Aveek Sarkar, Vice President Product Engineering ......homogeneity of power delivery network (PDN)...

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1 © 2011 Apache Design, Inc. Aveek Sarkar, Vice President Product Engineering & Customer Support Apache Design, Inc.

Transcript of Aveek Sarkar, Vice President Product Engineering ......homogeneity of power delivery network (PDN)...

Page 1: Aveek Sarkar, Vice President Product Engineering ......homogeneity of power delivery network (PDN) for the bottom die Thermal Impact – Thermal profile due to combined power and thermal

1 © 2011 Apache Design, Inc.

Aveek Sarkar, Vice President Product Engineering & Customer Support Apache Design, Inc.

Page 2: Aveek Sarkar, Vice President Product Engineering ......homogeneity of power delivery network (PDN) for the bottom die Thermal Impact – Thermal profile due to combined power and thermal

2 © 2011 Apache Design, Inc. 2

  Stacked die design multi-physics challenges   Power and noise modeling

–  Concurrent and model based approaches   Thermal modeling

–  Impact on power, reliability and timing   Ongoing work

Outline

Page 3: Aveek Sarkar, Vice President Product Engineering ......homogeneity of power delivery network (PDN) for the bottom die Thermal Impact – Thermal profile due to combined power and thermal

3 © 2011 Apache Design, Inc. 3

  Multi-physics challenges: –  Electrical-, thermal-, and mechanical-

aware design

  Cross-domain, organization, company

Simulation Goals

  Exploration and planning

  Analysis, optimization and sign-off

Stacked Die Design Needs

Inter-die thermal interplay

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  Voltage Drop and Power Noise Impact –  Top die experience additional voltage drop and coupled noise

from lower die or interposer in the stack-up

–  Presence of TSV farm and associated metal/via affect the homogeneity of power delivery network (PDN) for the bottom die

  Thermal Impact –  Thermal profile due to combined power and thermal signature

from shared micro-bump connections

–  Significant impact to power (leakage), reliability (EM) and timing (hold)

Simulation Needs for Stacked Die Designs

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Simulation Approaches for Stacked Die Designs

Power

ESD Signal

Thermal

Model based •  Compact, IP protection

•  Simplified and open format

Concurrent •  Simultaneous analysis

•  Multiple layout/result display

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  Contain self-consistent electrical data

  Enable seamless connections to other

models or to chip/interposer layout

  Be in open standard format

  Simplified topology to enable analysis

–  Power estimation

–  Power noise: DC and time-domain

–  Impedance analysis (frequency/DC)

–  Reliability analysis (EM, ESD)

  Similar or integrated model for thermal

  Contain technology / design parameters

Model Requirements for Stacked Die Analysis

Package

Interposer

Die 1 Die 2

Package netlist (RLCK / S-parameter)

Interposer Layout

Die 1 Model

Die 2 Layout

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Resource: Sarkar, “System level power distribution noise closure: Looking beyond the SoC power integrity challenge”, DAC 2010.

Model Based Stacked Die Analysis Self-Consistency of Model

IC Model (e.g. CPM)

Full layout based analysis Model based analysis

e.g. using RedHawkTM e.g. using Spice

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  Streamlined import and hookup

  Define model creation options (static, dynamic – VCD/V-less)

  Define content for stacked die power analysis (estimation, drop, …)

Model Based Stacked Die Analysis Open Interface Protocols

ASIC

RAM uC

DSP

S/P

DMA

Package netlist (RLCK / S-parameter)

Interposer Layout

Die 1 Model

Die 2 Layout

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Resource: Singh et al, “Design and optimization of a power delivery network for 3D stacked die designs”, DesignCon 2011.

Case Studies of Stacked Die Design Analysis Co

ncurrent  setup

 

Mod

el  based

 setup

 

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Resource: Singh et al, “Design and optimization of a power delivery network for 3D stacked die designs”, DesignCon 2011.

Case Studies of Stacked Die Design Analysis

Concurrent  analysis:  Voltage  drop  on  both  die  

Com

parin

g co

ncur

rent

ver

sus

mod

el b

ased

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Resource: Doyen et al, “Analysis of Power Delivery Network of Multiple Stacked ASICs using TSV and Micro-bumps”, DAC 2010.

Case Studies of Stacked Die Design Analysis

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Model Based Thermal Analysis

System Designers Cooling System Design

IC Designers Power, EM Analysis

Package Design

Thermal Profile & Thermal Model

Package Designers

Thermal Analysis

SentinelTM-TI

IC DESIGN

IC Designers

CTM Generation

RedHawk

CTM P

T

CTM: Chip-Thermal-Model, Temperature dependent library of power maps for each chip

3D Temp Profile layer-by-layer

Thermal Model Θ-JA/JB/JC, Delphi

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Case Study: Model Based Thermal Analysis

Thermal hot spot in the bottom die on the lower right corner (aligned with power density hot-spot)

Thermal hot spot in the top die on the lower right corner (due to heat sharing from uBumps)

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  Stacked die analysis presents several multi-physics problems

  Good models are necessary to bridge design and organization silos

  Apache is working on several areas:

–  Stacked die power noise simulation

–  Stacked die thermal and mechanical stress modeling

–  Reliability and timing analysis

  Working with Si2 on Open3D initiative

Re-cap and Summary