EPIC Calibration Meeting, MPE K. Dennerl, 2006 May 04 EPIC pn at low energies: LW mode Properties of...

K. Dennerl, 2006 May 04EPIC pn at low energies: LW modeEPIC Calibration Meeting, MPE

Properties of EPIC pn Properties of EPIC pn

at low energies: LW at low energies: LW

modemode

Long closed LW exposures

revolution data setexposure

[s]date

0546 0134522001_PNS005 18 760 2002-12-03

0553 0125320901_PNS010 12 267 2002-12-17

0730 0154150601_PNS002 12 198 2003-12-05

0790 0134720801_PNS005 61 096 2004-04-01

09740305920301_PNU02

712 534 2005-04-04

116 855

EPIC-pn at low energies (LW)

Correction of offset shifts

rev 546 rev 553

offset correction: before

rev 546 rev 553

offset correction: after

rev 546

EPIC-pn detector noise (LW)

residual offset map

rev 553

residual offset map

rev 730

residual offset map

rev 790

residual offset map

rev 974

residual offset map

individual offset maps median of offset maps

residual offset mapsrev 546 rev 790

rev 546 rev 790cleaned residual offset maps

rev 546 cleaned residual offset map residual offset map

20 adu image, rev 546

before the correction of offset shifts

after the correction of offset shifts

rev 546 rev 553

rev 730 rev 974

Low energy noise

EPIC-pn at low energies (LW)

Quadrant 0

50.7 ks closed FF (rev 059)

EPIC-pn detector noise

2.16 : 12.16 : 1

Detector noise in FF and eFF mode

detector noise per per secsec is ~2.16 times

higher in FF than in eFF

2.16 : 12.16 : 1

Detector noise in FF and eFF mode

detector noise per per secsec is ~2.16 times

higher in FF than in eFF

Detector noise in LW and FF mode

1.71 : 11.71 : 1

detector noise per per secsec is ~1.7 times higher in LW than

in FF**in the LW area

closed FF rev 462 23.2 ks

0 50 0 3

Vela SNR FF rev 534 38.8 ks

without epreject

with epreject

Vela SNR FF rev 534 38.8 ks

EPIC-pn detector noise in LW mode

100% suppressio

Original method (“method 1”):

Suppression of events below 50 adu according to a reference noise

distribution deduced from long calclosed

exposures

Shown in blue is the result of this method applied to a (long)

calclosed exposure, to illustrate the effect on

a very faint X-ray source

20 50 adu

99% suppressio

exposures

20 50 adu

90% suppressio

exposures

20 50 adu

70% suppressio

exposures

20 50 adu

50% suppressio

exposures

This method works well for bright sources,

but may cause an apparent deficit of photons between ~150 and 250 eV for faint sources

Other problem: inhomogeneous residual noise at

~20 adu

20 50 adu

Alternative method (“method 2”):

Try to determine the noise properties at higher

energies and extrapolate them down to 20 adu

range used for fit: 40-100 adu

range shown: 20-400 adu

log-log

rev 790, all events

x lin y log

rev 790, all events

x lin y log

rev 790, all events

x lin y log

rev 790, all events

x log y log

rev 790, all events

x log y log

rev 790, all events

for comparison: method 1

x log y log

rev 790, all events

method 2, rev 790

method 2, rev 546

method 2, rev 553

method 2, rev 730

method 2, rev 974

Method 2 would work well if there were no temporal changes of the low-

energy noise

Whenever the noise properties of the sample and template are (slightly) different, the subtraction leads to

residuals in the spectra and the images

Other problem: assumption of constant noise properties along CCD rows (required in order to get enough

statistics) not valid for raw events:

rev 790

61 ks closed

after offset corrections

all events

20 adu

rev 790

61 ks closed

all events

21 adu

rev 790

61 ks closed

all events

22 adu

rev 790

61 ks closed

all events

23 adu

rev 790

61 ks closed

all events

24 adu

rev 790

61 ks closed

all events

25 adu

rev 790

61 ks closed

all events

26 adu

rev 790

61 ks closed

all events

27 adu

rev 790

61 ks closed

all events

28 adu

rev 790

61 ks closed

all events

29 adu

rev 790

61 ks closed

all events

30 adu

rev 790

61 ks closed

all events

31-35 adu

rev 790

61 ks closed

all events

36-40 adu

rev 790

61 ks closed

all events

41-45 adu

rev 790

61 ks closed

all events

46-50 adu

rev 790

61 ks closed

all events

51-55 adu

rev 790

61 ks closed

all events

56-60 adu

rev 790

61 ks closed

all events

61-70 adu

rev 790

61 ks closed

all events

71-80 adu

rev 790

61 ks closed

all events

81-90 adu

rev 790

61 ks closed

all events

91-100 adu

rev 790

61 ks closed

all events

101-120 adu

rev 790

61 ks closed

all events

121-140 adu

rev 790

61 ks closed

all events

141-180 adu

rev 790

61 ks closed

all events

181-250 adu

rev 790

61 ks closed

all events

251-400 adu

At which stage of the processing should the noise be suppressed ?

Comparison of raw data with processed data (after pattern

recognition and recombination):

rev 790

61 ks closed

no offset corrections

all events

20 adu

raw dataraw data

rev 790

61 ks closed

singles

20 adu

processed dataprocessed data

rev 790

61 ks closed

all events

30-50 adu

raw dataraw data

rev 790

61 ks closed

all “entries”

30-50 adu

rev 790

61 ks closed

non-singles

30-50 adu

rev 790

61 ks closed

singles

30-50 adu

Comparison with FF:

EPIC-pn detector noise (FF)

20 adu

raw dataraw data

rev 462

23 ks closed

all events

rev 462

23 ks closed

singles

20 adu

rev 462

23 ks closed

all events

30-50 adu

raw dataraw data

rev 462

23 ks closed

all “entries”

30-50 adu

rev 462

23 ks closed

non-singles

30-50 adu

rev 462

23 ks closed

singles

30-50 adu

At which stage of the processing should the noise be suppressed ?

Noise near the CCD edges can be most efficiently suppressed by

rejecting invalid patterns

Noise suppression should be done after the pattern

recognition

20-65 adu

EPIC-pn detector noise properties (FF)

SAS CCF:

Also for FF, epreject may need some refinement..

EPIC Calibration Meeting, MPE K. Dennerl, 2006 May 04 EPIC pn at low energies: LW mode Properties of...

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