Application of Time-Domain Reflectometry To Detect Interconnect Failures Mentors Dr. Yaw Obeng Dr. Chukwudi Okoro PML Semiconductor Electronics Division,
An accurate and efficient SSO/SSN simulation methodology for 45 nm LPDDR I/O interface Dr. Souvik Mukherjee, Dr. Rajen Murugan (Texas Instruments Inc.)
F52.pdf
