Testing of Digital Systems: An Introduction Dr. Aiman H. El-Maleh Computer Engineering Department King Fahd University of Petroleum & Minerals Dr. Aiman.
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CI-1 1. Process Analysis for Continuous Improvement 2. Benchmarking 3. Process Improvement Approaches 4. Pareto Chart 5. Cause and Effect Diagram 6. Acceptance.
Robust Low Power VLSI ECE 7502 S2015 Memory Built-in-Self Test (MBIST): Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study.
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