VLSI Test Technology & Reliabillity - Module 11 digital_dft_and_scan_design
Unit IV Lecture 8 Questions & Answers Presented By V. Vaithianathan, AP/ECE [email protected].
ATPG Methodology Flow
EE415 VLSI Design Introduction [ Adapted from presentation by Kia Bazagran, University of Minnesota ] VLSI Design II.
Finding Optimum Clock Frequencies for Aperiodic Test Master’s Thesis Defense Sindhu Gunasekar Dept. of ECE, Auburn University Advisory Committee: Dr. Vishwani.
Unit IV Lecture 8 Questions & Answers
An Efficient Scan Tree Design for Test Time
Finding Optimum Clock Frequencies for Aperiodic Test
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