Diseño ASIC BOUNDARY SCAN. Diseño ASIC BOUNDARY SCAN IEEE 1149.1 JTAG Boundary Scan Standard Motivation Bed-of-nails tester System view of boundary scan.
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 31/22alt1 Lecture 31 System Test (Lecture 22alt in the Alternative Sequence) n Definition n Functional.
April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System view.
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System.
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 301 Lecture 30 IEEE 1149.4 JTAG Analog Test Access Port and Standard n Motivation n Bus overview n.
Operational Auditing--Fall 2010 1 Operational Auditing Fall 2010 Professor Bill O’Brien.
Blend Uniformity: Update Ajaz S. Hussain, Ph.D.. Background Issue: Assuring and documenting “adequacy of mixing” operations –PQRI’s Proposal Stratified.
Parent Orientation Night September 3, 2013 Please Sign In Sign Up for Parent Conferences on the Early Release Days Write a note to your child Take a look.
Planetary Explorer Team: 98.04 Customer: Dr. Stephanie Wright Advisor: Dr. John Meakin Team members: Chris Andrews Patrick Fabian Patrick Fabian Brian.
