New Hi Safe Probe For 10+Gbps Fault Insertion

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Preliminary performance results for a new HiSAFE probe type for 10Gbps Fault Insertion applications are shown.

Transcript of New Hi Safe Probe For 10+Gbps Fault Insertion

NEW HiSAFE PROBE for 10+Gbps Fault Insertion

Preliminary results on prototypes of the new differential probe

By Piero Belforte, March 2010

Test setup

• As test setup the OL1 microstrip pair has been utilized: http://www.youtube.com/watch?v=r8MJrkzqRL0

• The test setup was simulated in a fully terminated configuration (differential mode)

with ideal differential generators at transmitter end

• The probe loading effects were simulated inserting the probe at the two line ends

DIFFERENTIAL MICROSTRIP (OL1)

Probe model

• The simulative model of the probe prototype has been extracted from 2 one-port TDR

measurements (50 ohm reference) on an actual prototype

• The model extraction and setup simulations have been performed using the DWS simulator

DWS sim of the optimized Probe model (S11)

DWS setup netlist (1)

DWS setup netlist (2)

DWS setup netlist (3)

10Gbps Eye diagrams results (1)

Comparison between the unloaded net and the net with the probe connected at the drivers’s end

10Gbps Eye diagrams results (2)

Comparison between the unloaded net and the net with the probe connected at the receiver’s end

Preliminary conclusions (March 2010)

• New probe prototype loading performance is good for 10+Gbps Fault Insertion applications

• Loading effect on jitter at 10Gbps: less than 1ps

• Eye diagram amplitude reduction: 3.5 db