ADC testing using histogram method
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EEE527: Nyquist-Rate Analog-to-Digital Converters
Project 1
NAME : Paraaia!gari "ri#ant! R
A"$ %D & : 12'()21'*7
1) A+
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,iven
requency.2) /0
"aling rate.1+'2*M0
No o3 oints 3or 4. 211. 2'*6+%n eac! cycle t!ere ill 8e 1'2*92) sales+
4!ere3ore nu8er o3 cycles require 3or co!erent saling requireents is 2'*69
;1'2*92)+
4!e oer sectru o3 given co!erent sinusoial signal 3or 211 oint D4 is as
s!on 8elo
1) C+
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RM" signal oer in > as o8serve 3ro t!e oer sectru lot is -?+') >+
4!ere3ore PRM";@< . 1';-?+')91'< . '+125 @+
unaental signal 3requency as o8serve 3ro t!e lot is )+)5=1'* 0. ))+5 /0+
2) A+4!e Poer sectru o3 given non co!erent signal nBnonco! 3or 211 oint 4
is as s!on 8elo
>+
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2c+ requency resonse o3 !ann !aing an 8lac#an !arris inos are as
3ollos:
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2 D< 4!e 3olloing lots reresent inoe sinusoial signal tie resonse
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2 E
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0aing inoe 3requency resonse:
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verlay o3 lots ooe over 5' /0 to 2'' /0 3requency is s!on 8elo
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2 3< 0ann inoe signal oer sectru:
Fundamental signal frequency =187.5 KHz
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RMS fundamental signal p!er= 5".# d$
0aing inoe signal oer sectru:
Fundamental signal frequency =187.5 KHz
RMS fundamental signal p!er= 57.5 d$
>lac#an 0arris inoe signal oer sectru:
Fundamental signal frequency =187.5 KHz
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RMS fundamental signal p!er= 5%.1& d$
'g(
)*e signal is spread as s*!n a+,e
S-R= 1/ lg0sum f signal cmpnentssum f t*e t*er cmpnents in entire frequency
respnse(
)*is is calculated in matla+ and is +tained as "&./& d$
S-R="&./& d$
2-3$= 0S-R41.7"("./'
2-3$= 1/.
& a( !er spectrum f quantized sinusidal signal !it* '611 pint FF) is as s*!n +el!
& +( )*e signal cmpnents spread is as s*!n +el!
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S-R= 1/ lg0sum f signal cmpnentssum f t*e t*er cmpnents in entire frequency
respnse(
)*is is calculated in matla+ and is +tained as 18.57 d$ ,er t*e nise integratin +and frm
t fs'.
S-R= 18.57 d$ ,er t fs'
& c( Same prcedure is fll!ed and S-R is +tained ,er nise integratin +and frm t
1// KHz and S-R is +tained as '7.8% d$.
S-R= '7.8% d$ ,er t 1// KHz.
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* a+
5a
