Announcements - bwrcs.eecs.berkeley.edu

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1 EE241 - Spring 2004 Advanced Digital Integrated Circuits Borivoje Nikolic Lecture 28 Flash memory 2 Announcements Project presentations Thursday, May 6, 9:30-12 BWRC classroom 2108 Allston Way, Downtown Berkeley Final on May 11, 9:30-11am 203 McLaughlin Homeworks returned Solutions posted

Transcript of Announcements - bwrcs.eecs.berkeley.edu

Page 1: Announcements - bwrcs.eecs.berkeley.edu

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EE241 - Spring 2004Advanced Digital Integrated Circuits

Borivoje Nikolic

Lecture 28Flash memory

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Announcements

Project presentations Thursday, May 6, 9:30-12BWRC classroom2108 Allston Way, Downtown Berkeley

Final on May 11, 9:30-11am203 McLaughlin

Homeworks returnedSolutions posted

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Project Reports and PresentationsShould be in paper format – max of 6 pages

Title of the project/ your names and e-mail addressesAbstract (100 words)MotivationProblem statementPossible solutions from literature (from midterm report)Proposed comparison/solution. Discuss why did you select this particular one.Conditions/assumptions of your designAnalysis: Does it work? Analytical analysis, simulation results.Conclusion. What is this approach good for? What else could be done?References

Due on May 6, at 8am (on the web), both the report and the slidesTime = 5min + 5min/person

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Outline

Design for testFlash memory

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Flash Memory

Slides adapted from Ken Takeuchi, Toshiba

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Semiconductor Memory Trends

From [Itoh01]

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Trends in Memory Cell Area

From [Itoh01]

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Some New(?) Kids on the BlockFRAM (Ferroelectric RAM): Use a “programmable capacitor”(made of Perovskite crystals).

During write, capacitor is polarizedDuring read, an electrical field is applied and current is measured

MRAM (Magnetoresistive RAM): use magnetic charges in contrast to electrical charges – very similar to old core memories

Magneto-resistive material changes resistivity when placed in a magnetic field

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Flash EEPROM

Control gate

erasure

p-substrate

Floating gate

Thin tunneling oxide

n+ source n+ drainprogramming

Many other options …

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Basic Operations in a NOR Flash Memory? Erase

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Basic Operations in a NOR Flash Memory? Write

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Basic Operations in a NOR Flash Memory? Read

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History of Flash Memories

‘84 ‘85 ‘86 ‘87 ??????‘91 ‘92 ‘93 …PRESENT

SanDisk-type

DiNOR-type

SanDisk-type

NOR-type

NAND-type

DiNOR-type

AND-type

SST-typeX

SST-type

X

File-Storage

Code-Storage

NOR-type

NAND-type

ACEE-type

AND-type

Split-gate-type

FLASH MEMORYInvention

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Flash Memory Comparison - Code vs File Storage -

Code Storage

File Storage

Applications Type of Flash memory Performance

Program storage for- Cellular Phone- DVD- Set TOP BoxBIOS for- PC and peripherals

Small form factor card for- Digital Still Camera- Silicon Audio- PDA ... etcMass storage as- Silicon Disk Drive

Important :

Acceptable :

• High speed random access• Byte programming

• Slow programming• Slow erasing

• High speed programming• High speed erasing• High speed serial read

• Slow random access

Important :

Acceptable :

NOR • Intel / Sharp• AMD / Fujitsu / Toshiba

DINOR • Mitsubishi

NAND • Toshiba / Samsung

AND • Hitachi

•SanDisk: NOR

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Requirements for File Storage Memory

Low Bit Cost <$.2/MByteHigh Density >256MByteHigh Speed Programming >6MByte/sec

and Erasing <3msec/blockHigh Speed Serial Read Low Power ConsumptionGood Program/Erase Endurance >1 million cycles

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Cell Array Comparison

Simplest wiringSmallest area

NOR SanDisk AND NAND

Erase gate(poly)

Unit Cell Unit Cell

Word line(poly) Word line(poly)

Source line(Diff. Layer)

Word line(poly)

Bit line(metal)

Source line(Diff. Layer)

Unit Cell

Contact

Source line(Diff. Layer)

Word line(poly)

Bit line /Source line(metal)

Unit Cell

Sub Bit line (Diff. Layer)

9F2 8F2 4F210F2

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Word linesSelect transistor

Bit line contact Source line contact

Active area

STI

NAND Cell Array (Top view)

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NAND Cell Array (Cross sectional view)

Word line

Word line

Bit line

Select gate

A A’

A A’

Source line

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Cell Size Shrink by Self-Aligned STI

Current

2 F

3F Floating Gate

Word Line

LOCOS_NAND : 6F2+aLOCOS_NAND : 6F2+a

2 F

2 F

STI_NAND : 4F2+aSTI_NAND : 4F2+a

3 F2 F

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NAND Cell Array (Cross sectional view)

Word line

Word line

STI

1st floating gate

2nd floating gate

B B’

B B’

Si

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+ Multi Level Cell

Floating Gate

LOCOS

Control Gate

3.5F

3F

2F

3F

NAND-type Cell(Contactless)

2F

2F

Self-AlignedSTI Cell

2F

2F

Self-Aligned STI Cell

Floating Gate

STI

Control Gate

Cell Size 10-11F2 6-7F2 4-5F2 2-2.5F2 Isolation LOCOS LOCOS SA-STI SA-STI

NOR-type Cell

NAND Cell Trend

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NAND Flash Cell Size Trend

Start of Mass Production

Jan- Jan- Jan- Jan- Jan- Jan- Jan- Jan- Jan- Jan- Jan- Jan-‘93 ‘94 ‘95 ‘96 ‘97 ‘98 ‘99 ‘00 ‘01 ‘02 ‘03 ‘04

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Cell

Size

( um

2 )

1

LOCOS SA-STI

MLC

0.01

Multi Level Cell

Floating Gate

LOCOSTunnel Oxide

Control GateWSiONO

Control Gate ONOFloating Gate

Tunnel Oxide STI

WSi

SA-STI

0.25um

0.175um

0.13um0.10um

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That’s all Folks

Thanks for the fun semester.See you next Thursday