Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 23/19alt1 Lecture 23 Design for Testability (DFT): Full-Scan (Lecture 19alt in the Alternative Sequence)
Copyright 2001, Agrawal & BushnellLecture 12: DFT and Scan1 VLSI Testing Lecture 10: DFT and Scan n Definitions n Ad-hoc methods n Scan design Design.
Dec 21, 2007DfT@IITK1 Design for Testability Virendra Singh Indian Institute of Science Bangalore virendra@ {computer, ieee}.org IEP on Digital System.
1 Lecture 23 Design for Testability (DFT): Full-Scan n Definition n Ad-hoc methods n Scan design Design rules Scan register Scan flip-flops Scan test sequences.
