slits

Wide Angle Stage

Small Angle Stage

Photon Shutter

Primary Slits

Diagnostics

Focusing Lenses

Attenuators

Photon Shutter

Diagnostics

Diffractometer

Monochromator

NE

H H

utch

3

Diagnostics

Photon Shutter

Diagnostics

Laser Port

FE

E Item Purpose Specification

Large Offset Monochromator

Multiplex FEL radiation,Narrow FEL spectrum

600 mm offset,≤ 10-4 spectral bandwidth

Slits/AperturesBeam definition, Beam halo cleaning

0.25 mm accuracy, 1 mm repeatability

Attenuators Control incident x-ray fluxVariable, up to 106 reduction

DiagnosticsIntensity Monitor, Position Monitor

0.1% relative intensity measurement,

< 5% incident x-ray attenuation

Be Focusing Lenses

Increase incident x-ray flux

2-10 mm, 40-60 mm spot size at 1.5 Å,

2-10 mm spot size at 0.5 Å

Laser System Photoexcitation of samplesUltrafast pulse duration (<50 fs), Up to 20 mJ pulse energy at 800 nm, 120 Hz repetition rate

X-ray Diffractometer

Sample orientationKappa diffractometer,

Platform diffractometer

Wide Angle Detector Stage

Move the detector in reciprocal space

Spherical detector motion at a 10-150 cm radius

Small Angle Detector Stage

Collect SAXS patterns2.5, 5, and 10 m Sample-to-detector distance, 0.5 m horizontal detector motion

2D Detector from BNL by MOU

Provide 2D pixelated detection capability

1024 x1024 pixels, 120 Hz frame/s, dynamic range >103, single-photon sensitivity, pixel size 90x90 mm2



XPP Instrument LocationXPP Instrument Location

XCS

AMO(LCLS)

CXI

XPPEndstation



OffsetMonochromator

Laser System(Fundamental)

X-rayDiffractometerWavelength

Conversion

Small AngleScattering



XPP System Description XPP System Description

1.2.1 Physics support and engineering integration1.2.2 X-ray optics1.2.3 Laser system1.2.4 Detector1.2.5 Sample environments1.2.6 Laboratory facilities1.2.7 Vacuum system1.2.8 Installation

1.2.1 Physics support and engineering integration1.2.2 X-ray optics1.2.3 Laser system1.2.4 Detector1.2.5 Sample environments1.2.6 Laboratory facilities1.2.7 Vacuum system1.2.8 Installation



1.2.2 X-ray Optics1.2.2 X-ray Optics

1.2.2.1 Double crystal offset monochromatorNarrows x-ray spectrum for resonant scattering experimentsMultiplexes LCLS beam (mono. beam, diagnostic beam)

1.2.2.1 Double crystal offset monochromatorNarrows x-ray spectrum for resonant scattering experimentsMultiplexes LCLS beam (mono. beam, diagnostic beam)

Parameter Value

Energy Range 6 – 24 keV

Horizontal Offset 600 mm

Scattering Angle 90 - 500

Accuracy 0.02 arcsec

χ Accuracy 4 arcsec

Scattering Angles (2 theta)

1.5 Å 0.5 Å

Silicon 111 27.6° 9.1°

Silicon 220 45.8° 14.9°

Diamond 111 42.5° 13.9°

Diamond 220 - 22.8°




1.2.2.2 Beryllium lens focusing opticVariable spot size from 2-10 µm and 40-60 µm @ 8.3 keVVariable spot size from 2-10 µm @ 24.9 keV> 40% throughputPositioning resolution and repeatability to 1 µm

1.2.2.2 Beryllium lens focusing opticVariable spot size from 2-10 µm and 40-60 µm @ 8.3 keVVariable spot size from 2-10 µm @ 24.9 keV> 40% throughputPositioning resolution and repeatability to 1 µm

LensMono

190 m 4 m




1.2.2.3 Slit systemsVariable horizontal and vertical gap from 5 μm – 5 mmCan withstand full LCLS flux – unfocusedMinimize background scatter from blades

1.2.2.3 Slit systemsVariable horizontal and vertical gap from 5 μm – 5 mmCan withstand full LCLS flux – unfocusedMinimize background scatter from blades

