2b Focusing Optics - qub.ac.uk

18
Focusing Optics: Additional Background Information Basic XRD Course (Edition 3) 1 1 Basic XRD Course QUB XRD Course Focusing Optics 2 Basic XRD Course X-rays: electromagnetic radiation with a wavelength from 0.1 Å to 100 Å (0.01 nm to about 10 nm). What are X-rays? 3 Basic XRD Course Generation of X-rays Electrons are emitted by a hot filament High voltage accelerates electrons Electrons bombard anode material at high speed Kinetic energy of electrons largely transferred into heat and X-ray radiation Current (mA) Voltage (kV)

Transcript of 2b Focusing Optics - qub.ac.uk

Page 1: 2b Focusing Optics - qub.ac.uk

Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 1

1Basic XRD Course

QUB XRD Course

Focusing Optics

2Basic XRD Course

X-rays: electromagnetic radiation with a wavelength from 0.1 Å to 100 Å (0.01 nm to about 10 nm).

What are X-rays?

3Basic XRD Course

Generation of X-rays

• Electrons are emitted by a hot filament

• High voltage accelerates electrons

• Electrons bombard anode material at high speed

• Kinetic energy of electrons largely transferred into heat and X-ray radiation

Current (mA)

Voltage (kV)

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 2

4Basic XRD Course

Spectrum of X-rays depending on applied voltage and anode material. Characteristic radiation is used for experiments.

Mo-anode

Continuous radiation

Characteristic radiation

Generation of X-rays

X-r

ay In

ten

sity

(rel

ativ

e u

nit

s)

Wavelength (Å)

3

1.0 2.0 3.00

1

2

0

4

5

6

SWL 510

15

20

25kV

5Basic XRD Course

Generation of X-raysContinuous radiation: caused by deceleration of electrons when passing

the positively charged nuclei in the anode or when colliding with electrons of the anode atoms.

KL

M

Radiation (Bremsstrahlung)

Decelerated electron

6Basic XRD Course

KL

M

Knocked-out electron

Decelerated electron

Generation of X-raysCharacteristic radiation: When an atom is bombarded with sufficiently

high energy electrons (E > Ec ) electrons can be knocked out from their shell.

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 3

7Basic XRD Course

Characteristic radiation: An electron from a higher shell takes the place of the knocked-out electron. The energy difference between both shells is released in the form of X-ray radiation of a specific wavelength.

KL

M

Characteristic radiation

KαKβ

Generation of X-rays

8Basic XRD Course

Generation of X-rays

L-shell

III

III

Kα2 Kα1

K-shell

Generation of X-rays

Kα1 and Kα2 radiation:

Kα radiation comprises two wavelengths: Kα1 and Kα2.

The wavelengths correspond to the transitions from the L-shell to the K-shell. The L-shell has three energy levels from which level I is empty.

9Basic XRD Course

X-ray Operation Conditions

X-ray Operation Conditions

Intensity of characteristic radiation:

I (λ) = K.mA.(kV – Vc )n

I = intensityK = constantVc = critical voltage for characteristic radiationn = 1.6

In general: kV = 3 to 5 x Vc

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 4

10Basic XRD Course

1 % X-ray

Sample90 %

65 % air scatter

through Be window

to Be window1.5 %

Conclusion on tube efficiency:About 1% x 1.5% x 90% x 65% = 0.0088% of the

tube energy reaches the sample surface as X-rays.

X-ray Operation Conditions

11Basic XRD Course

Element Symbol Kαλ [nm] Application Chromium Cr 0.2291 large unit cells (clays, organic

materials, zeolites), steel (residual stress)

Iron Fe 0.1937 matrix effects of Fe and Cr Cobalt Co 0.1791 ferro materials Copper Cu 0.1542 standard tube Molybdenum Mo 0.0710 single crystal, small unit cells (metals) Silver Ag 0.0561 high absorbing materials Tungsten W 0.0211 Laue camera (continuum needed)

X-ray Operation Conditions

Anode material = choice of wavelength

12Basic XRD Course

tube focus

Soller slit

divergence slit anti-scatter slit

receiving slit

Soller slit

diffracted beam

monochromator

detector

width mask

Classical Powder Diffractometer

Optical components in the X-ray beam path

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 5

13Basic XRD Course

θ θ

Tube focus Receiving Slit

λ = 2 d sin(θ)

d

• Sample surface normal bisects incident and diffracted beams

• Diffracted beams focus at the same distance as the tube focus in receiving slit

• Optimal resolution

Classical Powder Diffractometer

14Basic XRD Course

divergence slit anti-scatter slit

Divergence Slit & Anti-scatter Slit

Divergence slit & anti-scatter slit: determining illuminated and observed length

15Basic XRD Course

• Divergence slit determines the irradiated length on the sample

– major effect on intensities

– minor effect on resolution

• Anti-scatter slit determines observed length on the sample

– used to reduce background

– major effect on the peak-to-background ratio

– ideally the observed area equals the illuminated area

Divergence Slit & Anti-scatter Slit

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 6

16Basic XRD Course

Influence of divergence slit

opening

Divergence Slit & Anti-scatter Slit

17Basic XRD Course

• The size of the divergence slit depends on the angular range (starting angle) and on the size of the sample.

