Medical device reliability program
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock Priyadharshini Shanmugasundaram [email protected] Vishwani D. Agrawal.
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock
Test Programming for power constrained devices
By Praveen Venkataramani Vishwani D. Agrawal TEST PROGRAMMING FOR POWER CONSTRAINED DEVICES 5/9/201322ND IEEE NORTH ATLANTIC TEST WORKSHOP 1.
By Praveen Venkataramani Committee Prof. Vishwani D. Agrawal (Advisor) Prof. Adit D. Singh Prof. Fa Foster Dai REDUCING ATE TEST TIME BY VOLTAGE AND FREQUENCY.
Dynamic Scan Clock Control In BIST Circuits
