Interference original
16 August 2006 Using Simultaneous Reflection and Transmission Measurements of Oxide to Help Determine Optical Constants in the EUV D. D. Allred, G. A.
Overview
7 April 2006 Simultaneous Reflection and Transmission Measurements of Scandium Oxide Thin Films in the Extreme Ultraviolet G. A. Acosta, D. D. Allred,
Optical Constants of Sputtered Thoria Thin Films Useful in EUV Optics from IR to EUV
Amateur Astronomy Optical Filters
