ShaharB.ppt
Random access scan
A Wafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for “Big-D/Small-A” Mixed-Signal SoCs Sudarshan Bahukudumbi Sule Ozev Krishnendu.
Sudarshan Bahukudumbi Sule Ozev Krishnendu Chakrabarty Vikram Iyengar
ENG6530 RCS1 ENG6530 Reconfigurable Computing Systems Hardware Software Co-design.
Hardware Trojan (HT) Detection in 3-D IC Wafi Danesh Instructor: Dr. Christopher Allen EECS 713 High-Speed Digital Circuit Design Final Project Presentation.
Memory management
A Systematic Methodology to Develop Resilient Cache Coherence Protocols