Thermal Via Allocation for 3D ICs Considering Temporally and Spatially Variant Thermal Power Hao Yu, Yiyu Shi and Lei He Electrical Engineering Dept. UCLA,
Recent Challenges. 2 Soft Errors Scaling: SEU (Single-event upset): −Ionizing radiation corrupts data stored Cause: −Radioactive impurities in device.
The state-of-the-art InP-based HEMTs Ankit Sharma ECE695 20 Feb, 2015.
