Seminar Lc Ms
Agilent LC-MS Primer
iseg High Voltage Presentation for IEEE Seoul 2013
The Centre for Microscopy & Microanalysis NanoSIMS 50 nanoSIMS: a new analytical tool for ultra-fine feature analysis using secondary ion emission R.
NuPECC 22-23 June 2007 The ISOLDE research programme Peter Butler (University of Liverpool) 1.The present 2.The future.
H-mode characterization for dominant ECR heating and comparison to dominant NBI or ICR heating F. Sommer PhD thesis advisor: Dr. Jörg Stober Academic advisor:
Ion Sources for ISIS and Beyond
ESS-Bilbao ESFRI Working Group
Ion beam deposition, wtth great uniformity.
Use of APGC coupled to Tandem Quadrupole Mass Spectrometry for the analysis of Pesticides and Dioxins - Waters Corporation Food Safety
t17
A proposal for a polarized 3 He ++ ion source with the EBIS ionizer for RHIC. A.Zelenski, J,Alessi, E.Beebe, A.Pikin BNL M.Farkhondeh, W.Franklin, A. Kocoloski,
