The top documents tagged [ion backflow studies]

P.Colas D.Attié, W.Wang, I.Giomataris CEA/Saclay, France K.Fujii T.Fusayasu, K.Kato, M. Kobayashi, T. Matsuda, O. Nitoh, A Sugiyama, T. Watanabe KEK/IPNS,

P.Colas D.Attié, W.Wang, I.Giomataris CEA/Saclay, France K.Fujii T.Fusayasu, K.Kato, M. Kobayashi, T. Matsuda, O. Nitoh, A Sugiyama, T. Watanabe KEK/IPNS,

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Charge transparencies and amplification properties of Integrated Micromegas detectors Maximilien Chefdeville NIKHEF, Amsterdam RD51, Amsterdam 17/04/2008.

Charge transparencies and amplification properties of Integrated Micromegas detectors Maximilien Chefdeville NIKHEF, Amsterdam RD51, Amsterdam 17/04/2008.

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P.Colas D.Attié, W.Wang, I.Giomataris CEA/Saclay, France K.Fujii T.Fusayasu, K.Kato, M. Kobayashi, T. Matsuda, O. Nitoh, A Sugiyama, T. Watanabe KEK/IPNS,

P.Colas D.Attié, W.Wang, I.Giomataris CEA/Saclay, France K.Fujii T.Fusayasu, K.Kato, M. Kobayashi, T. Matsuda, O. Nitoh, A Sugiyama, T. Watanabe KEK/IPNS,

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