Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock Priyadharshini Shanmugasundaram [email protected] Vishwani D. Agrawal.
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock
Priyadharshini Shanmugasundaram [email protected] Vishwani D. Agrawal [email protected]