• A smaller divergence slit gives a smaller illumination on the sample and less diffracted intensity.

Divergence Slit & Anti-scatter Slit

18Basic XRD Course

Divergence and irradiated length

40

5

10

15

25

30

35

20

0 10 20 30 40 500

irra

dia

ted

len

gth

(m

m)

1/321/16

1/8

¼

½

1

2

R = 240 mm

Divergence Slit & Anti-scatter Slit

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 7

19Basic XRD Course

If You Want to Gain Intensity….

• Make sure that you never over-irradiate the sample at low 2Theta angles…

… it will give a very high background!

20Basic XRD Course

Divergence Slit Size and Peak Intensities

0

2000

4000

Counts

Position [°2Theta]10 20 30

¼ deg divergence1 deg divergence

factor 3.75

factor 1.47!

20 mmlength

Hint:you can observethe irradiated length on the status bar of the X’Pert Data Collector!

21Basic XRD Course

receiving slit

Receiving Slit

Tube focus and receiving slit: determining instrument resolution

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 8

22Basic XRD Course

Tube Focus and Receiving Slit

23Basic XRD Course

Soller slit Soller slit

Soller Slits

Soller slits: limiting axial divergence

24Basic XRD Course

Soller Slits

• Soller slits consist of large numbers of parallel plates in the plane of diffraction.

• Soller slits limit the spread of the incident and diffracted X-ray beam out of the plane of diffraction: 0.01, 0.02, 0.04 and 0.08 rad.

– large effect on intensities

– moderate effect on resolution (low/high 2θ)

• It is good practice to place similar Soller slits in the incident and diffracted beam.

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 9

25Basic XRD Course

Instrument geometry influence - Sollers

8.0 9.0 10.0 11.0 12.0 13.0 14.0 15.0 16.0 17.02Theta (°)

0

20000

40000

60000

80000

100000

120000

Inte

nsi

ty (

cou

nts

)

0.04 rad, 15 minutes0.02 rad, 45 minutes0.01 rad, 110 minutes

26Basic XRD Course

β-filter & Monochromator

diffracted beam

monochromator

Possible places β-filter

β-filter & Monochromator

β-filter and/or monochromator: removing

unwanted radiation

27Basic XRD Course

β-filter & Monochromator

• The β-filter and the diffracted beam monochromator remove unwanted wavelengths like the Kβ-line and continuous radiation.

• The β-filter selectively absorbs radiation.

• Monochromators select radiation by means of diffraction.

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28Basic XRD Course

Sup

pre

ssio

n

Wavelength

Cu

W L

αC

u K

β

Ni filter

β-filter & Monochromator

Use filter material with absorption edgein between Kα and Kβline.

For example:Cu-radiation

Ni filter• Intensity Cu Kα : 50 %• Intensity Cu Kβ : 1%

29Basic XRD Course

receiving slit

Curved graphite diffractedbeam monochromator

detector entrance slit

λ > λCu

λ < λCu

β-filter & Monochromator

Only X-ray waves with correct wavelength pass the entrance slit of the detector.

Others do not focus in the entrance slit of the detector.

30Basic XRD Course

Diffracted Beam Monochromator

Anti scatter slit

Detector

Curved crystalmonochromator(Graphite)

Receiving slit

Polycrystalline sample

Soller slits

X-ray tube(line focus)

Divergence slit

Soller slits

Beam mask

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 11

31Basic XRD Course

line focus X-ray tube

Curved Ge(111) incidentbeam monochromator

divergence slit

Kα1

Kα2

β-filter & Monochromator

The symmetrically cut curved Ge(111) monochromator in combination with the divergence slit filters out the Kα2component leaving a beam with Kα1 radiation only.

