Nov. 21, 2006ATS'06 1 Spectral RTL Test Generation for Gate-Level Stuck-at Faults Nitin Yogi and Vishwani D. Agrawal Auburn University, Department of ECE,
March 8, 2006Spectral RTL ATPG1 High-Level Spectral ATPG for Gate-level Circuits Nitin Yogi and Vishwani D. Agrawal Auburn University Department of ECE.
Spectral RTL Test Generation for Gate-Level Stuck-at Faults
High-Level Spectral ATPG for Gate-level Circuits