B. Lengeler et al., J. Synchrotron Rad., 6, 1153-1167 (1999).




1.2.2.4 AttenuatorsVariable, up to 10 6 reductionHigh damage threshold (Be or B4C)

1.2.2.4 AttenuatorsVariable, up to 10 6 reductionHigh damage threshold (Be or B4C)



1.2.2 Level 4 Direct Costs1.2.2 Level 4 Direct Costs

Dollars x 1kWeeks Direct Dollars

PED ASSY PED M & S ASSY

1.2.2 X-ray Optics 124.5 78 299 667 235

1.2.2.1 Mono 100 56 243 494 169

1.2.2.2 Be Lens 7.5 7 18 27 21

1.2.2.3 Slits 5.5 4 12 110 12

1.2.2.4 Atten. 5.5 7.5 12 36 23

1.2.2.5 Coll. 6 3.5 13 1 11



1.2.3 Laser System1.2.3 Laser System




Ti:Sapphire Oscillator & Power Amplifiers

Compressor, OPA, Harmonic Generation, Delay Stage




1.2.3.1 Ti:Sapphire Oscillator119 MHz rep. rate, <30 fs ~ 2.5 nJ/pulseFrequency stabilized to LCLS RF < 300 fs rms phase jitter

Demonstrated at SPPS

1.2.3.1 Ti:Sapphire Oscillator119 MHz rep. rate, <30 fs ~ 2.5 nJ/pulseFrequency stabilized to LCLS RF < 300 fs rms phase jitter

Demonstrated at SPPS

Cavity Length Stabilization Mirror




1.2.3.2 Power AmplifiersRegenerative amplifier

~ 2.5 mJ (< 1% rms stability), 120 Hz, < 50 fsMultipass amplifier

~ 20 mJ (< 1.5% rms stability), 120 Hz, < 50 fsSecond Compressor External Pockels Cell

Arbitrary laser pulse train structure

1.2.3.2 Power AmplifiersRegenerative amplifier

~ 2.5 mJ (< 1% rms stability), 120 Hz, < 50 fsMultipass amplifier

~ 20 mJ (< 1.5% rms stability), 120 Hz, < 50 fsSecond Compressor External Pockels Cell

Arbitrary laser pulse train structure




1.2.3.3 Temporal Pulse ShaperCreate complex excitation pulse envelopes

Multi-pulsesCompression optimization

1.2.3.3 Temporal Pulse ShaperCreate complex excitation pulse envelopes

Multi-pulsesCompression optimization




1.2.3.6 Laser DiagnosticsTemporal and spectral characterization

Grenouille – Real time pulse duration, spectrum3rd Order Correlator – Contrast ratio

Energy characterizationPer pulse Joule meter, 120 Hz, 1% accuracy

Spatial characterizationProfile monitor at a “virtual” sample, 5 μm resolution

1.2.3.6 Laser DiagnosticsTemporal and spectral characterization

Grenouille – Real time pulse duration, spectrum3rd Order Correlator – Contrast ratio

Energy characterizationPer pulse Joule meter, 120 Hz, 1% accuracy

Spatial characterizationProfile monitor at a “virtual” sample, 5 μm resolution





PED ASSY PED M & S ASSY1.2.3 Laser System 60 24 128 1,557 61

1.2.3.1 Oscillator 1 2 176

1.2.3.2 Amplifiers 1 2 595

1.2.3.3 Pulse Shaper 1 2 54

1.2.3.4Optics &

Optomechanics13 4 28 227 12

1.2.3.5 Vacuum Transport 13 6 30 24 17

1.2.3.6 Diagnostics 2 3 205

1.2.3.7 Hutch Optical Tables 6 13 64

1.2.3.8 Timing System 6 8 13 25 15

1.2.3.9 Optical Experiements 1 2 21

1.2.3.10 Containment 11 6 24 35 17

1.2.3.11 OPA 1 2 100

1.2.3.12 Lab Optical Tables 4 8 31



1.2.4 Detectors1.2.4 Detectors

1.2.4.1 2D detector (BNL)1024 x 1024 pixels 90 micron pixel sizeHigh Detector Quantum Efficiency (DQE)10 4 dynamic range at 8 keV120 Hz Readout Rate