32Basic XRD Course

Incident Beam Monochromator

X-ray tube(line focus)

Incident beam monochromator

Irradiation slit

Programmabledivergence slit

Soller slits

Detector

Polycrystalline sample

Anti scatter slit

Receiving slit

Soller slits

33Basic XRD Course

s

R

Sample Stages

Displacement error:

Sample stage and/or sample above or below diffraction plane: peaks are displaced from original position by

Rcoss2

2θθ =Δ

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 12

34Basic XRD Course

QUB XRD Course

X’Celerator Optics

Getting the best out of yourX’Celerator detector

35Basic XRD Course

What is RTMS Technology? (1)

Receiving slit + detector

Polycrystalline sample

Line focus

Divergence slit

Scan directionScan direction

Classical geometry (Bragg-Brentano)

36Basic XRD Course

What is RTMS Technology? (2)

Polycrystalline sample

X’Celerator

Line focus

Divergence slit

Scan directionScan direction

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 13

37Basic XRD Course

What is RTMS Technology? (3)

Polycrystalline sample

X’Celerator

Line focus

Divergence slit

Scan directionScan direction

38Basic XRD Course

What is RTMS Technology? (4)

Polycrystalline sample

X’Celerator

Line focus

Divergence slit

Scan directionScan direction

39Basic XRD Course

The Incident Beam Anti-scatter Slit

Diverg

ence

slit

Polycrystalline sample

X’Celerator

Line focus

Scan direction

Scatter at edges of

divergence slit

Anti-sc

atte

r slit

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 14

40Basic XRD Course

The Incident Beam Anti-scatter Slit

• So: 1º divergence slit 2º inc. beam anti-scatter slit

Divergence slit size1/32º1/16º1/8º¼º½º1º2º4º

Anti-scatter slit size1/16º1/8º¼º½º1º2º4º-

41Basic XRD Course

The Diffracted Beam Anti-scatter Slit

Polycrystalline sample

X’Celerator

Line focus

Diverg

ence

slit

Scan direction

Anti-sc

atte

r slit

Anti-scatter slit

42Basic XRD Course

The Programmable Anti-scatter Slit

• Two modes of operation:– constant observed length

– constant observed angle

• Can be changed at will

• Actual opening is also a function of the active length of the X’Celerator: important when working at low angles!

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Focusing Optics: Additional Background Information

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43Basic XRD Course

Constant Length and Associated Divergence

0

0.5

1

1.5

2

2.5

3

3.5

4

4.5

5

0 40 80 120 160Angle (deg 2Theta)

Div

erg

ence

(d

egre

es)

20 mm

10 mm

5 mm

Maximum 1 deg divergence: so 2 deg

anti-scatter slit Maximum angle: 50 deg 2Theta

44Basic XRD Course

Example: NIST SRM 1976 Al2O3

Position [°2Theta]20 30 40 50 60 70 80 90 100 110 120 130

0

10000

20000

30000

40000 NIST SRM 1976, Al2O3

Counts

45Basic XRD Course

Example: NIST SRM 1976 Al2O3

Position [°2Theta]25 30 35 40

Counts

0

10000

40000 NIST SRM 1976, Al2O3

Al2O3 Kα1 + Kα2

Mullite (Al6Si2O13)

Al2O3 Kβ

Ni absorption edge

Al2O3 Kα3

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46Basic XRD Course

Sample Fluorescence

• X-rays excite the atoms in the sample

• As a result of this, characteristic X-radiation is emitted

• If this emitted radiation is close to the Cu Kα, it is detected!

47Basic XRD Course

Sample Fluorescence - An Example

0

10000

20000

30000

40000

Counts

Position [°2Theta]20 30 40 50 60 70 80 90

NiCo2O3 Cu Kα1 radiation

¼º divergence slit

Higher backgrounddue to the presence of Co in the sample

48Basic XRD Course

Sample Fluorescence (1)

8 keV

7 keV ‘halo’Sealed X-ray

tube

Powder sample containing Co

?

8 keV

Diffraction peak from 8 keV photon

Constant backgroundfrom samplefluorescence

inte

nsi

ty

2θ angle

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Focusing Optics: Additional Background Information

Basic XRD Course (Edition 3) 17

49Basic XRD Course

• Crystal which acts as band pass filter

The Monochromator

Wavelength

Ni filterMonochromator

Inte

nsi

ty

Ni filter

Cu

W L

αC

u K

β

50Basic XRD Course

Rules of Thumb - Monochromators

• Monochromators help to reduce the range of problematic elements

Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As

Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As

Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As

Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As

Cu, inc. beam mono

Cu, dif. beam mono

Co, inc. beam mono

Co, dif. beam mono

low high

51Basic XRD Course

Rules of Thumb - Beta Filters

• β-filters: more background, but least reduction of Kα

• For best results, the β-filter should be placed in the diffracted beam

– exceptions: Ni with Cu radiation, Fe with Co(!)

• For not-too-complex patterns, Mo radiation is a valuable alternative

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Basic XRD Course (Edition 3) 18

52Basic XRD Course

Rules of Thumb - Continued

• When going from Cu to Co radiation…– the peak intensities drop with a factor of about 3…

– exception: Fe and Co samples: there the intensity rises with a factor of 3!

• Effect of varying penetration depth when absorption edges of elements in the sample are close to the characteristic radiation