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May 2015Qulity & Reliability Test and Measurment– Materials AnalysisIngrid Snijkers

Accelerateyour innovation

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Looking for expertise?

Should you plan for a maturity step in one of your processes? Maybe you lack

specific competencies or a particular challenge requires an out-of-the-box solution?

Do you struggle with a tough problem to solve?

Are you planning an innovation and looking

for ways to get it to the market fast?

2’ introduction video ›

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A short introduction

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A short introductionOur services

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Materials Analysis – a snapshot

https://www.youtube.com/watch?v=XbVPItr-tKw

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Materials Analysis Group44 experts in chemical analysis, molecular and structural analysis, surface and thin film analysis

Characteristics of our group: broad spectrum of analytical techniques and product knowledge actively involved in R&D, manufacturing and troubleshooting solution oriented, together with customers

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Materials Analysis Competences

The compositional & physical inspection of materials and objects;

(*) Identifying material properties and characteristics,

(*) Enabling proper material choices and specification/optimization of processes,

(*) Providing support in reliability issues, problem solving, quality control, failure analysis,

competitor analysis

(*) Providing easy acces to services, facilities and expertise for all material analysis

Compositional Analysis

Contamination Control

Surface & thin film analysis

Advanced Imaging

Materials Consultancy

Physical Characteri-

zation

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substrate

surface

coating

layer composition & profile

Applications need a mix of all analytical expertises

substrate composition & structure

gas composition & contamination

interface profile

surface condition

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Advanced imaging

Most of the time the relevant features are not revealed by simple visual inspection. We offer the facilities and expertise for creating and analyzing images, making visible for you what cannot be seen with the naked eye.

With our microscopy and imaging instrumentation we are capable of visualizing structures across length scales from many centimeters to sub-nanometer. The techniques allow us to look at as well as below the surface, either directly or via proper sample preparation. Spectral imaging, 3D imaging, high-speed imaging and imaging of various material properties also belong to the possibilities. Moreover, you can rely on our experts for automation and image analysis.

SEM, SEM-EDX, FIB, TEM, AFM, SPM, XRT

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Compositional analysis

We can identify the make-up – from the main constituents to ultra traces – of bulk materials, thin layers, solutions and gases. Through this analysis, we provide support in R&D, quality control, reliability issues and problem solving in general.

There are no restrictions in advance as we pride ourselves on being able to offer solutions for any type of material. We have experience with specific sample handling to avoid even low-level contamination, pre-treatment to allow subsurface analysis and we even develop remote, non-destructive tools for at-line applications.

Compositional analysis is also a firm foundation under a range of Quality & Reliability related competences, allowing in-house characterization of any type of material by people with both technical and application expertise.

ICP-MS, ICP-AES, La-ICP-MS, elemental analysis, FT-IR, Raman, NMR, GC-MS, IC-MS, LC-MS, XRD, XRF

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Surface and thin film analysis

Our high-precision analytic tools include electron microscopy (SEM, TEM, FIB), electron spectroscopy (XPS, AES), X-ray diffraction (XRD), ellipsometry, scanning probe techniques (AFM, SOM ..), elemental analysis techniques (SIMS, LA-ICP-MS), molecular analysis techniques (FT-IR, Raman) and much more. They give you detailed insight into key manufacturing processes such as deposition, etching, cleaning, implantation and diffusion

Key expertise areas• Surface contamination• Composition depth profiling• Layer thickness• Roughness and step coverage • Adhesion and delamination• Strain and stress

SEM, FIB, TEM, XRD, ellipsometry, AFM, SPM, SIMS, LA-ICP-MS, FT-IR, Raman,…

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Contamination Control

We can help you contamination control issues as diverse as analyzing supply gases at the ppq levels and sub-monolayer analysis of wafer surfaces. Moreover, you can call on us to solve problems at your site or provide routine analyses for existing products and processes.

And we are at the forefront of developing new techniques to address specific challenges – such as combining 2D-FTIR (Fourier transform infrared spectroscopy) and chemometric data analysis. Our extensive trace analysis services include advanced techniques such as (X-ray photoelectron spectroscopy), Auger emission spectroscopy, TOFSIMS (time-of-flight secondary ion mass spectroscopy) and LA-ICP-MS (laser-ablation inductively coupled plasma mass spectrometry). Moreover, you can rely on our experts for support and advice to ensure you find the right analytical solution for your needs

Gas analysis, FT-IR, TOF-SIMS, La-ICP-MS, TOF SIMS, chemometric data-analysis,..

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Physical characterization

Apart from offering a wide range of physical characterization techniques, our ability to correlate information from different sources is what provides added value for our customers. Whether it is the rheological behaviour of material that needs to be optimized for processing or the thermal stability of materials that are used under challenging conditions, we can help.

Key expertise area:- Failure analysis - Mechanical testing

Rheology, thermal analysis, particle size distribution, surface area, porosity, permeability, DSC,..

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Our customer support

- Early involvement- Structured problem solving- Development of tools & protocols to detect lower contamination levels- Fast & non-destructive analysis - Benchmarking analysis - Materials consultancy- Data mining - DfSS approach (Philips)

We deliver our service over the full innovation chain

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Proud to serve…

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Global organization, local partner

Andover

Eindhoven

Turnhout Aachen

Pila

ShanghaiChengdu

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How can we help toaccelerate your innovation?

www.innovationservices.philips.com

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