1.2.4.1 2D detector (BNL)1024 x 1024 pixels 90 micron pixel sizeHigh Detector Quantum Efficiency (DQE)10 4 dynamic range at 8 keV120 Hz Readout Rate



PSD

sample

beam

PSD

analyzers

vertical cut top view

beam

analyzers analyzers

analyzers

spectrum

sample

PSD

sample

beam

PSD

analyzers

vertical cut top view

beam

analyzers analyzers

analyzers

spectrum

sample

1.2.4 Detectors1.2.4 Detectors

1.2.4.2 Dispersive X-ray Emission Spectrometer50-100 eV dynamic range~ 1 eV energy resolutionSingle Shot Capability

1.2.4.2 Dispersive X-ray Emission Spectrometer50-100 eV dynamic range~ 1 eV energy resolutionSingle Shot Capability

U. Bergmann and R. Frahm, TDR XFEL workshop series “Methods and Instrumentation for the XFEL”, 52, (2001).






1.2.4 Detectors 62 4 156 2,066 12

1.2.4.12D Detector

(BNL)33 86 1,302

1.2.4.2Emission

Spectrometer29 4 70 764 12



1.2.5 Sample Environments1.2.5 Sample Environments

1.2.5.1 X-ray DiffractometerOperate in both direct and monochromatic beamSample orientation & translationAccommodate various sample environments

1.2.5.1 X-ray DiffractometerOperate in both direct and monochromatic beamSample orientation & translationAccommodate various sample environments




1.2.5.1 X-ray DiffractometerOperate in both direct and monochromatic beamDetector motion about a spherical surface centered at sample (variable radius from 0.1 m to 1.5 m)

1.2.5.1 X-ray DiffractometerOperate in both direct and monochromatic beamDetector motion about a spherical surface centered at sample (variable radius from 0.1 m to 1.5 m)




1.2.5.1 X-ray DiffractometerSAXS - 10 µrad angular resolution with XAMPS detectorDetector translationOperate in both direct and monochromatic beam

1.2.5.1 X-ray DiffractometerSAXS - 10 µrad angular resolution with XAMPS detectorDetector translationOperate in both direct and monochromatic beam




1.2.5.2 Cold Finger Cryostat System10 – 350 K Temperature Range0.1 K Temperature Stability>7 W cooling capacity at 20 KVacuum shroud

Optical and x-ray windows (collinear & non-collinear geometry)Decoupled sample motion

1.2.5.2 Cold Finger Cryostat System10 – 350 K Temperature Range0.1 K Temperature Stability>7 W cooling capacity at 20 KVacuum shroud

Optical and x-ray windows (collinear & non-collinear geometry)Decoupled sample motion

Det. Arra

y

Collinear Geometry

Det. Arra

y

Non-collinear Geometry




1.2.5.2 Cryostream System20-300 K Temperature Range< 1 K Temperature Stability

1.2.5.2 Cryostream System20-300 K Temperature Range< 1 K Temperature Stability






1.2.5 Sample Env. 115 21 267 900 61

1.2.5.1Diffractomete

r40 11 96 644 32

1.2.5.2 Cryostats 29 4 71 217 12

1.2.5.3 Liquid Jet 23 4 50 15 12

1.2.5.4 Vac.Chamber 23 2 50 25 6



1.2.6, 1.2.7 & 1.2.81.2.6, 1.2.7 & 1.2.8

1.2.6 Laboratory facilities1.2.7 Vacuum system

Hardware-flanges, pumps, bellows,…Vacuum supports

1.2.8 Installation

1.2.6 Laboratory facilities1.2.7 Vacuum system

Hardware-flanges, pumps, bellows,…Vacuum supports

1.2.8 Installation



X-ray DiagnosticsX-ray Diagnostics

Transmissive Intensity Monitor> 95 % TransmissionRelative accuracy < 0.1%

Flourescent ScreeensDiodes

Transmissive Intensity Monitor> 95 % TransmissionRelative accuracy < 0.1%

Flourescent ScreeensDiodes




Electro-optic Sampling

Laser

Pump-probe

Laser

LTU NEH

Gun Laser

Sector 20

Stabilized Fiber Optic RF Distribution (10 fs)

