1 Testing - Overview MotivationMotivation –fault models –testing methods Automatic Test Pattern Generation (ATPG) algorithmsAutomatic Test Pattern Generation.
Unit IV Lecture 8 Questions & Answers Presented By V. Vaithianathan, AP/ECE [email protected].
VHDL Lectures
RASSP Reinventing Electronic Design Methodology Architecture Infrastructure ARPA Tri-Service Test Technology Overview.
Unit IV Lecture 8 Questions & Answers