LBNL

Electro-optic SamplingEnhanced Temporal Resolution (~ 100 fs)

Limited by our ability to phase lock the lasers to the RF backboneLimited by Intra-bunch SASE jitter

Electro-optic SamplingEnhanced Temporal Resolution (~ 100 fs)

Limited by our ability to phase lock the lasers to the RF backboneLimited by Intra-bunch SASE jitter




Diagnostic Beam for Direct Timing MeasurementPermits destructive x-ray timing measurement in hutchSame exctitation laser can be used

Diagnostic Beam for Direct Timing MeasurementPermits destructive x-ray timing measurement in hutchSame exctitation laser can be used

600mm

Transmitted Beam85%

8keV

Diagnostic Beam1.3%

Mono. Beam2.5%



Key Technological ChoicesKey Technological Choices

1. Diamond vs. Silicon Monochromator Crystal- Absorption, Damage vs. Quality

2. Flexure vs. Piezo Monochromator Rotation Stage- Stability vs. Range

3. Robot Arm vs. Rotary Stage Detector Mover- Reciprocal Space Access vs. Control, Safety

4. Hexapod vs. Stages Sample Manipulator- Range of Motion vs. Stability, Control

5. Ti:Sapphire Oscillator vs. Fiber Oscillator- Bandwidth vs. Synchronization

1. Diamond vs. Silicon Monochromator Crystal- Absorption, Damage vs. Quality

2. Flexure vs. Piezo Monochromator Rotation Stage- Stability vs. Range

3. Robot Arm vs. Rotary Stage Detector Mover- Reciprocal Space Access vs. Control, Safety

4. Hexapod vs. Stages Sample Manipulator- Range of Motion vs. Stability, Control

5. Ti:Sapphire Oscillator vs. Fiber Oscillator- Bandwidth vs. Synchronization



XPP Schedule in Primavera 3.1XPP Schedule in Primavera 3.1



XPP MilestonesXPP Milestones

CD-1 Aug 01, 07Conceptual Design Complete Sep 21, 07CD-2a Dec 03, 07CD-3a Jul 21, 08Phase I Final Design Complete Oct 15, 08Receive Diffractometer Feb 19, 09Receive Focusing Lenses Feb 27, 09Receive Laser Optics and Diagnostics Mar 18, 09Phase I Installation Complete Oct 01, 09Install BNL XPP Detector Nov 03, 09CD-4a Feb 08, 10

CD-1 Aug 01, 07Conceptual Design Complete Sep 21, 07CD-2a Dec 03, 07CD-3a Jul 21, 08Phase I Final Design Complete Oct 15, 08Receive Diffractometer Feb 19, 09Receive Focusing Lenses Feb 27, 09Receive Laser Optics and Diagnostics Mar 18, 09Phase I Installation Complete Oct 01, 09Install BNL XPP Detector Nov 03, 09CD-4a Feb 08, 10



XPP Cost Estimate XPP Cost Estimate

Direct Cost $7,916.9PED $1,500.0MS&T $5,656.9ASSY $760.0

Indirect Cost $1,390.0Escalation $760.0Total Cost $10,066.9

Associated Contingency 30.3%



WBS 1.2 - XPPWBS 1.2 - XPP

Cost estimate at level 3 by fiscal year – Cost estimate at level 3 by fiscal year –



1.2 Level 3 Costs (M$)1.2 Level 3 Costs (M$)



SummarySummary

Instrument concept is advanced100% of Letters of Intent are represented in instrument conceptStanding monthly meeting with XPP team

Instrument concept is based on proven developments made at SPPS and SR sourcesInitial specifications well developedReady to proceed with baseline cost and schedule development

Instrument concept is advanced100% of Letters of Intent are represented in instrument conceptStanding monthly meeting with XPP team

Instrument concept is based on proven developments made at SPPS and SR sourcesInitial specifications well developedReady to proceed with baseline cost and schedule development

David Fritz [email protected] LUSI DOE Review July 23-24, 2007 XPP (WBS 1.2) Breakout 1...

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